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Metacognition in Solving Process of Basic Electric Circuit ProblemmComparison of Metacognitive Characteristics between Non-major and Major Students in Electric Engineering
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作者 Atsuo Murata Yukio Ohta 《Computer Technology and Application》 2013年第8期415-423,共9页
There are learners who cannot solve practical problems in spite of mastering basic scientific knowledge and formula necessary for the solution. One of the reasons might be attributed to the lack in metacognitive abili... There are learners who cannot solve practical problems in spite of mastering basic scientific knowledge and formula necessary for the solution. One of the reasons might be attributed to the lack in metacognitive abilities. The aim of this study was to compare the metacognitive characteristics between non-major and major students in electric engineering and clarify the difference of metacognitive process between these two groups when solving basic problems of electronic circuit. In the experiment, the solving process was compared between non-major and major students in electric engineering using five basic problems. We found that the scores on prediction of result and confidence of own answer differed significantly between non-major and major students, and inferred that the difference of performance was due to the lack in metacognitive ability, especially the plan and the execution abilities. Both prediction of results and confidence of own answer were also found to play a significant role in effective problem solving as important components (subsystems) of metacognition. 展开更多
关键词 METACOGNITION plan execution prediction of result confidence of answer major and non-major in electric engineering.
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Aspect-based sentiment analysis of online peer reviews and prediction of paper acceptance results
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作者 Minghui Meng Ruxue Han +2 位作者 Jiangtao Zhong Haomin Zhou Chengzhi Zhang 《Data Science and Informetrics》 2023年第1期37-64,共28页
Peer reviews of academic articles contain reviewers’ overall impressions and specific comments on the contributed articles,which have a lot of sentimental information.By exploring the fine-grained sentiments in peer ... Peer reviews of academic articles contain reviewers’ overall impressions and specific comments on the contributed articles,which have a lot of sentimental information.By exploring the fine-grained sentiments in peer reviews,we can discover critical aspects of interest to the reviewers.The results can also assist editors and chairmen in making final decisions.However,current research on the aspects of peer reviews is coarse-grained,and mostly focuses on the overall evaluation of the review objects.Therefore,this paper constructs a multi-level fine-grained aspect set of peer reviews for further study.First,this paper uses the multi-level aspect extraction method to extract the aspects from peer reviews of ICLR conference papers.Comparative experiments confirm the validity of the method.Secondly,various Deep Learning models are used to classify aspects’ sentiments automatically,with LCFS-BERT performing best.By calculating the correlation between sentimental scores of the review aspects and the acceptance result of papers,we can find the important aspects affecting acceptance.Finally,this paper predicts acceptance results of papers(accepted/rejected) according to the peer reviews.The optimal acceptance prediction model is XGboost,achieving a Macro_F1 score of 87.43%. 展开更多
关键词 Peer reviews Aspect extraction Sentiment analysis Prediction of paper acceptance results
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Angle-resolved scatterometry combined with deep learning assisted in-situ monitoring of nanowire doping in molecular beam epitaxy process
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作者 Dekun Yang Yunfei Song +5 位作者 Wei Liang Wenze Zhang Wei Shen Chong Shen Kang Liang Sheng Liu 《Microsystems & Nanoengineering》 2025年第5期553-563,共11页
The sub-atomic precision of molecular beam epitaxy(MBE)allows for highly flexible elemental doping in nanowires(NWs).Optimizing doping quality for specific elements requires a comprehensive understanding of the relati... The sub-atomic precision of molecular beam epitaxy(MBE)allows for highly flexible elemental doping in nanowires(NWs).Optimizing doping quality for specific elements requires a comprehensive understanding of the relationship between process parameters and doping concentrations.This necessitates in-situ monitoring of the doping process to define the corresponding process window.However,the reflection high-energy electron diffraction(RHEED)technique,commonly used during MBE growth,has limited sensitivity to atomic arrangement changes caused by doping and is primarily capable of monitoring the structural quality of the sample.To address this limitation,we propose a nanowire doping concentration measurement method based on angle-resolved scatterometry(ARS).This method captures scattering information across the full angular range of NWs,allowing for high-resolution measurement of doping concentration.Using GaN NWs and AlN films doped with Si as a case study,we measured the Si concentration at different doping temperatures.The results demonstrate that the proposed method achieves a doping concentration resolution of 0.01%and 0.06%within the investigated temperature range.Furthermore,we employed deep learning to establish the relationship between angle-resolved reflectivity and nominal doping concentration.The predictive results indicate that the measurement error is maintained below 0.027%.We also validated the robustness of the method across multiple measurement wavelengths and explored the feasibility of using reduced angle reflectance for neural network training.This work paves the way for in-situ monitoring of nanowire doping processes through ARS,significantly enhancing doping control precision in MBE growth. 展开更多
关键词 molecular beam epitaxy mbe allows elemental doping molecular beam epitaxy predictive results angle resolved scatterometry measurement error deep learning situ monitoring
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