Al-doped ZnO thin films were prepared on glass substrate using an ultra-high density target by RF magnetron sputtering at room temperature. The microstructure, surface morphology, optical and electrical properties of ...Al-doped ZnO thin films were prepared on glass substrate using an ultra-high density target by RF magnetron sputtering at room temperature. The microstructure, surface morphology, optical and electrical properties of AZO thin films were investigated by X-ray diffractometer, scanning electron microscope, UV-visible spectrophotometer, four-point probe method, and Hall-effect measurement system. The results showed that all the films obtained were polycrystalline with a hexagonal structure and average optical transmittance of AZO thin films was over 85 % at different sputtering powers. The sputtering power had a great effect on optoelectronic properties of the AZO thin films, especially on the resistivity. The lowest resistivity of 4.5×10^-4 Ω·cm combined with the transmittance of 87.1% was obtained at sputtering power of 200 W. The optical band gap varied between 3.48 and 3.68 eV.展开更多
Columnar nanocrystalline aluminum nitride(cnc-AlN) thin films with(002) orientation and uniform texture have been deposited successfully on large silicon wafers by RF reactive magnetron sputtering.At the optimum sputt...Columnar nanocrystalline aluminum nitride(cnc-AlN) thin films with(002) orientation and uniform texture have been deposited successfully on large silicon wafers by RF reactive magnetron sputtering.At the optimum sputtering parameters, the deposited cnc-AlN thin films show a c-axis preferred orientation with a crystallite size of about 28 nm and surface roughness(RMS) of about 1.29 nm. The cnc-AlN thin films were well transparent with an optical band gap about 4.8 e V, and the residual compressive stress and the defect density in the film have been revealed by Ramon spectroscopy. Moreover, piezoelectric performances of the cnc-AlN thin films executed effectively in a film bulk acoustic resonator structure.展开更多
To obtain high transmittance and low resistivity ZnO transparent conductive thin films,a series of ZnO ceramic targets（ZnO：Al,ZnO：（Al,Dy）,ZnO：（Al,Gd）,ZnO：（Al,Zr）,ZnO：（Al,Nb）,and ZnO：（Al,W）） were fabr...To obtain high transmittance and low resistivity ZnO transparent conductive thin films,a series of ZnO ceramic targets（ZnO：Al,ZnO：（Al,Dy）,ZnO：（Al,Gd）,ZnO：（Al,Zr）,ZnO：（Al,Nb）,and ZnO：（Al,W）） were fabricated and used to deposit thin films onto glass substrates by radio frequency（RF） magnetron sputtering.X-ray diffraction（XRD） analysis shows that the films are polycrystalline fitting well with hexagonal wurtzite structure and have a preferred orientation of the（002） plane.The transmittance of above 86% as well as the lowest resistivity of 8.43 × 10^-3 Ω·cm was obtained.展开更多
In particular, the dye-sensitised solar cells(DSSCs) have a high potential in the rational energy conversion efficiency to secure our sustainable energy source.In the present study, advanced radio frequency(RF) magnet...In particular, the dye-sensitised solar cells(DSSCs) have a high potential in the rational energy conversion efficiency to secure our sustainable energy source.In the present study, advanced radio frequency(RF) magnetron sputtering technique was applied to incorporate titanium dioxide(TiO) dopants into reduced graphene oxide(rGO) nanosheet for improving the power conversion efficiency(PCE) of DSSCs device. An optimum TiOcontent incorporated onto rGO nanosheet plays an important role in improving the PCE of DSSCs by minimising the recombination losses of photo-induced charge carriers.Based on the results obtained, 40-s sputtering duration for incorporating TiOdopants onto rGO nanosheet exhibits a maximum PCE of 8.78% than that of pure rGO film(0.68%). In fact, the presence of optimum content of TiOdopants within rGO nanosheet could act as mediators for efficient separation photo-induced charge carriers. However, the excessive of sputtering duration(e.g. 60 s) of TiOdopants onto rGO nanosheet results higher charge recombination and lowers the PCE of DSSCs(5.39%).展开更多
Transparent oxide semiconductor, a-IGZO, thin films were prepared by high-vacuum RF magnetron sputtering at different working pressures. The effect of working pressure on crystal structure, surface morphology, and ele...Transparent oxide semiconductor, a-IGZO, thin films were prepared by high-vacuum RF magnetron sputtering at different working pressures. The effect of working pressure on crystal structure, surface morphology, and electrical and optical properties of the films was studied. The highest ball mobility of 17.45 cmZ-V-l.s- 1 is obtained at 0.3 Pa with annealing at 200 ℃, while the highest carrier concentration of 2.32×10^20 cm^-3 and the lowest resistivity of 0.001568 Ω.cm are obtained at 0.45 Pa with annealing. The highest transmittance of 90.9 % is obtained at 0.9 Pa with annealing treatment. A ＂blue shift＂ of UV absorption edge is observed with the increase of working press ure.展开更多
