Synchrotron radiation-based micro-Laue technique has showcased great application potentials in materials science study for its unprecedented crystal orientation and lattice strain/stress resolution.Here we report the ...Synchrotron radiation-based micro-Laue technique has showcased great application potentials in materials science study for its unprecedented crystal orientation and lattice strain/stress resolution.Here we report the updated progress in the development of the micro-Laue technique on the X-ray test beamline at Shanghai Synchrotron Radiation Facility.So far,40μm(h)×50μm(v)X-ray beam spot is routinely obtained,with the convergent angle of 0.2 mrad(h)×0.12 mrad(v).Area scans are conducted on a GH3535 Nibased superalloy base metal and weld joint with the same chemical composition.By analyzing the tremendous amount of Laue diffraction patterns using in-house developed software packages,the crystal orientation,elastic strain,and defect distributions are mapped and investigated.Such a successful proof-of-principle study offers first-hand experience on the further optimization of the design and construction of the scanning micro-Laue facility on the superbend beamline with improved spatial resolution and multiple functions for simultaneous chemical fluorescence mapping and in-situ microstructural evolution studies.The micro-Laue diffraction beamline at Shanghai Synchrotron Radiation Facility will provide a versatile and powerful tool for the orientation and strain/stress mapping combined with phase identification with micron-sized spatial resolution.展开更多
基金supported by the National Key Research and Development Program of China (2016YFB0700404)the National Natural Science Foundation of China (91860109,U2032205, 51671154, and 51927801)the support from the International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technologies and the Collaborative Innovation Center of High-End Manufacturing Equipment
文摘Synchrotron radiation-based micro-Laue technique has showcased great application potentials in materials science study for its unprecedented crystal orientation and lattice strain/stress resolution.Here we report the updated progress in the development of the micro-Laue technique on the X-ray test beamline at Shanghai Synchrotron Radiation Facility.So far,40μm(h)×50μm(v)X-ray beam spot is routinely obtained,with the convergent angle of 0.2 mrad(h)×0.12 mrad(v).Area scans are conducted on a GH3535 Nibased superalloy base metal and weld joint with the same chemical composition.By analyzing the tremendous amount of Laue diffraction patterns using in-house developed software packages,the crystal orientation,elastic strain,and defect distributions are mapped and investigated.Such a successful proof-of-principle study offers first-hand experience on the further optimization of the design and construction of the scanning micro-Laue facility on the superbend beamline with improved spatial resolution and multiple functions for simultaneous chemical fluorescence mapping and in-situ microstructural evolution studies.The micro-Laue diffraction beamline at Shanghai Synchrotron Radiation Facility will provide a versatile and powerful tool for the orientation and strain/stress mapping combined with phase identification with micron-sized spatial resolution.
