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Machine learning driven inverse design of devices and components for optical communication and sensing systems:a comprehensive review
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作者 Md Moinul Islam Khan Md Hosne Mobarok Shamim +3 位作者 Abdullah Nafis Khan Md Saifuddin Faruk Mudassir Masood Mohammed Zahed Mustafa Khan 《Advanced Photonics Nexus》 2026年第1期26-60,共35页
We discuss recent progress in using machine-learning(ML)-enabled inverse design techniques applied to photonic devices and components.Specifically,we highlight the design of optical sources,including fiber and semicon... We discuss recent progress in using machine-learning(ML)-enabled inverse design techniques applied to photonic devices and components.Specifically,we highlight the design of optical sources,including fiber and semiconductor lasers,as well as Raman and semiconductor optical amplifiers.Although inverse design approaches for optical detectors remain relatively underexplored,we examine optical layers,particularly metamaterial absorbers,as promising candidates for high-performance optical detection.In addition,we underscore advancements in inverse designing passive optical components,including beam splitters,gratings,and optical fibers.These optical blocks are fundamental in developing next-generation standalone optical communication systems and optical sensing networks,including integrated sensing and communication technologies.While categorizing various reported deep learning architectures across five paradigms,we offer a paradigm-based perspective that reveals how different ML techniques function within modern inverse design methods and enable fast,data-driven solutions that significantly reduce design time and computational demands compared with traditional optimization methods. 展开更多
关键词 machine learning deep learning inverse design photonic device semiconductor laser fiber laser Raman amplifier semiconductor optical amplifier fiber amplifier optical fiber power splitter grating fiber Bragg grating metagrating COUPLER metamaterial absorber
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引信MEMS安全系统远距离解除保险机构研究现状
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作者 李志鹏 何博 +1 位作者 冯恒振 娄文忠 《探测与控制学报》 北大核心 2026年第1期31-37,共7页
MEMS安全系统具有微型化、集成化、可大批量生产的优势,是推动未来引信技术发展,实现引信整体效能提升的重要途径。远距离解除保险机构作为MEMS安全系统的核心模块之一,在国内外得到了深入的研究。针对MEMS安全系统远距离解除保险机构... MEMS安全系统具有微型化、集成化、可大批量生产的优势,是推动未来引信技术发展,实现引信整体效能提升的重要途径。远距离解除保险机构作为MEMS安全系统的核心模块之一,在国内外得到了深入的研究。针对MEMS安全系统远距离解除保险机构研究进展,在收集、分析国内外文献资料的基础上,总结了远距离解除保险机构发展现状;按照延期形式,将MEMS安全系统远距离解除保险机构划分并对各自的典型结构进行分析,展望了MEMS安全系统远距离解除保险机构的未来发展趋势。 展开更多
关键词 安全系统 微机电系统 远距离解除保险机构 钟表机构 微小型作动器
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Quantum Boltzmann equation solved by Monte Carlo method for nano-scale semiconductor devices simulation 被引量:5
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作者 杜刚 刘晓彦 韩汝琦 《Chinese Physics B》 SCIE EI CAS CSCD 2006年第1期177-181,共5页
A two-dimensional (2D) full band self-consistent ensemble Monte Carlo (MC) method for solving the quantum Boltzmann equation, including collision broadening and quantum potential corrections, is developed to exten... A two-dimensional (2D) full band self-consistent ensemble Monte Carlo (MC) method for solving the quantum Boltzmann equation, including collision broadening and quantum potential corrections, is developed to extend the MC method to the study of nano-scale semiconductor devices with obvious quantum mechanical (QM) effects. The quantum effects both in real space and momentum space in nano-scale semiconductor devices can be simulated. The effective mobility in the inversion layer of n and p channel MOSFET is simulated and compared with experimental data to verify this method. With this method 50nm ultra thin body silicon on insulator MOSFET are simulated. Results indicate that this method can be used to simulate the 2D QM effects in semiconductor devices including tunnelling effect. 展开更多
关键词 quantum mechanical effect Monte Carlo method semiconductor device carrier transport
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A SPARSE MATRIX TECHNIQUE FOR SIMULATING SEMICONDUCTOR DEVICES AND ITS ALGORITHMS 被引量:2
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作者 任建民 张义门 《Journal of Electronics(China)》 1990年第1期77-82,共6页
