期刊文献+
共找到2篇文章
< 1 >
每页显示 20 50 100
Micro/nano functional structure manufacturing from difficult-to-cut materials by etching and its combined machining strategies: A review
1
作者 Xiaoqiang YAO Tianfeng ZHOU +6 位作者 Xuanzhe YANG Xinbo SU Qian YU Weijia GUO Peng LIU Bin ZHAO Xibin WANG 《Frontiers of Mechanical Engineering》 2025年第5期1-23,共23页
Micro/nano functional structures (MNFSs) have attracted substantial attention because of theiroutstanding performance in optical, tribological, thermal, electronic, and biomedical applications. Despite thedevelopment ... Micro/nano functional structures (MNFSs) have attracted substantial attention because of theiroutstanding performance in optical, tribological, thermal, electronic, and biomedical applications. Despite thedevelopment of various mechanical and non-mechanical machining methods, achieving the high-efficiency, high-precision fabrication of MNFS from difficult-to-cut materials remains a significant technical challenge. This reviewbegins with an introduction to typical artificial MNFSs and their stringent requirements and then provides acomprehensive survey of MNFSs, focusing on etching methods. In particular, plasma etching demonstrates notableadvantages in MNFS fabrication. However, two critical challenges persist: accurately controlling topographicalinformation during pattern transfer in plasma etching and achieving high-quality, uniform patterning masks overlarge areas. These issues are addressed by thoroughly analyzing and summarizing the modeling of plasma etchingand the simulation of feature profiles. Various hybrid etching machining (HEM) strategies, including laser andetching combined machining, cutting and etching combined machining, molding and etching combined machining,and self-assembly and etching combined machining, are categorized and compared in detail to facilitate themanufacturing of complex MNFSs. Finally, this review summarizes current deficiencies and future challenges ofHEM, laying the groundwork for further advancements in MNFS fabrication and intelligent HEM technologies. 展开更多
关键词 micro/nano functional structures hybrid etching machining difficult-to-cut material pattern transfer material removal mechanism
原文传递
Moore icon: an interview with Prof. Hanming Wu – challenges and opportunities in the post‑Moore era
2
作者 Lin Jiang Mengjiao Li Hanming Wu 《Moore and More》 2024年第1期159-162,共4页
Wu Hanming is a distinguished academician at the Chinese Academy of Engineering,renowned for his expertise in microelectronics technology,specifically integrated circuit(IC)manufacturing.He currently serves as the dea... Wu Hanming is a distinguished academician at the Chinese Academy of Engineering,renowned for his expertise in microelectronics technology,specifically integrated circuit(IC)manufacturing.He currently serves as the dean of the College of Integrated Circuits at Zhejiang University.Throughout his career,he has been at the forefront of China’s IC chip industry and has played a pivotal role in the research and development(R&D)of large-scale production process technology for seventhgeneration chips.Notably,his contributions include the successful use of a theoretical model to support the R&D of China’s first large-scale production plasma etching machine. 展开更多
关键词 integrated circuits plasma etching machine MICROELECTRONICS large scale production integrated circuit IC manufacturing post Moore era microelectronics technologyspecifically
在线阅读 下载PDF
上一页 1 下一页 到第
使用帮助 返回顶部