It is shown that the increase in the current of an asymmetric p-n-junction, caused by perturbation of potential barrier height and increasing recombination current in a strong microwave field, is suppressed by light g...It is shown that the increase in the current of an asymmetric p-n-junction, caused by perturbation of potential barrier height and increasing recombination current in a strong microwave field, is suppressed by light generated photo carriers, leading to the displacement of current-voltage characteristics of p-n-junction into the direction of smaller current values.展开更多
It is shown that the nonideality coefficient m actually depends on the electron temperature Te, and the hole temperature Th. We get more general expression for the nonideality coefficient, taking into account the conc...It is shown that the nonideality coefficient m actually depends on the electron temperature Te, and the hole temperature Th. We get more general expression for the nonideality coefficient, taking into account the concentration of electrons and holes, as well as their temperature, coefficient and diffusion length, the temperature of the phonons, the applied voltage, and the height of the potential barrier.展开更多
For the first time the effect of light on the CVC of strained p-n-junction in a strong microwave field is examined. It is shown that the deformation and the microwave field increase the current through p-n-junction, a...For the first time the effect of light on the CVC of strained p-n-junction in a strong microwave field is examined. It is shown that the deformation and the microwave field increase the current through p-n-junction, and the light decreases it. The mechanism of this phenomenon is explained by the fact that under heating of the charge carriers by microwave field the recombination current arises, and under the action of light the generation current arises which are directed oppositely. And under the influence of the deformation the band gap of the semiconductor will be changed.展开更多
This paper investigates the current-voltage characteristics (CVC) strain of p-n-junction in a strong microwave (MW) field and shows that the deformation increases the current generated in the p-n-junction. We analyze ...This paper investigates the current-voltage characteristics (CVC) strain of p-n-junction in a strong microwave (MW) field and shows that the deformation increases the current generated in the p-n-junction. We analyze the current-voltage characteristics of p-n-junction in which three-dimensional space (I,U,e) gives more complete information than the two-dimensional.展开更多
用中子辐照在 6H- Si C pn结中引入的复合中心和深能级陷阱解释了 Si C pn结辐照后电特性退化的现象 ,并推导了辐照后 Si C pn结理想因子与外加电压的关系 ,给出了 Si C pn结中子辐照电特性退化的模型 ,模拟结果和实验数据的对比说明关...用中子辐照在 6H- Si C pn结中引入的复合中心和深能级陷阱解释了 Si C pn结辐照后电特性退化的现象 ,并推导了辐照后 Si C pn结理想因子与外加电压的关系 ,给出了 Si C pn结中子辐照电特性退化的模型 ,模拟结果和实验数据的对比说明关于 Si C展开更多
室温短波碲镉汞焦平面技术在军事与航天工业上的应用越来越广泛,列阵中探测器的尺寸正不断减小,这使得常规工艺形成的光伏探测器,其有效光敏面面积扩大的问题越来越突出.我们利用激光诱导电流 (LBIC)检测系统测试了室温短波碲镉汞n on ...室温短波碲镉汞焦平面技术在军事与航天工业上的应用越来越广泛,列阵中探测器的尺寸正不断减小,这使得常规工艺形成的光伏探测器,其有效光敏面面积扩大的问题越来越突出.我们利用激光诱导电流 (LBIC)检测系统测试了室温短波碲镉汞n on p芯片的光响应分布,证实了有效光敏面扩大的存在.从实验结果看,结区的侧向扩散收集效应是造成目前常规工艺形成的光伏器件光敏面面积扩大的主要因素.展开更多
文摘It is shown that the increase in the current of an asymmetric p-n-junction, caused by perturbation of potential barrier height and increasing recombination current in a strong microwave field, is suppressed by light generated photo carriers, leading to the displacement of current-voltage characteristics of p-n-junction into the direction of smaller current values.
文摘It is shown that the nonideality coefficient m actually depends on the electron temperature Te, and the hole temperature Th. We get more general expression for the nonideality coefficient, taking into account the concentration of electrons and holes, as well as their temperature, coefficient and diffusion length, the temperature of the phonons, the applied voltage, and the height of the potential barrier.
文摘For the first time the effect of light on the CVC of strained p-n-junction in a strong microwave field is examined. It is shown that the deformation and the microwave field increase the current through p-n-junction, and the light decreases it. The mechanism of this phenomenon is explained by the fact that under heating of the charge carriers by microwave field the recombination current arises, and under the action of light the generation current arises which are directed oppositely. And under the influence of the deformation the band gap of the semiconductor will be changed.
文摘This paper investigates the current-voltage characteristics (CVC) strain of p-n-junction in a strong microwave (MW) field and shows that the deformation increases the current generated in the p-n-junction. We analyze the current-voltage characteristics of p-n-junction in which three-dimensional space (I,U,e) gives more complete information than the two-dimensional.
文摘室温短波碲镉汞焦平面技术在军事与航天工业上的应用越来越广泛,列阵中探测器的尺寸正不断减小,这使得常规工艺形成的光伏探测器,其有效光敏面面积扩大的问题越来越突出.我们利用激光诱导电流 (LBIC)检测系统测试了室温短波碲镉汞n on p芯片的光响应分布,证实了有效光敏面扩大的存在.从实验结果看,结区的侧向扩散收集效应是造成目前常规工艺形成的光伏器件光敏面面积扩大的主要因素.
