The transport mechanisms of the reverse leakage current in the UV light-emitting diodes （380nm） are investi- gated by the temperature-dependent current-voltage measurement first. Three possible transport mechanisms,...The transport mechanisms of the reverse leakage current in the UV light-emitting diodes （380nm） are investi- gated by the temperature-dependent current-voltage measurement first. Three possible transport mechanisms, the space-limited-charge conduction, the variable-range hopping and the Poole-Frenkel emission, are proposed to explain the transport process of the reverse leakage current above 295 K, respectively. With the in-depth investigation, the former two transport mechanisms are excluded. It is found that the experimental data agree well with the Poole Frenkel emission model. Furthermore, the activation energies of the traps that cause the reverse leakage current are extracted, which are 0.05eV, 0.09eV, and 0.11 eV, respectively. This indicates that at least three types of trap states are located below the bottom of the conduction band in the depletion region of the UV LEDs.展开更多
A novel planar vertical double-diffused metal-oxide-semiconductor （VDMOS） structure with an ultra-low specific on-resistance （Ron,sp）, whose distinctive feature is the use of inhomogeneous floating p-islands in th...A novel planar vertical double-diffused metal-oxide-semiconductor （VDMOS） structure with an ultra-low specific on-resistance （Ron,sp）, whose distinctive feature is the use of inhomogeneous floating p-islands in the n-drift region, is proposed. The theoretical limit of its Ron,sp is deduced, the influence of structure parameters on the breakdown voltage （BV） and Ron,sp are investigated, and the optimized results with BV of 83 V and Ron,sp of 54 mΩ.mm2 are obtained. Simulations show that the inhomogeneous-floating-islands metal-oxide-semiconductor field-effect transistor （MOSFET） has a superior ＂Ron,sp/BV＂ trade-off to the conventional VDMOS （a 38% reduction of Ron,sp with the same BV） and the homogeneous-floating-islands MOSFET （a 10% reduction of Ron,sp with the same BV）. The inhomogeneous-floatingislands MOSFET also has a much better body-diode characteristic than the superjunction MOSFET. Its reverse recovery peak current, reverse recovery time and reverse recovery charge are about 50, 80 and 40% of those of the superjunction MOSFET, respectively.展开更多
In the reversely switched dynistor(RSD)-based pulse power circuits,a magnetic switch is usually necessary to be applied together with a main switch.It occupies space and needs a magnetic reset.In this paper,a method o...In the reversely switched dynistor(RSD)-based pulse power circuits,a magnetic switch is usually necessary to be applied together with a main switch.It occupies space and needs a magnetic reset.In this paper,a method of designing a RSD-based pulse circuit without a magnetic switch is proposed.In the pulse circuit,a RBDT(reverse blocking diode thyristor)is used to separate the two capacitors and provide an energy branch.The pre-charge time of the RSD can be guaranteed by the energy conversion between the capacitors and inductors,instead of the saturation of the magnetic switch.In addition,the energy which is reused to trigger the RSD is based on an inductor.The pulse circuit is evaluated by simulations and practical experiments.According to the experimental results,the factors affecting the load pulse current and triggering of the RSD and RBDT are studied.Meanwhile,a method to reduce the current in the trigger switch,which is a potential problem in the pulse circuit,is proposed.展开更多
Using p~＋-type crystalline Si with n~＋-type nanocrystalline Si（nc-Si） and n~＋-type crystalline Si with p~＋-type nc-Si mosaic structures as electrodes,a type of power diode was prepared with epitaxial technique a...Using p~＋-type crystalline Si with n~＋-type nanocrystalline Si（nc-Si） and n~＋-type crystalline Si with p~＋-type nc-Si mosaic structures as electrodes,a type of power diode was prepared with epitaxial technique and plasmaenhanced chemical vapor deposition（PECVD） method.Firstly,the basic p~＋-n^--n~＋-type Si diode was fabricated by epitaxially growing p~＋- and n~＋-type layers on two sides of a lightly doped n^--type Si wafer respectively.Secondly,heavily phosphorus-doped Si film was deposited with PECVD on the lithography mask etched p~＋-type Si side of the basic device to form a component with mosaic anode.Thirdly,heavily boron-doped Si film was deposited on the etched n~＋-type Si side of the second device to form a diode with mosaic anode and mosaic cathode.The images of high resolution transmission electronic microscope and patterns of X-ray diffraction reveal nanocrystallization in the phosphorus- and boron-deposited films.Electrical measurements such as capacitancevoltage relation,current-voltage feature and reverse recovery waveform were carried out to clarify the performance of prepared devices.The important roles of（n^-）Si/（p~＋）nc-Si and（n^-）Si/（n~＋）nc-Si junctions in the static and dynamic conduction processes in operating diodes were investigated.The performance of mosaic devices was compared to that of a basic one.展开更多
基金Supported by the National Natural Science Foundation of China under Grant Nos 61334002,61474091,61404097,61574110and 61574112the 111 Project of China under Grant No B12026the Scientific Research Foundation for the Returned Overseas Chinese Scholars of State Education Ministry of China under Grant No JY0600132501
文摘The transport mechanisms of the reverse leakage current in the UV light-emitting diodes （380nm） are investi- gated by the temperature-dependent current-voltage measurement first. Three possible transport mechanisms, the space-limited-charge conduction, the variable-range hopping and the Poole-Frenkel emission, are proposed to explain the transport process of the reverse leakage current above 295 K, respectively. With the in-depth investigation, the former two transport mechanisms are excluded. It is found that the experimental data agree well with the Poole Frenkel emission model. Furthermore, the activation energies of the traps that cause the reverse leakage current are extracted, which are 0.05eV, 0.09eV, and 0.11 eV, respectively. This indicates that at least three types of trap states are located below the bottom of the conduction band in the depletion region of the UV LEDs.
