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PM IRRAS Studies of Organized Molecular Films at a Gold Electrode Surface
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作者 Zhang-Fei Su Ai-Cheng Chen Jacek Lipkowski 《电化学(中英文)》 北大核心 2025年第6期1-18,共18页
This feature article illustrates the potential of polarization modulation infrared reflection absorption spectroscopy(PM IRRAS)to provide molecular-level information about the structure,orientation and conformation of... This feature article illustrates the potential of polarization modulation infrared reflection absorption spectroscopy(PM IRRAS)to provide molecular-level information about the structure,orientation and conformation of constituents of thin films at electrode surfaces.PM IRRAS relies on the surface selection rules stating that the p-polarized IR beam is enhanced,while the s-polarized beam is attenuated at the metal surface.The difference between p-and s-polarized beams eliminates the background of the solvent and provides IR spectra at a single electrode potential.In contrast,two other popular in situ IR spectroscopic techniques,namely,subtractively normalized interfacial Fourier transform infrared spectroscopy(SNIFTIRS)and surface-enhanced infrared reflection absorption spectroscopy(SEIRAS),provide potential difference spectra to remove the signal from the bulk solution.In this feature article,we provide a brief tutorial on how to run the PM IRRAS experiment and describe the methods used for background elimination first.The application of the PM IRRAS in the biomimetic research is then illustrated by three examples:construction of a tethered bilayer,reconstitution of colicin into a phospholipid bilayer and determination of the orientation of nucleolipids in a monolayer assembled at a gold electrode surface.Finally,the structural changes of graphene oxide during its electrochemical reduction are described to highlight the promising application of PM IRRAS in materials science. 展开更多
关键词 Polarization modulation infrared reflection absorption spectroscopy Biomimetic membranes Graphene oxide reduction
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Research progress of cholesteric liquid crystals with broadband reflection characteristics in application of intelligent optical modulation materials 被引量:3
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作者 张兰英 高延子 +9 位作者 宋平 武晓娟 苑晓 何宝凤 陈兴武 胡望 郭仁炜 丁杭军 肖久梅 杨槐 《Chinese Physics B》 SCIE EI CAS CSCD 2016年第9期13-23,共11页
Cholesteric liquid crystals(CLCs) have recently sparked an enormous amount of interest in the development of soft matter materials due to their unique ability to self-organize into a helical supra-molecular architec... Cholesteric liquid crystals(CLCs) have recently sparked an enormous amount of interest in the development of soft matter materials due to their unique ability to self-organize into a helical supra-molecular architecture and their excellent selective reflection of light based on the Bragg relationship.Nowadays,by the virtue of building the self-organized nanostructures with pitch gradient or non-uniform pitch distribution,extensive work has already been performed to obtain CLC films with a broad reflection band.Based on authors' many years' research experience,this critical review systematically summarizes the physical and optical background of the CLCs with broadband reflection characteristics,methods to obtain broadband reflection of CLCs,as well as the application in the field of intelligent optical modulation materials.Combined with the research status and the advantages in the field,the important basic and applied scientific problems in the research direction are also introduced. 展开更多
关键词 cholesteric liquid crystals soft matter materials broadband reflection characteristics intelligent optical modulation materials
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A WDM-PON with DPSK modulated downstream and OOK modulated upstream signals based on symmetric 10 Gbit/s wavelength reused bidirectional reflective SOA 被引量:2
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作者 Fady I. EI-Nahal 《Optoelectronics Letters》 EI 2017年第1期67-69,共3页
We investigate a wavelength-division-multiplexing passive optical network(WDM-PON) with centralized lightwave and direct detection. The system is demonstrated for symmetric 10 Gbit/s differential phase-shift keying(DP... We investigate a wavelength-division-multiplexing passive optical network(WDM-PON) with centralized lightwave and direct detection. The system is demonstrated for symmetric 10 Gbit/s differential phase-shift keying(DPSK) downstream signals and on-off keying(OOK) upstream signals,respectively. A wavelength reused scheme is employed to carry the upstream data by using a reflective semiconductor optical amplifier(RSOA) as an intensity modulator at the optical network unit(ONU). The constant-intensity property of the DPSK modulation format can keep high extinction ratio(ER) of downstream signal and reduce the crosstalk to the upstream signal. The bit error rate(BER) performance of our scheme shows that the proposed 10 Gbit/s symmetric WDM-PON can achieve error free transmission over 25-km-long fiber transmission with low power penalty. 展开更多
关键词 downstream upstream DPSK symmetric reflective reused modulated bidirectional keying crosstalk
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Photo-Corrosion of CdSe Film Electrode by Electrochemical Modulation Reflectance Spectrum
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作者 单忠强 田建华 +1 位作者 刘义平 田文娟 《Transactions of Tianjin University》 EI CAS 2004年第4期255-258,共4页