A novel sparse matrix technique for the numerical analysis of semiconductor devicesand its algorithms are presented.Storage scheme and calculation procedure of the sparse matrixare described in detail.The sparse matri... A novel sparse matrix technique for the numerical analysis of semiconductor devicesand its algorithms are presented.Storage scheme and calculation procedure of the sparse matrixare described in detail.The sparse matrix technique in the device simulation can decrease storagegreatly with less CPU time and its implementation is very easy.Some algorithms and calculationexamples to show the time and space characteristics of the sparse matrix are given. 展开更多
关键词 semiconductor devices sPARsE MATRIX TECHNIQUE Algorithm CAD
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Synaptic devices based on silicon carbide for neuromorphic computing 被引量:1
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作者 Boyu Ye Xiao Liu +2 位作者 Chao Wu Wensheng Yan Xiaodong Pi 《Journal of Semiconductors》 2025年第2期38-51,共14页
To address the increasing demand for massive data storage and processing,brain-inspired neuromorphic comput-ing systems based on artificial synaptic devices have been actively developed in recent years.Among the vario... To address the increasing demand for massive data storage and processing,brain-inspired neuromorphic comput-ing systems based on artificial synaptic devices have been actively developed in recent years.Among the various materials inves-tigated for the fabrication of synaptic devices,silicon carbide(SiC)has emerged as a preferred choices due to its high electron mobility,superior thermal conductivity,and excellent thermal stability,which exhibits promising potential for neuromorphic applications in harsh environments.In this review,the recent progress in SiC-based synaptic devices is summarized.Firstly,an in-depth discussion is conducted regarding the categories,working mechanisms,and structural designs of these devices.Subse-quently,several application scenarios for SiC-based synaptic devices are presented.Finally,a few perspectives and directions for their future development are outlined. 展开更多
关键词 silicon carbide wide bandgap semiconductors synaptic devices neuromorphic computing high temperature
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Advances in Rare Earth Application to Semiconductor Materials and Devices 被引量:1
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作者 屠海令 《Journal of Rare Earths》 SCIE EI CAS CSCD 2004年第5期571-575,共5页
The development of rare earths (RE) applications to semiconductor materials and devices is reviewed. The recent advances in RE doped silicon light emitting diodes (LED) and display materials are described. The various... The development of rare earths (RE) applications to semiconductor materials and devices is reviewed. The recent advances in RE doped silicon light emitting diodes (LED) and display materials are described. The various technologies of incorporating RE into semiconductor materials and devices are presented. The RE high dielectric materials, RE silicides and the phase transition of RE materials are also discussed. Finally, the paper describes the prospects of the RE application to semiconductor industry. 展开更多
关键词 semiconductor MATERIALs devices APPLICATION rare earths
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Progress in Antimonide Based III-V Compound Semiconductors and Devices 被引量:2
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作者 Chao Liu Yanbo Li Yiping Zeng 《Engineering(科研)》 2010年第8期617-624,共8页
In recent years, the narrow bandgap antimonide based compound semiconductors (ABCS) are widely regarded as the first candidate materials for fabrication of the third generation infrared photon detectors and integrated... In recent years, the narrow bandgap antimonide based compound semiconductors (ABCS) are widely regarded as the first candidate materials for fabrication of the third generation infrared photon detectors and integrated circuits with ultra-high speed and ultra-low power consumption. Due to their unique bandgap structure and physical properties, it makes a vast space to develop various novel devices, and becomes a hot research area in many developed countries such as USA, Japan, Germany and Israel etc. Research progress in the preparation and application of ABCS materials, existing problems and some latest results are briefly introduced. 展开更多
