Dielectric degradation typically originates from local defects.The resulting electric field concentration accelerates defect growth.Suppressing field distortion arising from such local weaknesses has long been a major...Dielectric degradation typically originates from local defects.The resulting electric field concentration accelerates defect growth.Suppressing field distortion arising from such local weaknesses has long been a major challenge in electrical insulation.In this work,we incorporated the voltage stabiliser anthrone(ET)into cross-linked polyethylene(XLPE).This design enables fielddriven adaptive migration and charge trapping,thereby dynamically regulating local electric fields.Space charge analysis reveals that ET captures charge and creates a reverse electric field.This process inhibits charge injection and transport,significantly reduces internal field distortion and results in a negative electric field coefficient effect.Notably,at 110 kV/mm the distortion ratio decreases from 118.6%in XLPE to only 0.05%in ET/XLPE,a reduction by more than 2000 times.These findings highlight the critical role of voltage stabilisers in enhancing dielectric reliability.展开更多
基金supported by the National Natural Science Foundation of China(Grant 52037009).
文摘Dielectric degradation typically originates from local defects.The resulting electric field concentration accelerates defect growth.Suppressing field distortion arising from such local weaknesses has long been a major challenge in electrical insulation.In this work,we incorporated the voltage stabiliser anthrone(ET)into cross-linked polyethylene(XLPE).This design enables fielddriven adaptive migration and charge trapping,thereby dynamically regulating local electric fields.Space charge analysis reveals that ET captures charge and creates a reverse electric field.This process inhibits charge injection and transport,significantly reduces internal field distortion and results in a negative electric field coefficient effect.Notably,at 110 kV/mm the distortion ratio decreases from 118.6%in XLPE to only 0.05%in ET/XLPE,a reduction by more than 2000 times.These findings highlight the critical role of voltage stabilisers in enhancing dielectric reliability.
