期刊文献+
共找到1篇文章
< 1 >
每页显示 20 50 100
A Test Circuit with Microstrip Filter for Microwave Power Device
1
作者 Luo Weijun Chen Xiaojuan +5 位作者 Liu Guoguo Liu Xinyu Wang Xiaoyan Fang Cebao Guo Lunchun Wang Xiaoliang 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2007年第z1期58-61,共4页
With the principles of microwave circuits and semiconductor device physics,three kinds of microwave power device test circuits are designed and simulated,whose properties are evaluated by a parameter network analyzer ... With the principles of microwave circuits and semiconductor device physics,three kinds of microwave power device test circuits are designed and simulated,whose properties are evaluated by a parameter network analyzer within the frequency range from 3 to 8GHz.The simulated results verify that the test circuit with stepped-impedance filter bias network has a larger bandwidth than that with the radial stub.A microstrip interdigital capacitor is used in the third test circuit to replace the DC block,however,which does not show its advantage during the test frequency band.Based on the simulated results,the stepped-impedance filter test circuit can be used to evaluate microwave power devices in the whole C band,namely from 4 to 8GHz. 展开更多
关键词 FILTER radial stub test circuit stepped-impedance interdigital couple capacitor
在线阅读 下载PDF
上一页 1 下一页 到第
使用帮助 返回顶部