关键词 ANTIMONIDE BAsED COMPOUND semiconductors (ABCs) IR Laser IR DETECTOR Integrated Circuit Functional Device
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Overview of High Voltage SiC Power Semiconductor Devices: Development and Application 被引量:18
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作者 Shiqi Ji Zheyu Zhang Fred(Fei)Wang 《CES Transactions on Electrical Machines and Systems》 2017年第3期254-264,共11页
Research on high voltage(HV)silicon carbide(SiC)power semiconductor devices has attracted much attention in recent years.This paper overviews the development and status of HV SiC devices.Meanwhile,benefits of HV SiC d... Research on high voltage(HV)silicon carbide(SiC)power semiconductor devices has attracted much attention in recent years.This paper overviews the development and status of HV SiC devices.Meanwhile,benefits of HV SiC devices are presented.The technologies and challenges for HV SiC device application in converter design are discussed.The state-of-the-art applications of HV SiC devices are also reviewed. 展开更多
关键词 High voltage siC power semiconductor devices siC-based converter
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Effect of NO annealing on charge traps in oxide insulator and transition layer for 4H-SiC metal–oxide–semiconductor devices 被引量:1
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作者 贾一凡 吕红亮 +10 位作者 钮应喜 李玲 宋庆文 汤晓燕 李诚瞻 赵艳黎 肖莉 王梁永 唐光明 张义门 张玉明 《Chinese Physics B》 SCIE EI CAS CSCD 2016年第9期484-488,共5页
The effect of nitric oxide(NO) annealing on charge traps in the oxide insulator and transition layer in n-type4H–Si C metal–oxide–semiconductor(MOS) devices has been investigated using the time-dependent bias s... The effect of nitric oxide(NO) annealing on charge traps in the oxide insulator and transition layer in n-type4H–Si C metal–oxide–semiconductor(MOS) devices has been investigated using the time-dependent bias stress(TDBS),capacitance–voltage(C–V),and secondary ion mass spectroscopy(SIMS).It is revealed that two main categories of charge traps,near interface oxide traps(Nniot) and oxide traps(Not),have different responses to the TDBS and C–V characteristics in NO-annealed and Ar-annealed samples.The Nniotare mainly responsible for the hysteresis occurring in the bidirectional C–V characteristics,which are very close to the semiconductor interface and can readily exchange charges with the inner semiconductor.However,Not is mainly responsible for the TDBS induced C–V shifts.Electrons tunneling into the Not are hardly released quickly when suffering TDBS,resulting in the problem of the threshold voltage stability.Compared with the Ar-annealed sample,Nniotcan be significantly suppressed by the NO annealing,but there is little improvement of Not.SIMS results demonstrate that the Nniotare distributed within the transition layer,which correlated with the existence of the excess silicon.During the NO annealing process,the excess Si atoms incorporate into nitrogen in the transition layer,allowing better relaxation of the interface strain and effectively reducing the width of the transition layer and the density of Nniot. 展开更多
关键词 4H–siC metal–oxide–semiconductor devices NO annealing near interface oxide traps oxide traps
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Investigating the doping performance of an ionic dopant for organic semiconductors and thermoelectric applications
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作者 Jing Guo Yaru Feng +10 位作者 Jinjun Zhang Jing Zhang Ping−An Chen Huan Wei Xincan Qiu Yu Liu Jiangnan Xia Huajie Chen Yugang Bai Lang Jiang Yuanyuan Hu 《Journal of Semiconductors》 2025年第8期84-92,共9页
