CONSPECTUS:Organic thin films,with thickness ranging from tens to hundreds of nanometers,are foundational to organic electronic devices.Yet,vertical phase separation during film deposition and postprocessing,along wit...CONSPECTUS:Organic thin films,with thickness ranging from tens to hundreds of nanometers,are foundational to organic electronic devices.Yet,vertical phase separation during film deposition and postprocessing,along with the corresponding variations in crystallinity and photoelectric properties along the film-depth direction,critically influences device performance.Traditional characterization methods,such as crosssectional electron microscopy,neutron reflectivity,or incremental etching coupled with mass spectrometry,suffer from key limitations:sample-destructive analysis,high-cost or inaccessible instrument,or an inability to directly probe depth-dependent optoelectronic behaviors inside the film.These shortcomings hinder the optimal design of highperformance devices.展开更多
基金financially supported by Natural Science Foundation of China(Grant Nos.52273026,51873172,21574103 and 51473132)。
文摘CONSPECTUS:Organic thin films,with thickness ranging from tens to hundreds of nanometers,are foundational to organic electronic devices.Yet,vertical phase separation during film deposition and postprocessing,along with the corresponding variations in crystallinity and photoelectric properties along the film-depth direction,critically influences device performance.Traditional characterization methods,such as crosssectional electron microscopy,neutron reflectivity,or incremental etching coupled with mass spectrometry,suffer from key limitations:sample-destructive analysis,high-cost or inaccessible instrument,or an inability to directly probe depth-dependent optoelectronic behaviors inside the film.These shortcomings hinder the optimal design of highperformance devices.
