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A high performance carrier stored trench bipolar transistor with a field-modified P-base region 被引量:2
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作者 齐跃 汪志刚 +1 位作者 陈万军 张波 《Journal of Semiconductors》 EI CAS CSCD 2013年第4期54-59,共6页
A novel high performance carrier stored trench bipolar transistor (CSTBT) with a field- modified P-base region is proposed. Due to the p-pillars inserted into the drift region extending the P-base region to the bott... A novel high performance carrier stored trench bipolar transistor (CSTBT) with a field- modified P-base region is proposed. Due to the p-pillars inserted into the drift region extending the P-base region to the bottom of the trench gate, the electric field around the trench gate is modified, preventing the CSTBT from breakdown in advance caused by a concentration of the electric field at the edge of the trench gate. The p-pillars under the p-well forming the novel P-base region also provide extra paths for hole transportation. Thus, the switching time is also reduced. Simulation results have shown that the blocking voltage (BV) of the novel CSTBT is almost 430 V higher exhibiting avalanche breakdown properties compared with the conventional CSTBT. Moreover, the turn-off time of the novel structure is 0.3μs (17%) shorter than the conventional CSTBT with the same gate length. 展开更多
关键词 field-modified P-base region high breakdown voltage fast switching CSTBT
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