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Photo-sensitive characteristics of negative resistance turn-around occurring in SIPTH
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作者 季涛 杨利成 +2 位作者 李海蓉 何山虎 李思渊 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2009年第4期43-46,共4页
Influences of light irradiation on the negative resistance turn-around characteristics of static induction photosensitive thyristor (SIPTH) have been experimentally and theoretically studied. As the gate current of ... Influences of light irradiation on the negative resistance turn-around characteristics of static induction photosensitive thyristor (SIPTH) have been experimentally and theoretically studied. As the gate current of SIPTH is increased by the light irradiation, the potential barrier in the channel is reduced due to the increase in voltage drop across the gate series resistance. Therefore, SIPTH can be quickly switched from the blocking state to the conducting state by relatively low anode voltage. The optimal matching relation for controlling anode conducting voltage of SIPTH by light irradiation has also been represented. 展开更多
关键词 static induction photosensitive thyristors gate series resistance double injection effect potential barrier light-generated carriers
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