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InP Bulk Crystals Grown from Various Stoichiometric Melt
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作者 Wu Xiang Mao Luhong Sun Niefeng Zhao Zhengping Zhou Xiaolong Sun Tongnian 《Journal of Rare Earths》 SCIE EI CAS CSCD 2006年第z1期100-103,共4页
InP crystal was grown from stoichiometric or non-stoichiometric melt, including P-rich and In-rich condition by the P-injection synthesis LEC method. Owing to the non-stoichiometric condition, there are many pores in ... InP crystal was grown from stoichiometric or non-stoichiometric melt, including P-rich and In-rich condition by the P-injection synthesis LEC method. Owing to the non-stoichiometric condition, there are many pores in the tail of the P-rich ingot. Samples were characterized by high speed photoluminescence mapping and E.P.D. mapping. The perfection (dislocation, stoichiometry and uniformity) of these samples were studied and compared. The PL peak intensity standard deviation of the 4-inch InP wafer is higher. The EPDs around the pores are higher than the other regions. Besides the stress releasing, the pores and the high concentration of dislocations around them are the leading factors causing the inhomogeneity of the wafer. By adjusting the thermal field and ensuring the chemical stoichiometry, InP crystals of larger diameters and better performance can be developed. 展开更多
关键词 INDIUM PHOSPHIDE phosphorus-rich PHOTOLUMINESCENCE mapping etch-pit density
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Defects in La_2CuO_4 and La_(1.86)Sr_(0.14)CuO4 single crystals
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作者 YANGWei JIALiansuo +1 位作者 CHENXiaolong WANGCong 《Rare Metals》 SCIE EI CAS CSCD 2005年第1期71-75,共5页
La2CuO4 and La1.86Sr0.14CuO4 single crystals were obtained by traveling solvent floating zone method. There were five kinds of defects in these single crystals: cracks, inclusions, gas bubbles, unhomogeneous distribut... La2CuO4 and La1.86Sr0.14CuO4 single crystals were obtained by traveling solvent floating zone method. There were five kinds of defects in these single crystals: cracks, inclusions, gas bubbles, unhomogeneous distribution of Sr2+, and substructures. CH3COOH aqueous solution was used to etch these single crystals, and the etch-pit density was calculated. The fort-nation mechanism of these defects was discussed. It is suggested that the good preparation of raw materials and the stringent growth conditions play an important role in growing high quality single crystals. 展开更多
关键词 DEFECTS TSFZ method etch-pit density
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Growth of AgGaS_2 single crystal by descending crucible with rotation method and observation of properties
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作者 ZHAO Beijun, ZHU Shifu, LI Zhenghui, YU Fengliang, ZHU Xinghua & GAO DeyouDepartment of Materials Science, Sichuan University, Chengdu 610064, China 《Chinese Science Bulletin》 SCIE EI CAS 2001年第23期2009-2013,共5页
This note reports a new procedure of polycrystalline synthesis and a new technique of single crystal growth on AgGaS2, i.e. two-zone temperature oscillation vapor transporting and descending crucible with rotation. A ... This note reports a new procedure of polycrystalline synthesis and a new technique of single crystal growth on AgGaS2, i.e. two-zone temperature oscillation vapor transporting and descending crucible with rotation. A single phase dense AgGaS2 polycrystalline ingot was synthesized, and a crack-free AgGaS2 single crystal with 15 mm in diameter and 30 mm in length was grown by the techniques mentioned above. Structure integrity of the crystal was studied by the X-ray diffraction technique. Six order X-ray spectra from the {011} face of the crystal were obtained, and an anomalous phenomenon was observed for the first time that intensity of the higher order diffraction peak is much stronger than that of the lower order diffraction peak. Etch-pits of the crystal were observed by the scanning electron microscopy (SEM). 展开更多
关键词 infrared nonlinear CRYSTAL AGGAS2 polycrystalline syn-thesis CRYSTAL GROWTH X-ray diffraction etch-pits observation.
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