We demonstrate that radio frequency(RF)magnetron sputtering technique can modify the perpendicular magnetic anisotropy(PMA)of Pt/Co/normal metal(NM)thin films.Influence of ion irradiation during RF magnetron sputterin...We demonstrate that radio frequency(RF)magnetron sputtering technique can modify the perpendicular magnetic anisotropy(PMA)of Pt/Co/normal metal(NM)thin films.Influence of ion irradiation during RF magnetron sputtering should not be neglected and it can weaken PMA of the deposited magnetic films.The magnitude of this influence can be controlled by tuning RF magnetron sputtering deposition conditions and the upper NM layer thickness.According to the stopping and range of ions in matter(SRIM)simulation results,defects such as displacement atoms and vacancies in the deposited film will increase after the RF magnetron sputtering,which can account for the weakness of PMA.The amplitude changes of the Hall resistance and the threshold current intensity of spin orbit torque(SOT)induced magnetization switching also can be modified.Our study could be useful for controlling magnetic properties of PMA films and designing new type of SOT-based spintronic devices.展开更多
The influence of amorphous TiO_2 seeding layers on the phase composition of lead magnesium niobate-lead titanate(0.7Pb(Mg1/3Nb2/3)O3-0.3PbTiO3,PMN-PT) films deposited on Pt/Ti/SiO2/Si substrate by RF magnetron sputter...The influence of amorphous TiO_2 seeding layers on the phase composition of lead magnesium niobate-lead titanate(0.7Pb(Mg1/3Nb2/3)O3-0.3PbTiO3,PMN-PT) films deposited on Pt/Ti/SiO2/Si substrate by RF magnetron sputtering was examined.The relation between seeding layer thickness and phase composition at different post annealing temperature was observed by XRD.The thickness of amorphous TiO2 seeding layer and post annealing temperature had remarkable effects on PMN-PT film phase composition.When amorphous seeding layer becomes thick,a new phase of Nb2O5 exists in the films.Only when the seeding layer thickness is suitable,the film with pure perovskite phase can be attained.展开更多
Sm and Gd co-doped Ceria (SGDC:Sm_(0.1)Gd_(0.1)Ce_(0.8)O_(1.90)) films as the electrolytes were investigated for the IT-SOFCs (intermediate-temperature solid oxide fuel cells).SGDC sensing films were successfully prep...Sm and Gd co-doped Ceria (SGDC:Sm_(0.1)Gd_(0.1)Ce_(0.8)O_(1.90)) films as the electrolytes were investigated for the IT-SOFCs (intermediate-temperature solid oxide fuel cells).SGDC sensing films were successfully prepared on the Al_2O_3 substrates by RF-magnetron sputtering.The relationship between sputtering parameters and film microstructure was discussed, and the optimum parameters were gained.The crystal structure analysis and surface morphologic observation of the SGDC films were carried out through X-ray diffraction (XRD) and scanning electron microscopy (SEM).The oxygen ion conductivity of the SGDC film was evaluated by AC impedance spectroscopy at the different temperatures.The XRD analysis shows that the SGDC films grow preferentially along the (111) compact plane.The crystallinity of the SGDC films is enhanced with the increase of the RF sputtering power from 150 W to 250 W.The oxygen ion conductivity of the SGDC was measured at the temperature from 600℃to 800℃in air by AC impedance spectroscopy.The result shows that a high oxygen ion conductivity of 2.44×10^(-2) S.cm^(-1) was achieved at 800℃.展开更多
Properties of ferroelectric xBiInO3-（1-x）PbTiO3（xBI-（1-x）PT） thin films deposited on（101） SrRuO3/（200）Pt/（200） MgO substrates by rf magnetron sputtering method and effects of deposition conditions are inve...Properties of ferroelectric xBiInO3-（1-x）PbTiO3（xBI-（1-x）PT） thin films deposited on（101） SrRuO3/（200）Pt/（200） MgO substrates by rf magnetron sputtering method and effects of deposition conditions are investigated.The structures of the xBI-（1-x）PT films are characterized by x-ray diffraction and scanning electron microscopy.The results indicate that the thin films are grown with mainly（001） orientation. The chemical compositions of the films are analyzed by scanning electron probe and the results indicate that the loss phenomena of Pb and Bi elements depend on the pressure and temperature during the sputtering process.The sputtering parameters including target composition, substrate temperature, and gas pressure are adjusted to obtain optimum sputtering conditions. To decrease leakage currents,2 mol% La2 O3 is doped in the targets. The P-E hysteresis loops show that the optimized xBI-（1-x）PT（x = 0.24） film has high ferroelectricities with remnant polarization2 Pr = 80μC/cm2 and coercive electric field 2 EC = 300 kV/cm. The Curie temperature is about 640℃. The results show that the films have optimum performance and will have wide applications.展开更多
Polycrystalline ZnO films were prepared on glass wafer using Zn targets by radio frequency(RF)reactive sputtering technique under different deposition conditions.X-ray diffraction (XRD) and optical transmittance spect...Polycrystalline ZnO films were prepared on glass wafer using Zn targets by radio frequency(RF)reactive sputtering technique under different deposition conditions.X-ray diffraction (XRD) and optical transmittance spectrum were employed to analyze the structure and optical character of the films.The strain and stress in films, as well as the packing density are calculated in terms of refractive index of films measured with an elliptic polarization analyzer.It is the deposition conditions that have great effects on the structural and optical properties of ZnO films.Under the optimal conditions,the only evident peak in XRD spectrum was (002) peak with the full width at half maximum (FWHM) of 0.20° showing the grain size of 42.8 nm.The packing density,the stress in (002) plane and the average optical transmittance in the visible region were about 97%,-1.06×10~9 N/m^2 and 92%, respectively.展开更多
