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Effects of modulation layer thickness on microstructures and mechanical behavior of VN/TiN−Ni nano-multilayered films
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作者 Wen-jie CHENG Ping LIU +4 位作者 Xin-fa ZHU Yi MENG Hong-mei LU Peter K.LIAW Wei LI 《Transactions of Nonferrous Metals Society of China》 2026年第2期586-599,共14页
The dependence of interface structure and mechanical properties on the modulation layer thickness of VN/TiN−Ni nano-multilayered films deposited on Si substrates using a reactive magnetron sputtering technique was sys... The dependence of interface structure and mechanical properties on the modulation layer thickness of VN/TiN−Ni nano-multilayered films deposited on Si substrates using a reactive magnetron sputtering technique was systematically investigated. The films were characterized using X-ray diffraction, scanning electron microscopy, X-ray photoelectron spectroscopy, transmission electron microscopy, and nanoindentation. The results show that the TiN−Ni layer grows epitaxially on the VN layer, forming a coherent interface between the two sublayers. When the deposition time ratio of the two sublayers (TTiN−Ni꞉TVN) is 10꞉12, the films exhibit remarkable mechanical properties, with hardness, elastic modulus, and fracture toughness values of 25.9 GPa, 317 GPa, and 1.88 MPa·m^(1/2), respectively. Meanwhile, fracture toughness is improved by approximately 50% compared to the VN monolithic film. This enhancement is attributed to the coherent interface between the sublayers and the phase separation in the TiN−Ni layer. 展开更多
关键词 nano-multilayered film modulation-layer thickness phase separation strengthening fracture toughness
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