Doping plays a pivotal role in enhancing the performance of organic semiconductors(OSCs)for advanced optoelectronic and thermoelectric applications.In this study,we systematically investigated the doping performance a... Doping plays a pivotal role in enhancing the performance of organic semiconductors(OSCs)for advanced optoelectronic and thermoelectric applications.In this study,we systematically investigated the doping performance and applicability of the ionic dopant 4-isopropyl-4′-methyldiphenyliodonium tetrakis(penta-fluorophenyl-borate)(DPI-TPFB)as a p-dopant for OSCs.Using the p-type OSC PBBT-2T as a model system,we demonstrated that DPI-TPFB shows significant doping effect,as confirmed by ESR spectra,ultraviolet-visible-near-infrared(UV-vis-NIR)absorption,and work function analysis,and enhances the electronic conductivity of PBBT-2T films by over four orders of magnitude.Furthermore,DPI-TPFB exhibited broad doping applicability,effectively doping various p-type OSCs and even imparting p-type characteristics to the n-type OSC N2200,transforming its intrinsic n-type behavior into p-type.The application of DPI-TPFB-doped PBBT-2T films in organic thermoelectric devices(OTEs)was also explored,achieving a power factor of approximately 10μW·m^(-1)·K^(-2).These findings highlight the potential of DPI-TPFB as a versatile and efficient dopant for integration into organic optoelectronic and thermoelectric devices. 展开更多
关键词 ionic dopant DOPING DPI-TPFB organic semiconductor organic thermoelectric devices
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基于半超结结构的1200 V SiC MOSFET功率器件的研究
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作者 王铭昊 谭永亮 +3 位作者 刘佳佳 周国 付兴中 张力江 《电力电子技术》 2026年第4期164-171,共8页
碳化硅(silicon carbide,SiC)功率器件因其优异的耐压、高温和高频特性,在新能源与电力电子领域具有广阔的应用前景。然而,传统SiC金属氧化物半导体场效应管(metal oxide semiconductor field effect transistor,MOSFET)存在导通电阻与... 碳化硅(silicon carbide,SiC)功率器件因其优异的耐压、高温和高频特性,在新能源与电力电子领域具有广阔的应用前景。然而,传统SiC金属氧化物半导体场效应管(metal oxide semiconductor field effect transistor,MOSFET)存在导通电阻与击穿电压之间的矛盾,限制了其性能进一步提升。为此,本文提出一种基于半超结结构的SiC MOSFET,通过P/N柱交替排列优化电场分布,实现击穿电压与导通电阻的协同优化。首先,建立器件的二维仿真模型,系统分析柱宽、柱深和掺杂浓度等关键参数对击穿电压、导通电阻及开关特性的影响;其次,设计结合结终端与场限环的复合终端结构并进行优化仿真;最后,通过实际工艺流程制备SiC半超结MOSFET原型器件,测试结果与仿真吻合,验证了所提结构的有效性。 展开更多
关键词 金属氧化物半导体场效应管 功率器件 碳化硅 半超结 终端 场限环
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基于LLM模型的AI误差分析MOSFET测试系统
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作者 罗西辉 何远萧 +2 位作者 陆韵炜 董亮 刘成 《集成电路与嵌入式系统》 2026年第3期42-47,共6页
针对传统MOSFET测试流程繁琐、依赖大型仪器且智能化程度低等难题,设计了一套集成大语言模型(LLM)与“雨珠S”便携硬件的自动化测试系统。该系统以“雨珠S”仪器为核心,通过一体化PCB载板实现特性曲线、阈值电压、导通电阻等参数的测试... 针对传统MOSFET测试流程繁琐、依赖大型仪器且智能化程度低等难题,设计了一套集成大语言模型(LLM)与“雨珠S”便携硬件的自动化测试系统。该系统以“雨珠S”仪器为核心,通过一体化PCB载板实现特性曲线、阈值电压、导通电阻等参数的测试,并创新性地利用Gemini API赋能软件实现PDF数据手册自动解析、测试参数智能推荐与测试结果的深度误差分析。对IRF7401器件的测试结果表明,系统获取的关键动静态参数与数据手册及仿真值吻合良好,验证了该测试方案的准确性与可行性,为终端用户进行器件性能评估提供了一种高效、智能的便携式新方法。 展开更多
关键词 MOsFET 误差分析 大语言模型 半导体器件 自动测试技术
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Preface to the Special Issue on Perovskite Semiconductor Optoelectronic Materials and Devices
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作者 Jingbi You Jiang Tang +1 位作者 Haibo Zeng Jianpu Wang 《Journal of Semiconductors》 EI CAS CSCD 2020年第5期3-3,共1页
Halide perovskite,a novel semiconductor material,was initially used in solar cells since 2009,and tremendous progresses have been witnessed in the last decade.The power conversion efficiency of the single perovskite s... Halide perovskite,a novel semiconductor material,was initially used in solar cells since 2009,and tremendous progresses have been witnessed in the last decade.The power conversion efficiency of the single perovskite solar cells has been incredibly increased up to 25.2%,and close to 30%efficiency was realized in perovskite/silicon tandem solar cells.Recently,the application of perovskite has been extended to the light-emitting diodes and photo-detectors. 展开更多
关键词 the special IssUE PEROVsKITE semiconductor OPTOELECTRONIC Materials devices
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基于拟合模型的FS-IGBT关断优化研究
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作者 周业贵 裴浩 代广珍 《山东师范大学学报(自然科学版)》 2026年第1期85-96,共12页
作为开关电路的核心功率器件,绝缘栅双极型晶体管(IGBT)的关断特性对其性能与可靠性具有决定性作用,是电路优化设计中实现低功耗运行的关键研究课题之一。研究表明,器件结构、关断产生的拖尾电流和电气参数等因素影响FS-IGBT的关断动态... 作为开关电路的核心功率器件,绝缘栅双极型晶体管(IGBT)的关断特性对其性能与可靠性具有决定性作用,是电路优化设计中实现低功耗运行的关键研究课题之一。研究表明,器件结构、关断产生的拖尾电流和电气参数等因素影响FS-IGBT的关断动态特性。然而,很少有研究关注工作过程中不同电路参数对提高FS-IGBT关断性能的影响。通过一系列不同电路参数(母线电压V_(dc)、栅极电压V_(g)、栅极电阻R_(g)、负载电感L_(c)和温度T_(c))的对比实验,研究了在测试电路中FS-IGBT的关断特性。并构建了多参数耦合的关断能量拟合模型,提出了一种通过优化电路参数来提高FS-IGBT关断可靠性的方法,并通过Sentaurus仿真进行了验证。结果显示,降低母线电压、栅极电压、适当的提高温度可以有效的提高IGBT的关断性能。 展开更多
关键词 绝缘栅双极型晶体管 功率半导体器件 关断损耗 拟合模型
