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Determination of Structure and Polarity of Si C Single Crystal by X-Ray Diffraction Technique 被引量:1
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作者 郑新和 渠波 +2 位作者 王玉田 杨辉 梁骏吾 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2001年第1期35-39,共5页
Structure and polarity of the Si C single crystal have been analyzed with the four- circle X- ray diffraction method by a double- crystal diffractom eter.The hexagonal{ 10 15 } pole figure shows that this Si C sam pl... Structure and polarity of the Si C single crystal have been analyzed with the four- circle X- ray diffraction method by a double- crystal diffractom eter.The hexagonal{ 10 15 } pole figure shows that this Si C sam ple has a6 H modification.The difference between the integrated intensities m easured byω scan in the triple- axis diffraction set- up finds some convincing evidence that the surface is either a Si- terminated face or C- terminated face.The experi- mental ratios of| F( 0 0 0 L) | 2 / | F( 0 0 0 L) | 2 are in good agreem entwith the calculated ones after the dispersion cor- rections to the atomic scattering factors( L=6 ,12 and18,respectively) .Thus,this m easurem ent technique is con- venient for the application of the materials with remarkable surface polarity. 展开更多
关键词 Si C single crystal polarity hexagonal6 H scattering factor
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Maximum Hexagon Packing of K_v F Where F is a Spanning Forest
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作者 Liqun PU Jia FANG Jun MA 《Journal of Mathematical Research with Applications》 CSCD 2012年第2期143-156,共14页
In this paper, we extend the result of packing the complete graph Kv with 6-cycles (hexagons). Mainly, the maximum packing of Kv - F is obtained where the leave is an odd spanning forest.
关键词 6-cycle (Hexagon) LEAVE complete graph FOREST packing.
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