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Charge ordering modulations in a Bi_(0.4)Ca_(0.6)MnO_3 film with a thickness of 110 nm
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作者 丁艳华 王乙潜 +2 位作者 蔡鎔声 陈允忠 孙继荣 《Chinese Physics B》 SCIE EI CAS CSCD 2012年第8期482-486,共5页
The low temperature sample stage in a transmission electron microscope is used to investigate the charge ordering behaviours in a Bi0.4Ca0.6MnO3 film with a thickness of 110 nm at 103 K. Six different types of superla... The low temperature sample stage in a transmission electron microscope is used to investigate the charge ordering behaviours in a Bi0.4Ca0.6MnO3 film with a thickness of 110 nm at 103 K. Six different types of superlattice structures are observed using the selected-area electron diffraction (SAED) technique, while three of them match well with the modulation stripes in high-resolution transmission electron microscopy (HRTEM) images. It is found that the modulation periodicity and direction are completely different in the region close to the Bi0.4Ca0.6MnO3/SrTiO3 interface from those in the region a little further from the Bi0.4Ca0.6MnO3/SrTiO3 interface, and the possible reasons for this are discussed. Based on the experimental results, structural models are proposed for these localized modulated structures. 展开更多
关键词 charge ordering selected-area electron diffraction high-resolution transmission electron microscopy pulsed laser deposition
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