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The corner rounding modeling technique in SPICE simulations for deeply scaled MOSFETs
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作者 孙玮 杨大可 《Journal of Semiconductors》 EI CAS CSCD 2013年第11期57-60,共4页
Abstract: This paper presents a novel poly (PC) and active (RX) comer rounding modeling approach to SPICE simulations. A set of specially designed structures was used for measurement data collection. PC and RX co... Abstract: This paper presents a novel poly (PC) and active (RX) comer rounding modeling approach to SPICE simulations. A set of specially designed structures was used for measurement data collection. PC and RX comer rounding equations have been derived based on an assumption that the comer rounding area is a fragment of a circle. The equations were modified to reflect the gouging effect of physical silicon wafers. The modified general equations were implemented in the SPICE model to enable the model to describe the comer rounding effect. The good fittings between the SPICE model simulation results and the silicon data demonstrated in this paper proved that the designed comer rounding model is practical and accurate. Key words: SPICE model; MOSFETs; poly and active; comer rounding; nanometer technology 展开更多
关键词 SPICE model MOSFETS poly and active corner rounding nanometer technology
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