The photo-corrosion of electrodeposited polycrystalline CdSe electrode was inhibited effectively by coating a thin layer of the conductive polyaniline (PAN) film. The relation between the performance and internal ba... The photo-corrosion of electrodeposited polycrystalline CdSe electrode was inhibited effectively by coating a thin layer of the conductive polyaniline (PAN) film. The relation between the performance and internal band structure of such film-covered PAN/CdSe electrode was studied by the electrochemical modulation reflectance spectrum (EMRS). EMRS of both CdSe and PAN/CdSe electrodes in K4Fe(CN)6/K3Fe(CN)6 solution exhibited typical France-Keidysh oscillations, by which the values of the energy gap and flat band potential were determined. The EMRS results indicated that the energy band structure of CdSe electrode was not changed after coated with PAN film, so that the photoelectrochemical characteristic of PAN/CdSe electrode was rather similar to that of CdSe electrode. 展开更多
关键词 CdSe electrode polyaniline (PAN)/CdSe electrode photo-corrosion electrochemical modulation reflectance spactrum (EMRS)
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A near-infrared methane detection system using a 1.654 μm wavelength-modulated diode laser 被引量:1
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作者 付洋 刘慧芳 +4 位作者 隋越 李彬 叶玮琳 郑传涛 王一丁 《Optoelectronics Letters》 EI 2016年第2期140-143,共4页
By adopting a distributed feedback laser(DFBL) centered at 1.654 μm, a near-infrared(NIR) methane(CH4) detection system based on tunable diode laser absorption spectroscopy(TDLAS) is experimentally demonstrated. A la... By adopting a distributed feedback laser(DFBL) centered at 1.654 μm, a near-infrared(NIR) methane(CH4) detection system based on tunable diode laser absorption spectroscopy(TDLAS) is experimentally demonstrated. A laser temperature control as well as wavelength modulation module is developed to control the laser's operation temperature. The laser's temperature fluctuation can be limited within the range of-0.02—0.02 °C, and the laser's emitting wavelength varies linearly with the temperature and injection current. An open reflective gas sensing probe is realized to double the absorption optical path length from 0.2 m to 0.4 m. Within the detection range of 0—0.01, gas detection experiments were conducted to derive the relation between harmonic amplitude and gas concentration. Based on the Allan deviation at an integral time of 1 s, the limit of detection(Lo D) is decided to be 2.952×10^(-5) with a path length of 0.4 m, indicating a minimum detectable column density of ~1.2×10^(-5) m. Compared with our previously reported NIR CH_4 detection system, this system exhibits some improvement in both optical and electrical structures, including the analogue temperature controller with less software consumption, simple and reliable open reflective sensing probe. 展开更多
关键词 reflective deviation methane modulated Allan tunable analogue fluctuation decided length
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Microwave Reflectometry on HL-2A Tokamak
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作者 LIU Zetian XIAO Weiwen DING Xuantong CAO Jianyong SHI Zhongbing LI Yingliang LU Jie LUO Cuiwen 《Southwestern Institute of Physics Annual Report》 2005年第1期32-34,共3页
One of the most important electron density diagnostics, microwave reflectometry, has been developed on many large and medium nuclear fusion devices in recent years . Not only the electron density profiles with high te... One of the most important electron density diagnostics, microwave reflectometry, has been developed on many large and medium nuclear fusion devices in recent years . Not only the electron density profiles with high temporal and spatial resolutions, but also the profiles of plasma rotation and turbulence can be obtained with this diagnostic system. 展开更多
关键词 Microwave scanning frequency RF modulation reflection and receiver
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Measurement of the wavelength modulation indices with selective reflection spectroscopy
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作者 肖连团 赵建明 +3 位作者 尹王保 赵延霆 Bernard Journet 贾锁堂 《Chinese Optics Letters》 SCIE EI CAS CSCD 2003年第7期426-428,共3页
The wavelength modulation indices are measured based on harmonic amplitude ratio of 4famp/6famp (4famp and 6famp are the 4- and 6-th harmonic central peak amplitudes correspondingly) with the Doppler-free selective re... The wavelength modulation indices are measured based on harmonic amplitude ratio of 4famp/6famp (4famp and 6famp are the 4- and 6-th harmonic central peak amplitudes correspondingly) with the Doppler-free selective reflection modulation spectroscopy. The experiments for the 6S1/2(F = 4) → 6P3/2(F' = 5) transition of cesium D2 line with 30-MHz linewidth were carried out. The 4f- and 6f-harmonic signals were detected with two digital lock-in amplifiers separately. The maximum error for modulation indices measurement was ±0.1 within the range of m from 3 to 6. The non-linear modulation behaviour of an external cavity diode laser induced by voltage tuning was studied with this method. The method for modulation indices measurement does not require a solid etalon as usual for measuring the wavelength modulation depth and the absorption linewidth correspondingly. 展开更多
关键词 of AS in on with Measurement of the wavelength modulation indices with selective reflection spectroscopy LINE FORM HFS
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