Undoped and copper(Cu)doped zinc oxide(Zn_(1-x)Cu_(x)O,where x=0-0.065)nano crystal thin films have been deposited on glass substrate via RF/DC reactive co-sputtering technique.The aim of this work is to investigate t...Undoped and copper(Cu)doped zinc oxide(Zn_(1-x)Cu_(x)O,where x=0-0.065)nano crystal thin films have been deposited on glass substrate via RF/DC reactive co-sputtering technique.The aim of this work is to investigate the crystal structure of ZnO and Cu doped ZnO thin films and also study the effect of Cu doping on optical band gap of ZnO thin films.The identification and confirmation of the crystallinity,film thickness and surface morphology of the nano range thin films are confirmed by using X-ray diffractometer(XRD),scanning electron microscope and atomic force microscope.The XRD peak at a diffractive angle of 34.44°and Miller indices at(002)confirms the ZnO thin films.Crystallite size of undoped ZnO thin films is 27 nm and decreases from 27 nm to 22 nm with increasing the atomic fraction of Cu(x_(Cu))in the ZnO thin films from 0 to 6.5%respectively,which is calculated from XRD(002)peaks.The different bonding information of all deposited films was investigated by Fourier transform infrared spectrometer in the range of wave number between 400 cm^(-1) to 4000 cm^(-1).Optical band gap energy of all deposited thin films was analyzed by ultraviolet visible spectrophotometer,which varies from 3.35 eV to 3.19 eV with the increase of x_(Cu) from 0 to 6.5%respectively.Urbach energy of the deposited thin films increases from 115 meV to 228 meV with the increase of x_(Cu) from 0 to 6.5% respectively.展开更多
This study delves into ion behavior at the substrate position within RF magnetron discharges utilizing an indium tin oxide(ITO)target.The positive ion energies exhibit an upward trajectory with increasing RF power,att...This study delves into ion behavior at the substrate position within RF magnetron discharges utilizing an indium tin oxide(ITO)target.The positive ion energies exhibit an upward trajectory with increasing RF power,attributed to heightened plasma potential and initial emergent energy.Simultaneously,the positive ion flux escalates owing to amplified sputtering rates and electron density.Conversely,negative ions exhibit broad ion energy distribution functions(IEDFs)characterized by multiple peaks.These patterns are clarified by a combination of radiofrequency oscillation of cathode voltage and plasma potential,alongside ion transport time.This elucidation finds validation in a one-dimensional model encompassing the initial ion energy.At higher RF power,negative ions surpassing 100 e V escalate in both flux and energy,posing a potential risk of sputtering damages to ITO layers.展开更多
Zinc oxide (ZnO) and aluminum-doped zinc oxide (ZnO:Al) thin films were deposited onto glass and silicon substrates by RF magnetron sputtering using a zinc-aluminum target. Both films were deposited at a growth rate o...Zinc oxide (ZnO) and aluminum-doped zinc oxide (ZnO:Al) thin films were deposited onto glass and silicon substrates by RF magnetron sputtering using a zinc-aluminum target. Both films were deposited at a growth rate of 12.5 nm/min to a thickness of around 750 nm. In the visible region, the films exhibit optical transmittances which are greater than 80%. The optical energy gap of ZnO films increased from 3.28 eV to 3.36 eV upon doping with Al. This increase is related to the increase in carrier density from 5.9 × 1018 cm-3 to 2.6 × 1019 cm-3. The RMS surface roughness of ZnO films grown on glass increased from 14 to 28 nm even with only 0.9% at Al content. XRD analysis revealed that the ZnO films are polycrystalline with preferential growth parallel to the (002) plane, which corresponds to the wurtzite structure of ZnO.展开更多
Zinc oxide （ZnO） thin films were grown on silicon substrate by RF （radio frequency） magnetron sputtering.Surface topography of these films exhibited a nanostructured granular appearance with the size of individual...Zinc oxide （ZnO） thin films were grown on silicon substrate by RF （radio frequency） magnetron sputtering.Surface topography of these films exhibited a nanostructured granular appearance with the size of individual grains between 50 to 100 nm.Corresponding cross-sectional electron micrographs revealed columnar grains in the form of aggregated nanorods/wires with length of about 500 nm,similar to the thickness of these thin films of ZnO nucleated and grown vertically on the silicon substrate.High resolution lattice scale imaging using high resolution transmission electron microscope （HRTEM） elucidated the single crystalline 1010 planes of hexagonal-ZnO constituting the columnar grains with the individual nanorod diameter between 3 and 4 nm.The photoluminescence measurements showed the prominent emission peak at around 460 nm for the blue band,normally attributed to intrinsic defects in particular interstitial zinc （Zn）.These films were further characterized by X-ray diffraction （XRD）,Fourier transform infrared spectroscopy （FTIR）,Raman spectroscopy and electron paramagnetic resonance （EPR） to evaluate various aspects on preferred growth orientations,band structures and vibrational modes originated in such fascinating nano-grained thin films of ZnO.The present investigations inferred that these films are advantageous in various potential applications for fabricating nano-scaled devices.展开更多