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Electroluminescent Excitation Mechanism of Erbium-activated Zinc Sulfide Semiconductor Thin Film Devices
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作者 LIU Zhaohong WANG Yujiang +1 位作者 CHEN Zhenxiang LIU Ruitang(Xiamen University, Xiamen 361005, CHN) 《Semiconductor Photonics and Technology》 CAS 1996年第3期175-179,共5页
The electroluminescunce (EL) transient characteristics of erbium-doped zinc sulfide thin film (TF) devices excited by short rectangular pulses are studied, the luminescence delay after de-exciting and the relaxation l... The electroluminescunce (EL) transient characteristics of erbium-doped zinc sulfide thin film (TF) devices excited by short rectangular pulses are studied, the luminescence delay after de-exciting and the relaxation luminance peaks during decay are observed. A model description for energy transfer has been proposed. The experimental results can be theoretically explained with the computer curve fittings. 展开更多
关键词 semiconductor Materials Thin Film devices ELECTROLUMINEsCENCE EL Displays
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Engineering Process of Polymer for Thermoelectric Applications
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作者 Min Wang Xiao Zhang +2 位作者 Li-Yao Liu Ye Zou Chong-An Di 《Chinese Journal of Polymer Science》 2026年第4期906-921,I0007,共17页
Thermoelectric(TE)materials,which are capable of direct conversion between heat and electricity,offer a promising solution for sustainable energy harvesting.Conjugated polymers have emerged as compelling candidates fo... Thermoelectric(TE)materials,which are capable of direct conversion between heat and electricity,offer a promising solution for sustainable energy harvesting.Conjugated polymers have emerged as compelling candidates for flexible TE devices owing to their intrinsic flexibility,low cost,and low thermal conductivity.The performance of polymer-based organic thermoelectrics(OTEs)is profoundly influenced by the processing methods,which dictate molecular packing,crystallinity,and film morphology.This review systematically summarizes recent advances in polymer processing techniques for TE applications,including solution processing,patterning techniques,and large-area fabrication.We discuss the interrelationships among processing techniques,polymer microstructure,and TE performance,concluding with the current challenges and future perspectives for industrializing high-performance OTE devices. 展开更多
关键词 Organic semiconductors Processing techniques Organic thermoelectric devices Thermoelectric performance
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Beyond the Silicon Plateau:A Convergence of Novel Materials for Transistor Evolution
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作者 Jung Hun Lee Jae Young Kim +3 位作者 Hyeon-Ji Lee Sung-Jin Choi Yoon Jung Lee Ho Won Jang 《Nano-Micro Letters》 2026年第2期786-844,共59页
As silicon-based transistors face fundamental scaling limits,the search for breakthrough alternatives has led to innovations in 3D architectures,heterogeneous integration,and sub-3 nm semiconductor body thicknesses.Ho... As silicon-based transistors face fundamental scaling limits,the search for breakthrough alternatives has led to innovations in 3D architectures,heterogeneous integration,and sub-3 nm semiconductor body thicknesses.However,the true effectiveness of these advancements lies in the seamless integration of alternative semiconductors tailored for next-generation transistors.In this review,we highlight key advances that enhance both scalability and switching performance by leveraging emerging semiconductor materials.Among the most promising candidates are 2D van der Waals semiconductors,Mott insulators,and amorphous oxide semiconductors,which offer not only unique electrical properties but also low-power operation and high carrier mobility.Additionally,we explore the synergistic interactions between these novel semiconductors and advanced gate dielectrics,including high-K materials,ferroelectrics,and atomically thin hexagonal boron nitride layers.Beyond introducing these novel material configurations,we address critical challenges such as leakage current and long-term device reliability,which become increasingly crucial as transistors scale down to atomic dimensions.Through concrete examples showcasing the potential of these materials in transistors,we provide key insights into overcoming fundamental obstacles—such as device reliability,scaling down limitations,and extended applications in artificial intelligence—ultimately paving the way for the development of future transistor technologies. 展开更多
