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Study of quantum well mixing induced by impurity-free vacancy in the primary epitaxial wafers of a 915 nm semiconductor laser 被引量:1
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作者 Tianjiang He Suping Liu +5 位作者 Wei Li Li Zhong Xiaoyu Ma Cong Xiong Nan Lin Zhennuo Wang 《Journal of Semiconductors》 EI CAS CSCD 2023年第10期70-76,共7页
Output power and reliability are the most important characteristic parameters of semiconductor lasers.However,catas-trophic optical damage(COD),which usually occurs on the cavity surface,will seriously damage the furt... Output power and reliability are the most important characteristic parameters of semiconductor lasers.However,catas-trophic optical damage(COD),which usually occurs on the cavity surface,will seriously damage the further improvement of the output power and affect the reliability.To improve the anti-optical disaster ability of the cavity surface,a non-absorption window(NAW)is adopted for the 915 nm InGaAsP/GaAsP single-quantum well semiconductor laser using quantum well mix-ing(QWI)induced by impurity-free vacancy.Both the principle and the process of point defect diffusion are described in detail in this paper.We also studied the effects of annealing temperature,annealing time,and the thickness of SiO_(2) film on the quan-tum well mixing in a semiconductor laser with a primary epitaxial structure,which is distinct from the previous structures.We found that when compared with the complete epitaxial structure,the blue shift of the semiconductor laser with the primary epi-taxial structure is larger under the same conditions.To obtain the appropriate blue shift window,the primary epitaxial struc-ture can use a lower annealing temperature and shorter annealing time.In addition,the process is less expensive.We also pro-vide references for upcoming device fabrication. 展开更多
关键词 catastrophic optical damage primary epitaxial structure impurity-free vacancy disordering quantum well intermixing non-absorption window
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Facile Fabrication of High-performance Polyimide Nanocomposites with in situ Formed“Impurity-free”Dispersants 被引量:2
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作者 jing-jing shen dong-ge zhang +3 位作者 xing liu yu-chang tang 林宇 吴国章 《Chinese Journal of Polymer Science》 SCIE CAS CSCD 2016年第5期532-541,共10页
Polyimide/carbon black(PI/CB) nanocomposite films were fabricated via the direct ball-milling method with poly(amic acid)(PAA), the precursor of PI, as an in situ formed impurity-free dispersant. FTIR and Raman ... Polyimide/carbon black(PI/CB) nanocomposite films were fabricated via the direct ball-milling method with poly(amic acid)(PAA), the precursor of PI, as an in situ formed impurity-free dispersant. FTIR and Raman spectral results reveal that, besides physical adsorption, chemical grafting of PAA chains onto the CB surface occurs during the ball-milling process. Comparative studies show that introduction of various commercial dispersants improves the dispersion of CB. However, the mixtures exhibit poor reproducibility, unstable electrical properties, and decreased tensile strength; these issues may be attributed to interfacial pollution brought about by differences in the chemical structures of the dispersant and the matrix. The impurity-free dispersant is effective not only in ensuring the uniform dispersion of CB particles but also in enhancing filler-matrix interfacial adhesion. High-molecular weight PAA chains are effective reagents for impurity-free modification and can therefore be used to improve the electrical and mechanical properties of the resultant composite. 展开更多
关键词 resultant milling attributed interfacial impurity dispersed Dispersants impurity-free filler chains
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