TiO2-CeO2 films were deposited on soda-lime glass substrates at varied substrate temperatures by rf magnetron sputtering using 40% molar TiO2-60% molar CeO2 ceramic target in Ar：O2=95：5 atmosphere.The structure,surf...TiO2-CeO2 films were deposited on soda-lime glass substrates at varied substrate temperatures by rf magnetron sputtering using 40% molar TiO2-60% molar CeO2 ceramic target in Ar：O2=95：5 atmosphere.The structure,surface composition,UV-visible spectra of the films were measured by scanning electron microscopy and X-ray diffraction,and X-ray photoelectron spectroscopy,respectively.The experimental results show that the films are amorphous,there are only Ti^4＋ and Ce^4＋ on the surface of the films,the obtained TiO2-CeO2 films shou a good uniformity and high densification,and the films deposited on the glass can shield ultraviolet light without significant absorpition of visible light,the films deposited on substrates at room temperature and 220℃ absorb UV effectively.展开更多
ZnO thin films with varying Ta concentrations were fabricated through magnetron sputtering.The crystallinity and surface morphology of the ZnO films are significantly influenced by the incorporation of Ta,as evidenced...ZnO thin films with varying Ta concentrations were fabricated through magnetron sputtering.The crystallinity and surface morphology of the ZnO films are significantly influenced by the incorporation of Ta,as evidenced by the X-ray diffraction and scanning electron microscopy results.The lattice constants,as determined by X-ray diffraction,contradict the disparity in Ta and Zn ion radii,which is attributed to the impact of interstitial defects.This inconsistency introduces variations in carrier concentration in this experiment compared with prior studies.Subsequent exploration of the luminescent characteristics and emission mechanism of defect levels in Ta-doped ZnO films was conducted through photoluminescence.Furthermore,the factors influencing the bandgap are discussed.展开更多
A terahertz temperature sensor is developed by combining an Al metasurface with polycrystalline strontium titanate(STO)prepared by RF magnetron sputtering and air annealing.Leveraging the excellent dielectric properti...A terahertz temperature sensor is developed by combining an Al metasurface with polycrystalline strontium titanate(STO)prepared by RF magnetron sputtering and air annealing.Leveraging the excellent dielectric properties of STO,we design terahertz temperature sensors based on amorphous and polycrystalline STO.In the temperature range of 300–620 K,as the temperature increases,the transmission curve of the amorphous STO temperature sensor only exhibits a frequency shift phenomenon.Owing to the different lattice structures,the dielectric response of polycrystalline STO causes frequency shifts and significant amplitude changes in the transmission curve,indicating that it has dual-dimensional temperature sensing capabilities.Through quantitative analysis,a dual-dimensional polycrystalline STO terahertz temperature sensor with the maximum sensitivity of 0.21 GHz/K and maximum transmittance of 13%is obtained.This study not only provides a new strategy for the application of polycrystalline STO in the development of terahertz temperature sensors but also demonstrates that such sensors are characterized by excellent performance,low cost,and ease of processing.展开更多
The excellent physical and chemical properties of cubic boron nitride(c-BN) film make it a promising candidate for various industry applications. However, the c-BN film thickness restricts its practical applications i...The excellent physical and chemical properties of cubic boron nitride(c-BN) film make it a promising candidate for various industry applications. However, the c-BN film thickness restricts its practical applications in many cases. Thus, it is indispensable to develop an economic, simple and environment-friend way to synthesize high-quality thick, stable c-BN films. High-cubic-content BN films are prepared on silicon(100) substrates by radio frequency(RF) magnetron sputtering from an h-BN target at low substrate temperature. Adhesions of the c-BN films are greatly improved by adding hydrogen to the argon/nitrogen gas mixture, allowing the deposition of a film up to 5-μm thick. The compositions and the microstructure morphologies of the c-BN films grown at different substrate temperatures are systematically investigated with respect to the ratio of Hgas content to total working gas. In addition, a primary mechanism for the deposition of thick c-BN film is proposed.展开更多
Alumina thin films were deposited on fused quartz and SS304 substrate by pulsed rf magnetron sputtering with both direct and reactive methods. The films were characterised by energy dispersive X-ray spectroscopy, X-ra...Alumina thin films were deposited on fused quartz and SS304 substrate by pulsed rf magnetron sputtering with both direct and reactive methods. The films were characterised by energy dispersive X-ray spectroscopy, X-ray diffraction, scanning electron microscopy, field emission scanning electron microscopy and atomic force microscopy to reveal the microstructure, surface morphology and topography of thin films. Transmittance and reflectance of alumina thin film were evaluated after deposition on the quartz substrate. Transmittance of the quartz remains almost un-altered when alumina was deposited by the reactive sputtering. A marginal decrease of ~4% in the transmittance of quartz was, however, observed after deposition of alumina by direct sputtering. Infrared emittance of the substrate also remains almost constant after deposition of thin alumina film. Further, as-deposited alumina on SS304 obtained by both direct and reactive sputtering process was amorphous in nature. However, after annealing crystalline peaks were observed.展开更多
