In our Lett er, we selec ted several commercial optical t ransceivers, which consist of single-channel transceiver modules, parallel transmitting and receiving modules, and Ethernet passive optical network (EPON) opti...In our Lett er, we selec ted several commercial optical t ransceivers, which consist of single-channel transceiver modules, parallel transmitting and receiving modules, and Ethernet passive optical network (EPON) optical linet erminal (OLT) and optical net work unit (ONU) modules, to do the total ionizing dose (TID) testing via the gamma-ray radiation method. The changing of current and receiver sensitivity of optical transceivers is discussed and analyzed. Based on the TID testing exposed to a TID of 50 krad (Si) at a dose rate of about 0.1 rad (Si)/s, the performance of single-channel transceivers and parallel receiving modules has not changed after 50 krad (Si) exposure, the parallel transmitting and EPON ONU modules have not worked after 40 krad (Si) and 47 krad (Si) exposure, the EPON OLT module has bit error in the process of irradiation, and it can work well after annealing;the reason for the error of OLT is analyzed. Finally, based on the theoretical analysis and testing results, this Letter provides several design suggestions to improve the reliability for optical transceivers, which can be referenced by satellite system designation for various space missions.展开更多
基金funded by the National Natural Science Foundation of China(No.61701484)the Research Fund of the Manned Space Engineering(No.18022010301)the Open Fund of State Key Laboratory of Information Photonics and Optical Communications(BUPT)
文摘In our Lett er, we selec ted several commercial optical t ransceivers, which consist of single-channel transceiver modules, parallel transmitting and receiving modules, and Ethernet passive optical network (EPON) optical linet erminal (OLT) and optical net work unit (ONU) modules, to do the total ionizing dose (TID) testing via the gamma-ray radiation method. The changing of current and receiver sensitivity of optical transceivers is discussed and analyzed. Based on the TID testing exposed to a TID of 50 krad (Si) at a dose rate of about 0.1 rad (Si)/s, the performance of single-channel transceivers and parallel receiving modules has not changed after 50 krad (Si) exposure, the parallel transmitting and EPON ONU modules have not worked after 40 krad (Si) and 47 krad (Si) exposure, the EPON OLT module has bit error in the process of irradiation, and it can work well after annealing;the reason for the error of OLT is analyzed. Finally, based on the theoretical analysis and testing results, this Letter provides several design suggestions to improve the reliability for optical transceivers, which can be referenced by satellite system designation for various space missions.
