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Close-to-atom scale precision measurement and manufacturing via near-field optics
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作者 Peng-Yi Feng Benfeng Bai Hong-Bo Sun 《Science Bulletin》 2026年第1期9-12,共4页
The pursuit of high speed,large capacity,and low power consumption of electronic and photonic systems drives the long-term tendency of device miniaturization.The gate width in typical transistors has been reduced to s... The pursuit of high speed,large capacity,and low power consumption of electronic and photonic systems drives the long-term tendency of device miniaturization.The gate width in typical transistors has been reduced to several nanometers in 7 to 2 nm photolithographic processes,while nano-electronic devices from two-dimensional(2D)materials possess even smaller critical dimensions. 展开更多
关键词 large capacity device miniaturization electronic photonic systems close atom scale high speed near field optics device miniaturizationthe precision measurement
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