This study has investigated the influence of the radio frequency （rf） power and working pressure on the properties of indium tin oxide （ITO） thin films, which were prepared by long-throw rf magnetron sputtering te...This study has investigated the influence of the radio frequency （rf） power and working pressure on the properties of indium tin oxide （ITO） thin films, which were prepared by long-throw rf magnetron sputtering technique at room temperature. For 200 nm thick ITO films grown at room temperature in pure argon pressure of 0.27 Pa and sputtering power of 40 W, sheet resistance was 26.6 Ω/sq. and transmittance was higher than 88% （at wavelength 500 nm）. An X-ray diffraction analysis of the samples deposited at room temperature revealed a structural change from amorphous to mixed amorphous/polycrystalline structure at （222） and （400） texture with increasing rf power. The surface composition of ITO films was characterized by X-ray photoelectron spectroscopy （XPS）. Oxygen atoms in both amorphous and crystalline ITO structures were observed from O Is XPS spectra.展开更多
基金supported by open research fund from Guangxi Key Laboratory of New Energy and Building Energy Saving, China
文摘Al-doped ZnO thin films were prepared on glass substrate using an ultra-high density target by RF magnetron sputtering at room temperature. The microstructure, surface morphology, optical and electrical properties of AZO thin films were investigated by X-ray diffractometer, scanning electron microscope, UV-visible spectrophotometer, four-point probe method, and Hall-effect measurement system. The results showed that all the films obtained were polycrystalline with a hexagonal structure and average optical transmittance of AZO thin films was over 85 % at different sputtering powers. The sputtering power had a great effect on optoelectronic properties of the AZO thin films, especially on the resistivity. The lowest resistivity of 4.5×10^-4 Ω·cm combined with the transmittance of 87.1% was obtained at sputtering power of 200 W. The optical band gap varied between 3.48 and 3.68 eV.
文摘Columnar nanocrystalline aluminum nitride(cnc-AlN) thin films with(002) orientation and uniform texture have been deposited successfully on large silicon wafers by RF reactive magnetron sputtering.At the optimum sputtering parameters, the deposited cnc-AlN thin films show a c-axis preferred orientation with a crystallite size of about 28 nm and surface roughness(RMS) of about 1.29 nm. The cnc-AlN thin films were well transparent with an optical band gap about 4.8 e V, and the residual compressive stress and the defect density in the film have been revealed by Ramon spectroscopy. Moreover, piezoelectric performances of the cnc-AlN thin films executed effectively in a film bulk acoustic resonator structure.
文摘To obtain high transmittance and low resistivity ZnO transparent conductive thin films,a series of ZnO ceramic targets（ZnO：Al,ZnO：（Al,Dy）,ZnO：（Al,Gd）,ZnO：（Al,Zr）,ZnO：（Al,Nb）,and ZnO：（Al,W）） were fabricated and used to deposit thin films onto glass substrates by radio frequency（RF） magnetron sputtering.X-ray diffraction（XRD） analysis shows that the films are polycrystalline fitting well with hexagonal wurtzite structure and have a preferred orientation of the（002） plane.The transmittance of above 86% as well as the lowest resistivity of 8.43 × 10^-3 Ω·cm was obtained.
基金financially supported by the University Malaya Prototype Grant (No. RU005G-2016)the Transdisciplinary Research Grant Scheme, TRGS (No. TR002A-2014B)+1 种基金the University Malaya Research Grant (No. RP045B-17AET)the Global Collaborative Programme-SATU Joint Research Scheme from the University of Malaya (No. ST007-2017)
文摘In particular, the dye-sensitised solar cells(DSSCs) have a high potential in the rational energy conversion efficiency to secure our sustainable energy source.In the present study, advanced radio frequency(RF) magnetron sputtering technique was applied to incorporate titanium dioxide(TiO) dopants into reduced graphene oxide(rGO) nanosheet for improving the power conversion efficiency(PCE) of DSSCs device. An optimum TiOcontent incorporated onto rGO nanosheet plays an important role in improving the PCE of DSSCs by minimising the recombination losses of photo-induced charge carriers.Based on the results obtained, 40-s sputtering duration for incorporating TiOdopants onto rGO nanosheet exhibits a maximum PCE of 8.78% than that of pure rGO film(0.68%). In fact, the presence of optimum content of TiOdopants within rGO nanosheet could act as mediators for efficient separation photo-induced charge carriers. However, the excessive of sputtering duration(e.g. 60 s) of TiOdopants onto rGO nanosheet results higher charge recombination and lowers the PCE of DSSCs(5.39%).
基金financially supported by the National Natural Science Foundation of China (No. 51571010)
文摘Transparent oxide semiconductor, a-IGZO, thin films were prepared by high-vacuum RF magnetron sputtering at different working pressures. The effect of working pressure on crystal structure, surface morphology, and electrical and optical properties of the films was studied. The highest ball mobility of 17.45 cmZ-V-l.s- 1 is obtained at 0.3 Pa with annealing at 200 ℃, while the highest carrier concentration of 2.32×10^20 cm^-3 and the lowest resistivity of 0.001568 Ω.cm are obtained at 0.45 Pa with annealing. The highest transmittance of 90.9 % is obtained at 0.9 Pa with annealing treatment. A ＂blue shift＂ of UV absorption edge is observed with the increase of working press ure.
