FinFET technologies are becoming the mainstream process as technology scales down. Based on a 28-nm bulk p- FinFET device, we have investigated the fin width and height dependence of bipolar amplification for heavy-io...FinFET technologies are becoming the mainstream process as technology scales down. Based on a 28-nm bulk p- FinFET device, we have investigated the fin width and height dependence of bipolar amplification for heavy-ion-irradiated FinFETs by 3D TCAD numerical simulation. Simulation results show that due to a well bipolar conduction mechanism rather than a channel （fin） conduction path, the transistors with narrower fins exhibit a diminished bipolar amplification effect, while the fin height presents a trivial effect on the bipolar amplification and charge collection. The results also indicate that the single event transient （SET） pulse width can be mitigated about 35% at least by optimizing the ratio of fin width and height, which can provide guidance for radiation-hardened applications in bulk FinFET technology.展开更多
基金supported by the National Natural Science of China(Grant No.61376109)
文摘FinFET technologies are becoming the mainstream process as technology scales down. Based on a 28-nm bulk p- FinFET device, we have investigated the fin width and height dependence of bipolar amplification for heavy-ion-irradiated FinFETs by 3D TCAD numerical simulation. Simulation results show that due to a well bipolar conduction mechanism rather than a channel （fin） conduction path, the transistors with narrower fins exhibit a diminished bipolar amplification effect, while the fin height presents a trivial effect on the bipolar amplification and charge collection. The results also indicate that the single event transient （SET） pulse width can be mitigated about 35% at least by optimizing the ratio of fin width and height, which can provide guidance for radiation-hardened applications in bulk FinFET technology.
