This paper introduces certain innovative algorithms to mask for pixel defects seen in image sensors. Pixel defectivity rates scale with pixel architecture and process nodes. Smaller pixel and process nodes introduce m...This paper introduces certain innovative algorithms to mask for pixel defects seen in image sensors. Pixel defectivity rates scale with pixel architecture and process nodes. Smaller pixel and process nodes introduce more defects in manufacturing. Brief introduction to causes for pixel defectivity at lower pixel nodes is explained. Later in the paper, popular defect correction schemes used in image processing applications are discussed. A new approach for defect correction is presented and evaluated using images captured from an 8M Bayer image sensor. Experimentation for threshold evaluation is done and presented with practical results for better optimization of proposed algorithms. Experimental data shows that proposed defect corrections preserves a lot of edge details and corrects for bright and hot pixels/clusters, which are evaluated using histogram analysis.展开更多
文摘This paper introduces certain innovative algorithms to mask for pixel defects seen in image sensors. Pixel defectivity rates scale with pixel architecture and process nodes. Smaller pixel and process nodes introduce more defects in manufacturing. Brief introduction to causes for pixel defectivity at lower pixel nodes is explained. Later in the paper, popular defect correction schemes used in image processing applications are discussed. A new approach for defect correction is presented and evaluated using images captured from an 8M Bayer image sensor. Experimentation for threshold evaluation is done and presented with practical results for better optimization of proposed algorithms. Experimental data shows that proposed defect corrections preserves a lot of edge details and corrects for bright and hot pixels/clusters, which are evaluated using histogram analysis.
文摘针对现有满瓶检测算法中缺乏聚对苯二甲酸乙二酯(polyethylene terephthalate,PET)瓶防盗环断裂检测算法的问题,提出一种基于轮廓曲率计算和角点检测的防盗环断裂检测算法。首先采用灰度投影法大致定位出瓶盖区域并将瓶盖所在的矩形区域设置为感兴趣区域(ROI),再利用梯度极大值抑制法获取瓶盖边缘点,并根据提出的等腰三角形法和最近点搜索法,拟合边缘点的亚像素坐标并连接瓶盖轮廓。然后利用边缘点的路程距离比(stretch to distance ratio,SDR)来近似表示轮廓曲率,再根据轮廓曲率极大值检测角点,并采用角点匹配法定位支撑环。最后根据支撑环和防盗环之间存在缝隙与否,来判断防盗环是否断裂。该算法检测正确率达到94.75%,可满足生产需要。