基金Project supported by the National Key R&D Program of China(Grant No.2017YFB0405700)the National Natural Science Foundation of China(Grant Nos.11474272 and 61774144)+1 种基金Beijing Natural Science Foundation Key Program,China(Grant No.Z190007)the Chinese Academy of Sciences(Grant Nos.QYZDY-SSW-JSC020,XDB44000000,and XDB28000000)。
文摘We demonstrate that radio frequency(RF)magnetron sputtering technique can modify the perpendicular magnetic anisotropy(PMA)of Pt/Co/normal metal(NM)thin films.Influence of ion irradiation during RF magnetron sputtering should not be neglected and it can weaken PMA of the deposited magnetic films.The magnitude of this influence can be controlled by tuning RF magnetron sputtering deposition conditions and the upper NM layer thickness.According to the stopping and range of ions in matter(SRIM)simulation results,defects such as displacement atoms and vacancies in the deposited film will increase after the RF magnetron sputtering,which can account for the weakness of PMA.The amplitude changes of the Hall resistance and the threshold current intensity of spin orbit torque(SOT)induced magnetization switching also can be modified.Our study could be useful for controlling magnetic properties of PMA films and designing new type of SOT-based spintronic devices.
文摘The influence of amorphous TiO_2 seeding layers on the phase composition of lead magnesium niobate-lead titanate(0.7Pb(Mg1/3Nb2/3)O3-0.3PbTiO3,PMN-PT) films deposited on Pt/Ti/SiO2/Si substrate by RF magnetron sputtering was examined.The relation between seeding layer thickness and phase composition at different post annealing temperature was observed by XRD.The thickness of amorphous TiO2 seeding layer and post annealing temperature had remarkable effects on PMN-PT film phase composition.When amorphous seeding layer becomes thick,a new phase of Nb2O5 exists in the films.Only when the seeding layer thickness is suitable,the film with pure perovskite phase can be attained.
文摘Sm and Gd co-doped Ceria (SGDC:Sm_(0.1)Gd_(0.1)Ce_(0.8)O_(1.90)) films as the electrolytes were investigated for the IT-SOFCs (intermediate-temperature solid oxide fuel cells).SGDC sensing films were successfully prepared on the Al_2O_3 substrates by RF-magnetron sputtering.The relationship between sputtering parameters and film microstructure was discussed, and the optimum parameters were gained.The crystal structure analysis and surface morphologic observation of the SGDC films were carried out through X-ray diffraction (XRD) and scanning electron microscopy (SEM).The oxygen ion conductivity of the SGDC film was evaluated by AC impedance spectroscopy at the different temperatures.The XRD analysis shows that the SGDC films grow preferentially along the (111) compact plane.The crystallinity of the SGDC films is enhanced with the increase of the RF sputtering power from 150 W to 250 W.The oxygen ion conductivity of the SGDC was measured at the temperature from 600℃to 800℃in air by AC impedance spectroscopy.The result shows that a high oxygen ion conductivity of 2.44×10^(-2) S.cm^(-1) was achieved at 800℃.
基金Supported by the National Natural Science Foundation of China under Grant No 11304160the Special Fund for Public Interest of China under Grant No 201510068,and the NUPTFC under Grant No NY215111
文摘Properties of ferroelectric xBiInO3-（1-x）PbTiO3（xBI-（1-x）PT） thin films deposited on（101） SrRuO3/（200）Pt/（200） MgO substrates by rf magnetron sputtering method and effects of deposition conditions are investigated.The structures of the xBI-（1-x）PT films are characterized by x-ray diffraction and scanning electron microscopy.The results indicate that the thin films are grown with mainly（001） orientation. The chemical compositions of the films are analyzed by scanning electron probe and the results indicate that the loss phenomena of Pb and Bi elements depend on the pressure and temperature during the sputtering process.The sputtering parameters including target composition, substrate temperature, and gas pressure are adjusted to obtain optimum sputtering conditions. To decrease leakage currents,2 mol% La2 O3 is doped in the targets. The P-E hysteresis loops show that the optimized xBI-（1-x）PT（x = 0.24） film has high ferroelectricities with remnant polarization2 Pr = 80μC/cm2 and coercive electric field 2 EC = 300 kV/cm. The Curie temperature is about 640℃. The results show that the films have optimum performance and will have wide applications.
文摘Polycrystalline ZnO films were prepared on glass wafer using Zn targets by radio frequency(RF)reactive sputtering technique under different deposition conditions.X-ray diffraction (XRD) and optical transmittance spectrum were employed to analyze the structure and optical character of the films.The strain and stress in films, as well as the packing density are calculated in terms of refractive index of films measured with an elliptic polarization analyzer.It is the deposition conditions that have great effects on the structural and optical properties of ZnO films.Under the optimal conditions,the only evident peak in XRD spectrum was (002) peak with the full width at half maximum (FWHM) of 0.20° showing the grain size of 42.8 nm.The packing density,the stress in (002) plane and the average optical transmittance in the visible region were about 97%,-1.06×10~9 N/m^2 and 92%, respectively.
