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Hole-doping of mechanically exfoliated graphene by confined hydration layers 被引量:1
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作者 Tjeerd R. J. Bollmann Liubov Yu. Antipina +2 位作者 Matthias Temmen Michael Reichling Pavel B. Sorokin 《Nano Research》 SCIE EI CAS CSCD 2015年第9期3020-3026,共7页
By the use of non-contact atomic force microscopy (NC-AFM) and Kelvin probe force microscopy (KPFM), we measure the local surface potential of mechanically exfoliated graphene on the prototypical insulating hydrop... By the use of non-contact atomic force microscopy (NC-AFM) and Kelvin probe force microscopy (KPFM), we measure the local surface potential of mechanically exfoliated graphene on the prototypical insulating hydrophilic substrate of CAF2(111). Hydration layers confined between the graphene and the CaF2 substrate, resulting from the graphene's preparation under ambient conditions on the hydrophilic substrate surface, are found to electronically modify the graphene as the material's electron density transfers from graphene to the hydration layer. Density functional theory (DFT) calculations predict that the first 2 to 3 water layers adjacent to the graphene hole-dope the graphene by several percent of a unit charge per unit cell. 展开更多
关键词 graphene non-contact ATOMIC forcemicroscopy (NC-AFM KPFM) liquid-solid interfacestructure electronic TRANSPORT innanoscale materials andstructuresgraphene non-contact ATOMIC forcemicroscopy (NC-AFM KPFM) liquid-solid interfacestructure electronic TRANSPORT innanoscale materials andstructures
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