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Ultrafast flash memory with large self-rectifying ratio based on atomically thin MoS_(2)-channel transistor 被引量:3
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作者 Liwei Liu Yibo Sun +6 位作者 Xiaohe Huang Chunsen Liu Zhaowu Tang Senfeng Zeng David Wei Zhang Shaozhi Deng Peng Zhou 《Materials Futures》 2022年第2期153-162,共10页
Flash memory with high operation speed and stable retention performance is in great demand to meet the requirements of big data.In addition,the realisation of ultrafast flash memory with novel functions offers a means... Flash memory with high operation speed and stable retention performance is in great demand to meet the requirements of big data.In addition,the realisation of ultrafast flash memory with novel functions offers a means of combining heterogeneous components into a homogeneous device without considering impedance matching.This report proposes a 20 ns programme flash memory with 10^(8) self-rectifying ratios based on a 0.65 nm-thick MoS_(2)-channel transistor.A high-quality van der Waals heterojunction with a sharp interface is formed between the Cr/Au metal floating layer and h-BN tunnelling layer.In addition,the large rectification ratio and low ideality factor(n=1.13)facilitate the application of the MoS_(2)-channel flash memory as a bit-line select transistor.Finally,owing to the ultralow MoS_(2)/h-BN heterojunction capacitance(50 fF),the memory device exhibits superior performance as a high-frequency(up to 1 MHz)sine signal rectifier.These results pave the way toward the potential utilisation of multifunctional memory devices in ultrafast two-dimensional NAND-flash applications. 展开更多
关键词 ultra-fast flash memory metal floating gate atomic sharp interface atomic thin channel self-rectification transistor high-frequency rectifier
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