基金Maulana Azad National Fellowship(MANF)Scheme of University Grants Commission,New Delhi,India。
文摘Undoped and copper(Cu)doped zinc oxide(Zn_(1-x)Cu_(x)O,where x=0-0.065)nano crystal thin films have been deposited on glass substrate via RF/DC reactive co-sputtering technique.The aim of this work is to investigate the crystal structure of ZnO and Cu doped ZnO thin films and also study the effect of Cu doping on optical band gap of ZnO thin films.The identification and confirmation of the crystallinity,film thickness and surface morphology of the nano range thin films are confirmed by using X-ray diffractometer(XRD),scanning electron microscope and atomic force microscope.The XRD peak at a diffractive angle of 34.44°and Miller indices at(002)confirms the ZnO thin films.Crystallite size of undoped ZnO thin films is 27 nm and decreases from 27 nm to 22 nm with increasing the atomic fraction of Cu(x_(Cu))in the ZnO thin films from 0 to 6.5%respectively,which is calculated from XRD(002)peaks.The different bonding information of all deposited films was investigated by Fourier transform infrared spectrometer in the range of wave number between 400 cm^(-1) to 4000 cm^(-1).Optical band gap energy of all deposited thin films was analyzed by ultraviolet visible spectrophotometer,which varies from 3.35 eV to 3.19 eV with the increase of x_(Cu) from 0 to 6.5%respectively.Urbach energy of the deposited thin films increases from 115 meV to 228 meV with the increase of x_(Cu) from 0 to 6.5% respectively.
基金financial supports by National Natural Science Foundation of China(Nos.11975163 and 12175160)Nantong Basic Science Research-General Program(No.JC22022034)Natural Science Research Fund of Jiangsu College of Engineering and Technology(No.GYKY/2023/2)。
文摘This study delves into ion behavior at the substrate position within RF magnetron discharges utilizing an indium tin oxide(ITO)target.The positive ion energies exhibit an upward trajectory with increasing RF power,attributed to heightened plasma potential and initial emergent energy.Simultaneously,the positive ion flux escalates owing to amplified sputtering rates and electron density.Conversely,negative ions exhibit broad ion energy distribution functions(IEDFs)characterized by multiple peaks.These patterns are clarified by a combination of radiofrequency oscillation of cathode voltage and plasma potential,alongside ion transport time.This elucidation finds validation in a one-dimensional model encompassing the initial ion energy.At higher RF power,negative ions surpassing 100 e V escalate in both flux and energy,posing a potential risk of sputtering damages to ITO layers.
基金The authors acknowledge the financial support of the Brazilian agencies FAPESP(Process N°2008/53311-5 and 2011/21345-0)and CNPq.
文摘Zinc oxide (ZnO) and aluminum-doped zinc oxide (ZnO:Al) thin films were deposited onto glass and silicon substrates by RF magnetron sputtering using a zinc-aluminum target. Both films were deposited at a growth rate of 12.5 nm/min to a thickness of around 750 nm. In the visible region, the films exhibit optical transmittances which are greater than 80%. The optical energy gap of ZnO films increased from 3.28 eV to 3.36 eV upon doping with Al. This increase is related to the increase in carrier density from 5.9 × 1018 cm-3 to 2.6 × 1019 cm-3. The RMS surface roughness of ZnO films grown on glass increased from 14 to 28 nm even with only 0.9% at Al content. XRD analysis revealed that the ZnO films are polycrystalline with preferential growth parallel to the (002) plane, which corresponds to the wurtzite structure of ZnO.
文摘Zinc oxide （ZnO） thin films were grown on silicon substrate by RF （radio frequency） magnetron sputtering.Surface topography of these films exhibited a nanostructured granular appearance with the size of individual grains between 50 to 100 nm.Corresponding cross-sectional electron micrographs revealed columnar grains in the form of aggregated nanorods/wires with length of about 500 nm,similar to the thickness of these thin films of ZnO nucleated and grown vertically on the silicon substrate.High resolution lattice scale imaging using high resolution transmission electron microscope （HRTEM） elucidated the single crystalline 1010 planes of hexagonal-ZnO constituting the columnar grains with the individual nanorod diameter between 3 and 4 nm.The photoluminescence measurements showed the prominent emission peak at around 460 nm for the blue band,normally attributed to intrinsic defects in particular interstitial zinc （Zn）.These films were further characterized by X-ray diffraction （XRD）,Fourier transform infrared spectroscopy （FTIR）,Raman spectroscopy and electron paramagnetic resonance （EPR） to evaluate various aspects on preferred growth orientations,band structures and vibrational modes originated in such fascinating nano-grained thin films of ZnO.The present investigations inferred that these films are advantageous in various potential applications for fabricating nano-scaled devices.
文摘TiO2-CeO2 films were deposited on soda-lime glass substrates at varied substrate temperatures by rf magnetron sputtering using 40% molar TiO2-60% molar CeO2 ceramic target in Ar：O2=95：5 atmosphere.The structure,surface composition,UV-visible spectra of the films were measured by scanning electron microscopy and X-ray diffraction,and X-ray photoelectron spectroscopy,respectively.The experimental results show that the films are amorphous,there are only Ti^4＋ and Ce^4＋ on the surface of the films,the obtained TiO2-CeO2 films shou a good uniformity and high densification,and the films deposited on the glass can shield ultraviolet light without significant absorpition of visible light,the films deposited on substrates at room temperature and 220℃ absorb UV effectively.
