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Beam distribution reconstruction simulation for electron beam probe
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作者 冯永春 毛瑞士 +9 位作者 李朋 康新才 尹炎 刘通 游尧尧 陈玉聪 赵铁成 徐治国 王彦瑜 原有进 《Chinese Physics C》 SCIE CAS CSCD 2017年第7期129-141,共13页
An electron beam probe(EBP) is a detector which makes use of a low-intensity and low-energy electron beam to measure the transverse profile, bunch shape, beam neutralization and beam wake field of an intense beam wi... An electron beam probe(EBP) is a detector which makes use of a low-intensity and low-energy electron beam to measure the transverse profile, bunch shape, beam neutralization and beam wake field of an intense beam with small dimensions. While it can be applied to many aspects, we limit our analysis to beam distribution reconstruction.This kind of detector is almost non-interceptive for all of the beam and does not disturb the machine environment.In this paper, we present the theoretical aspects behind this technique for beam distribution measurement and some simulation results of the detector involved. First, a method to obtain a parallel electron beam is introduced and a simulation code is developed. An EBP as a profile monitor for dense beams is then simulated using the fast scan method for various target beam profiles, including KV distribution, waterbag distribution, parabolic distribution,Gaussian distribution and halo distribution. Profile reconstruction from the deflected electron beam trajectory is implemented and compared with the actual profile, and the expected agreement is achieved. Furthermore, as well as fast scan, a slow scan, i.e. step-by-step scan, is considered, which lowers the requirement for hardware, i.e. Radio Frequency deflector. We calculate the three-dimensional electric field of a Gaussian distribution and simulate the electron motion in this field. In addition, a fast scan along the target beam direction and slow scan across the beam are also presented, and can provide a measurement of longitudinal distribution as well as transverse profile simultaneously. As an example, simulation results for the China Accelerator Driven Sub-critical System(CADS) and High Intensity Heavy Ion Accelerator Facility(HIAF) are given. Finally, a potential system design for an EBP is described. 展开更多
关键词 reconstruction beam distribution electron beam probe simulation
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Steady and oscillatory plasma properties in the near-field plume of a hollow cathode 被引量:1
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作者 张尊 谢侃 +6 位作者 欧阳吉庭 郭宁 秦宇 夏启蒙 白松 吴先明 谷增杰 《Plasma Science and Technology》 SCIE EI CAS CSCD 2018年第2期67-75,共9页
Hollow cathodes serve as electron sources in Hall thrusters,ion thrusters and other electric propulsion systems.One of the vital problems in their application is the cathode erosion.However,the basic erosion mechanism... Hollow cathodes serve as electron sources in Hall thrusters,ion thrusters and other electric propulsion systems.One of the vital problems in their application is the cathode erosion.However,the basic erosion mechanism and the source of high-energy ions cause of erosion are not fully understood.In this paper,both potential measurements and simulation analyses were performed to explain the formation of high-energy ions.A high-speed camera,a single Langmuir probe and a floating emissive probe were used to determine the steady and oscillatory plasma properties in the near-field plume of a hollow cathode.The temporal structure,electron temperature,electron density,and both static and oscillation of plasma potentials of the plume have been obtained by the diagnostics mentioned above.The experimental results show that there exists a potential hill(about 30 V) and also severe potential oscillations in the near-plume region.Moreover,a simple 2 D particle-in-cell model was used to analyze the energy transition between the potential hill and/or its oscillations and the ions.The simulation results show that the energy of ions gained from the static potential background is about 20 e V,but it could reach to 60 e V when the plasma oscillates. 展开更多
关键词 hollow cathode plasma potential oscillation Langmuir probe emissive probe PIC simulation
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