基金Project supported by the National Key Scientific and Technological Project (Grant No. 2011ZX02503-005)the Fundamental Research Funds for the Central Universities (Grant No. ZYGX2010J038)
文摘A novel planar vertical double-diffused metal-oxide-semiconductor （VDMOS） structure with an ultra-low specific on-resistance （Ron,sp）, whose distinctive feature is the use of inhomogeneous floating p-islands in the n-drift region, is proposed. The theoretical limit of its Ron,sp is deduced, the influence of structure parameters on the breakdown voltage （BV） and Ron,sp are investigated, and the optimized results with BV of 83 V and Ron,sp of 54 mΩ.mm2 are obtained. Simulations show that the inhomogeneous-floating-islands metal-oxide-semiconductor field-effect transistor （MOSFET） has a superior ＂Ron,sp/BV＂ trade-off to the conventional VDMOS （a 38% reduction of Ron,sp with the same BV） and the homogeneous-floating-islands MOSFET （a 10% reduction of Ron,sp with the same BV）. The inhomogeneous-floatingislands MOSFET also has a much better body-diode characteristic than the superjunction MOSFET. Its reverse recovery peak current, reverse recovery time and reverse recovery charge are about 50, 80 and 40% of those of the superjunction MOSFET, respectively.
基金This work was supported by the National Natural Science Foundation of China(51877092,51377069).
文摘In the reversely switched dynistor(RSD)-based pulse power circuits,a magnetic switch is usually necessary to be applied together with a main switch.It occupies space and needs a magnetic reset.In this paper,a method of designing a RSD-based pulse circuit without a magnetic switch is proposed.In the pulse circuit,a RBDT(reverse blocking diode thyristor)is used to separate the two capacitors and provide an energy branch.The pre-charge time of the RSD can be guaranteed by the energy conversion between the capacitors and inductors,instead of the saturation of the magnetic switch.In addition,the energy which is reused to trigger the RSD is based on an inductor.The pulse circuit is evaluated by simulations and practical experiments.According to the experimental results,the factors affecting the load pulse current and triggering of the RSD and RBDT are studied.Meanwhile,a method to reduce the current in the trigger switch,which is a potential problem in the pulse circuit,is proposed.
基金supported by the National Natural Science Foundation of China(No.61274006)
文摘Using p~＋-type crystalline Si with n~＋-type nanocrystalline Si（nc-Si） and n~＋-type crystalline Si with p~＋-type nc-Si mosaic structures as electrodes,a type of power diode was prepared with epitaxial technique and plasmaenhanced chemical vapor deposition（PECVD） method.Firstly,the basic p~＋-n^--n~＋-type Si diode was fabricated by epitaxially growing p~＋- and n~＋-type layers on two sides of a lightly doped n^--type Si wafer respectively.Secondly,heavily phosphorus-doped Si film was deposited with PECVD on the lithography mask etched p~＋-type Si side of the basic device to form a component with mosaic anode.Thirdly,heavily boron-doped Si film was deposited on the etched n~＋-type Si side of the second device to form a diode with mosaic anode and mosaic cathode.The images of high resolution transmission electronic microscope and patterns of X-ray diffraction reveal nanocrystallization in the phosphorus- and boron-deposited films.Electrical measurements such as capacitancevoltage relation,current-voltage feature and reverse recovery waveform were carried out to clarify the performance of prepared devices.The important roles of（n^-）Si/（p~＋）nc-Si and（n^-）Si/（n~＋）nc-Si junctions in the static and dynamic conduction processes in operating diodes were investigated.The performance of mosaic devices was compared to that of a basic one.