基金supported by the National Natural Science Foundation of China(61774140).
文摘ZnO thin films with varying Ta concentrations were fabricated through magnetron sputtering.The crystallinity and surface morphology of the ZnO films are significantly influenced by the incorporation of Ta,as evidenced by the X-ray diffraction and scanning electron microscopy results.The lattice constants,as determined by X-ray diffraction,contradict the disparity in Ta and Zn ion radii,which is attributed to the impact of interstitial defects.This inconsistency introduces variations in carrier concentration in this experiment compared with prior studies.Subsequent exploration of the luminescent characteristics and emission mechanism of defect levels in Ta-doped ZnO films was conducted through photoluminescence.Furthermore,the factors influencing the bandgap are discussed.
基金National Natural Science Foundation of China(501100001809,62375235,62201496,62471431)Natural Science Foundation of Shandong Province(501100007129,ZR2023MF107,ZR202102180769,ZR2022QF054,ZR2021MF014)+2 种基金Qingchuang Science and Technology Plan of Shandong Universities(2023KJ283)Taishan Scholar Foundation of Shandong Province(501100010029,tsqn201909150)Youth Entrepreneurship Talents Introduction Project in Shandong Province Higher Education Institutions。
文摘A terahertz temperature sensor is developed by combining an Al metasurface with polycrystalline strontium titanate(STO)prepared by RF magnetron sputtering and air annealing.Leveraging the excellent dielectric properties of STO,we design terahertz temperature sensors based on amorphous and polycrystalline STO.In the temperature range of 300–620 K,as the temperature increases,the transmission curve of the amorphous STO temperature sensor only exhibits a frequency shift phenomenon.Owing to the different lattice structures,the dielectric response of polycrystalline STO causes frequency shifts and significant amplitude changes in the transmission curve,indicating that it has dual-dimensional temperature sensing capabilities.Through quantitative analysis,a dual-dimensional polycrystalline STO terahertz temperature sensor with the maximum sensitivity of 0.21 GHz/K and maximum transmittance of 13%is obtained.This study not only provides a new strategy for the application of polycrystalline STO in the development of terahertz temperature sensors but also demonstrates that such sensors are characterized by excellent performance,low cost,and ease of processing.
基金supported by the National Natural Science Foundation of China(Grant Nos.51572105,61504046,and 51272224)the Scientific Research Foundation for the Returned Overseas Chinese Scholars,State Education Ministry,China+1 种基金the Development and Reform Commission of Jilin Province,China(Grant No.2015Y050)the Scientific Research Foundation for the Returned Overseas of Jilin Province,China
文摘The excellent physical and chemical properties of cubic boron nitride(c-BN) film make it a promising candidate for various industry applications. However, the c-BN film thickness restricts its practical applications in many cases. Thus, it is indispensable to develop an economic, simple and environment-friend way to synthesize high-quality thick, stable c-BN films. High-cubic-content BN films are prepared on silicon(100) substrates by radio frequency(RF) magnetron sputtering from an h-BN target at low substrate temperature. Adhesions of the c-BN films are greatly improved by adding hydrogen to the argon/nitrogen gas mixture, allowing the deposition of a film up to 5-μm thick. The compositions and the microstructure morphologies of the c-BN films grown at different substrate temperatures are systematically investigated with respect to the ratio of Hgas content to total working gas. In addition, a primary mechanism for the deposition of thick c-BN film is proposed.
文摘Alumina thin films were deposited on fused quartz and SS304 substrate by pulsed rf magnetron sputtering with both direct and reactive methods. The films were characterised by energy dispersive X-ray spectroscopy, X-ray diffraction, scanning electron microscopy, field emission scanning electron microscopy and atomic force microscopy to reveal the microstructure, surface morphology and topography of thin films. Transmittance and reflectance of alumina thin film were evaluated after deposition on the quartz substrate. Transmittance of the quartz remains almost un-altered when alumina was deposited by the reactive sputtering. A marginal decrease of ~4% in the transmittance of quartz was, however, observed after deposition of alumina by direct sputtering. Infrared emittance of the substrate also remains almost constant after deposition of thin alumina film. Further, as-deposited alumina on SS304 obtained by both direct and reactive sputtering process was amorphous in nature. However, after annealing crystalline peaks were observed.
基金supported by National Sci-ence Council of the Republic of China(No.NSC-97-2221-E-270-002)Chienkuo Technology University(No.CTU-97-PR-EN-003-013-A)
文摘This study has investigated the influence of the radio frequency （rf） power and working pressure on the properties of indium tin oxide （ITO） thin films, which were prepared by long-throw rf magnetron sputtering technique at room temperature. For 200 nm thick ITO films grown at room temperature in pure argon pressure of 0.27 Pa and sputtering power of 40 W, sheet resistance was 26.6 Ω/sq. and transmittance was higher than 88% （at wavelength 500 nm）. An X-ray diffraction analysis of the samples deposited at room temperature revealed a structural change from amorphous to mixed amorphous/polycrystalline structure at （222） and （400） texture with increasing rf power. The surface composition of ITO films was characterized by X-ray photoelectron spectroscopy （XPS）. Oxygen atoms in both amorphous and crystalline ITO structures were observed from O Is XPS spectra.
