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Finite Series Representation of Rician Shadowed Channel with Integral Fading Parameter and the Associated Exact Performance Analysis
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作者 JIAN Xin ZENG Xiaoping +2 位作者 YU Anning YE Changrong YANG Junyi 《China Communications》 SCIE CSCD 2015年第3期62-70,共9页
With the deployment of small cells and device to device communications in future heterogeneous networks,in many situations we would encounter mobile radio channels with partly blocked line of sight component,which are... With the deployment of small cells and device to device communications in future heterogeneous networks,in many situations we would encounter mobile radio channels with partly blocked line of sight component,which are well modeled by the Rician shadowed(RS) fading channel.In this paper,by the usage of Kummer transformation,a simplified representation of the RS fading channel with integral fading parameter is given.It is a finite series representation involving only exponential function and low order polynomials.This allows engineers not only the closed-form expressions for exact performance analysis over RS fading channel,but also the insights on the system design tactics. 展开更多
关键词 rician shadowed fading channel Kummer transformation outage probability error probability channel capacity co-channel interference
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Stacking fault energy in some single crystals
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作者 Aditya M.Vora 《Journal of Semiconductors》 EI CAS CSCD 2012年第6期1-5,共5页
The stacking fault energy of single crystals has been reported using the peak shift method.Presently studied all single crystals are grown by using a direct vapor transport(DVT) technique in the laboratory.The struc... The stacking fault energy of single crystals has been reported using the peak shift method.Presently studied all single crystals are grown by using a direct vapor transport(DVT) technique in the laboratory.The structural characterizations of these crystals are made by XRD.Considerable variations are shown in deformation (α) and growth(β) probabilities in single crystals due to off-stoichiometry,which possesses the stacking fault in the single crystal. 展开更多
关键词 single crystals X-ray diffrectograms deformation probability growth probability stacking fault
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