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Multiplicity factor and diffraction geometry factor for single crystal X-ray diffraction analysis and measurement of phase content in cubic GaN/GaAs(001) epilayers
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作者 渠波 冯志宏 +6 位作者 林世鸣 杨辉 韩景仪 郑新和 王玉田 刘世安 梁骏吾 《Science China Mathematics》 SCIE 2001年第4期497-503,共7页
On the basis of integrated intensity of rocking curves, the multiplicity factor and the diffraction geometry factor for single crystal X-ray diffraction (XRD) analysis were proposed and a general formula for calculati... On the basis of integrated intensity of rocking curves, the multiplicity factor and the diffraction geometry factor for single crystal X-ray diffraction (XRD) analysis were proposed and a general formula for calculating the content of mixed phases was obtained. With a multifunction four-circle X-ray double-crystal diffractometer, pole figures of cubic (002), 1111 and hexagonal 1010 and reciprocal space mapping were measured to investigate the distributive character of mixed phases and to obtain their multiplicity factors and diffraction geometry factors. The contents of cubic twins and hexagonal inclusions were calculated by the integrated intensities of rocking curves of cubic (002), cubic twin 111, hexagonal 1010 and 1011. 展开更多
关键词 four-circle diffraction GaN phase content
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