Straight bevel gears are widely applied in automotive, aerospace, chemical and many other fields as one of the most common type of gears. Currently, the researches on straight bevel gears have focused on the fields of...Straight bevel gears are widely applied in automotive, aerospace, chemical and many other fields as one of the most common type of gears. Currently, the researches on straight bevel gears have focused on the fields of fatigue, wear, noise and vibration, while little attention is paid to the effect of multiple alignment errors on the gear tooth wear. To study the influence of alignment errors on the gear tooth wear, a simulated model of a straight bevel gear pair is established. Then, the contact pressure on the tooth surface is analyzed under the various alignment errors according to the Archard wear relationship. The main combinations of alignment errors played vital roles on the tooth wear are investigated. The result shows that under the single alignment error, the contact pressure moves to the tooth heel and increases greatly at here when ？P=0.1 or ？G=0.1; when ？E=–0.03, the contact pressure greatly increases at the tooth heel, but it obviously increases at the tooth toe when ？E=0.03; the alignment error ？γ=1 has little effect on the contact pressure on the tooth surface. Moreover, the combination of ？P, ？G, ？E〈0 and ？γ is the most dangerous type among the multiple alignment errors. This research provides valuable guidelines for predicting the tooth wear under various alignment errors.展开更多
Abstract We study the damage probability when M weapons are used against a unitary target. We use the Carleton damage function to model the distribution of damage probability caused by each weapon. The deviation of th...Abstract We study the damage probability when M weapons are used against a unitary target. We use the Carleton damage function to model the distribution of damage probability caused by each weapon. The deviation of the impact point from the aimpoint is attributed to both the dependent error and independent errors. The dependent error is one random variable affecting M weapons the same way while independent errors are associated with individual weapons and are independent of each other. We consider the case where the dependent error is significant, non-negligible relative to independent errors. We first derive an explicit exact solution for the damage probability caused by M weapons for any M. Based on the exact solution, we find the optimal aimpoint distribution of M weapons to maximize the damage probability in several cases where the aimpoint distribution is constrained geometrically with a few free parameters, including uniform distributions around a circle or around an ellipse. Then, we perform unconstrained optimization to obtain the overall optimal aimpoint distribution and the overall maximum damage probability, which is carried out for different values of M, up to 20 weapons. Finally, we derive a phenomenological approximate expression for the damage probability vs. M, the number of weapons, for the parameters studied here.展开更多
In this paper, the effect of imperfect channel state information at the receiver, which is caused by noise and other interference, on the multi-access channel capacity is analysed through a statistical-mechanical appr...In this paper, the effect of imperfect channel state information at the receiver, which is caused by noise and other interference, on the multi-access channel capacity is analysed through a statistical-mechanical approach. Replica analyses focus on analytically studying how the minimum mean square error （MMSE） channel estimation error appears in a multiuser channel capacity formula. And the relevant mathematical expressions are derived. At the same time, numerical simulation results are demonstrated to validate the Replica analyses. The simulation results show how the system parameters, such as channel estimation error, system load and signal-to-noise ratio, affect the channel capacity.展开更多
With the decrease of the device size,soft error induced by various particles becomes a serious problem for advanced CMOS technologies.In this paper,we review the evolution of two main aspects of soft error-SEU and SET...With the decrease of the device size,soft error induced by various particles becomes a serious problem for advanced CMOS technologies.In this paper,we review the evolution of two main aspects of soft error-SEU and SET,including the new mechanisms to induced SEUs,the advances of the MCUs and some newly observed phenomena of the SETs.The mechanisms and the trends with downscaling of these issues are briefly discussed.We also review the hardening strategies for different types of soft errors from different perspective and present the challenges in testing,modeling and hardening assurance of soft error issues we have to address in the future.展开更多
基金Supported by National Natural Science Foundation of China(Grant No.51105287)Innovative Research Team Development Program of Ministry of Education of China(Grant No.IRT13087)
文摘Straight bevel gears are widely applied in automotive, aerospace, chemical and many other fields as one of the most common type of gears. Currently, the researches on straight bevel gears have focused on the fields of fatigue, wear, noise and vibration, while little attention is paid to the effect of multiple alignment errors on the gear tooth wear. To study the influence of alignment errors on the gear tooth wear, a simulated model of a straight bevel gear pair is established. Then, the contact pressure on the tooth surface is analyzed under the various alignment errors according to the Archard wear relationship. The main combinations of alignment errors played vital roles on the tooth wear are investigated. The result shows that under the single alignment error, the contact pressure moves to the tooth heel and increases greatly at here when ？P=0.1 or ？G=0.1; when ？E=–0.03, the contact pressure greatly increases at the tooth heel, but it obviously increases at the tooth toe when ？E=0.03; the alignment error ？γ=1 has little effect on the contact pressure on the tooth surface. Moreover, the combination of ？P, ？G, ？E〈0 and ？γ is the most dangerous type among the multiple alignment errors. This research provides valuable guidelines for predicting the tooth wear under various alignment errors.
文摘Abstract We study the damage probability when M weapons are used against a unitary target. We use the Carleton damage function to model the distribution of damage probability caused by each weapon. The deviation of the impact point from the aimpoint is attributed to both the dependent error and independent errors. The dependent error is one random variable affecting M weapons the same way while independent errors are associated with individual weapons and are independent of each other. We consider the case where the dependent error is significant, non-negligible relative to independent errors. We first derive an explicit exact solution for the damage probability caused by M weapons for any M. Based on the exact solution, we find the optimal aimpoint distribution of M weapons to maximize the damage probability in several cases where the aimpoint distribution is constrained geometrically with a few free parameters, including uniform distributions around a circle or around an ellipse. Then, we perform unconstrained optimization to obtain the overall optimal aimpoint distribution and the overall maximum damage probability, which is carried out for different values of M, up to 20 weapons. Finally, we derive a phenomenological approximate expression for the damage probability vs. M, the number of weapons, for the parameters studied here.
基金Project supported by the National Nature Science Foundation of China (Grant Nos 60773085 and 60801051)
文摘In this paper, the effect of imperfect channel state information at the receiver, which is caused by noise and other interference, on the multi-access channel capacity is analysed through a statistical-mechanical approach. Replica analyses focus on analytically studying how the minimum mean square error （MMSE） channel estimation error appears in a multiuser channel capacity formula. And the relevant mathematical expressions are derived. At the same time, numerical simulation results are demonstrated to validate the Replica analyses. The simulation results show how the system parameters, such as channel estimation error, system load and signal-to-noise ratio, affect the channel capacity.
基金supported by the National Natural Science Foundation of China(Grant No.11175138)the Specialized Research Fund for the Doctoral Program of Higher Education of China(Grant No.20100201110018)+1 种基金the Key Program of the National Natural Science Foundation of China(Grant No.11235008)the State Key Laboratory Program(Grant No.20140134)
文摘With the decrease of the device size,soft error induced by various particles becomes a serious problem for advanced CMOS technologies.In this paper,we review the evolution of two main aspects of soft error-SEU and SET,including the new mechanisms to induced SEUs,the advances of the MCUs and some newly observed phenomena of the SETs.The mechanisms and the trends with downscaling of these issues are briefly discussed.We also review the hardening strategies for different types of soft errors from different perspective and present the challenges in testing,modeling and hardening assurance of soft error issues we have to address in the future.