关键词 Modern transistors Transistor scaling Alternative semiconductors 3D integration Device reliability
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Direct Tunneling Effect in Metal-Semiconductor Contacts Simulated with Monte Carlo Method 被引量:2
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作者 孙雷 杜刚 +1 位作者 刘晓彦 韩汝琦 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2001年第11期1364-1368,共5页
Considering the tunneling effect and the Schottky effect,the metal semiconductor contact is simulated by using self consistent ensemble Monte Carlo method.Under different biases or at different barrier heights,the i... Considering the tunneling effect and the Schottky effect,the metal semiconductor contact is simulated by using self consistent ensemble Monte Carlo method.Under different biases or at different barrier heights,the investigation into the tunneling current indicates that the tunneling effect is of great importance under reverse biases.The Schottky barrier diode current due to Schottky effect is in agreement with the theoretical one.The barrier lowering is found a profound effect on the current transport at the metal semiconductor interface. 展开更多
关键词 Monte Carlo device simulation metal semiconductor contact direct tunneling schottky effect
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Modeling analysis and optimization design of the thermostatical control system of laser instrument of the semiconductor 被引量:11
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作者 张新义 张建军 《微计算机信息》 北大核心 2008年第1期268-270,共3页
Influence produced by the heat effect at work of the laser instrument crystal of the semiconductor, the text designs a kind of temperature control system to the crystal of the laser instrument, using the thought and m... Influence produced by the heat effect at work of the laser instrument crystal of the semiconductor, the text designs a kind of temperature control system to the crystal of the laser instrument, using the thought and method of the classical control theory to analyze this temperature control system, and establishes mathematics model. According to mathematics model the text demonstrated the system at S field and time- area, and proposed optimizing basis to the total mark of proportion and differential parameter to con- troller PID, thus proposed a kind of temperature control scheme. And the thermostatically system is simulated by MATLAB. 展开更多
关键词 激光器 半导体制冷器 PID控制电路
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High Performance 70nm CMOS Devices
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作者 徐秋霞 钱鹤 +5 位作者 殷华湘 贾林 季红浩 陈宝钦 朱亚江 刘明 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2001年第2期134-139,共6页
A high performance 70nm CMOS device has been demonstrated for the first time in the continent, China. Some innovations in techniques are applied to restrain the short channel effect and improve the driving ability, ... A high performance 70nm CMOS device has been demonstrated for the first time in the continent, China. Some innovations in techniques are applied to restrain the short channel effect and improve the driving ability, such as 3nm nitrided oxide, dual poly Si gate electrode, novel super steep retrograde channel doping by heavy ion implantation, ultra shallow S/D extension formed by Ge PAI(Pre Amorphism Implantation) plus LEI(Low Energy Implantation), thin and low resistance Ti SALICIDE by Ge PAI and special cleaning, etc. The shortest channel length of the CMOS device is 70nm. The threshold voltages, G m and off current are 0 28V,490mS·mm -1 and 0 08nA/μm for NMOS and -0 3V,340mS·mm -1 and 0 2nA/μm for PMOS, respectively. Delays of 23 5ps/stage at 1 5V, 17 5ps/stage at 2 0V and 12 5ps/stage at 3V are achieved in the 57 stage unloaded 100nm CMOS ring oscillator circuits. 展开更多
关键词 high performance 70nm CMOs device s/D extension nitrided gate oxide Ge PAI sALICIDE
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