In order to effectively decrease the safety accidents caused by coal miners’human errors,this paper probes into the causality between human errors and life events,coping,psychological stress,psychological function,ph...In order to effectively decrease the safety accidents caused by coal miners’human errors,this paper probes into the causality between human errors and life events,coping,psychological stress,psychological function,physiological function based on life events’vital influence on human errors,establishing causation mechanism model of coal miners’human errors in the perspective of life events by the researching method of structural equation.The research findings show that life events have significantly positive influence on human errors,with a influential effect value of 0.7945 and a influential effect path of‘‘life events—psychological stress—psychological function—physiological function—human errors’’and‘‘life events—psychological stress—physiological function—human errors’’.展开更多
Since 1999, the problem of patient safety has drawn particular attention, becoming a priority in health care. A "medication error"(ME) is any preventable event occurring at any phase of the pharmacotherapy p...Since 1999, the problem of patient safety has drawn particular attention, becoming a priority in health care. A "medication error"(ME) is any preventable event occurring at any phase of the pharmacotherapy process(ordering, transcribing, dispensing, administering, and monitoring) that leads to, or can lead to, harm to the patient. Hence, MEs can involve every professional of the clinical team. MEs range from those with severe consequences to those with little or no impact on the patient. Although a high ME rate has been found in neonatal wards, newborn safety issues have not been adequately studied until now. Healthcare professionals working in neonatal wards are particularly susceptible to committing MEs due to the peculiarities of newborn patients and of the neonatal intensive care unit(NICU) environment. Current neonatal prevention strategies for MEs have been borrowed from adult wards, but many factors such as high costs and organizational barriers have hindered their diffusion. In general, two types of strategies have been proposed: the first strategy consists of identifying human factors that result in errors and redesigning the work in the NICU in order to minimize them; the second one suggests to design and implement effective systems for preventing errors or intercepting them before reaching the patient. In the future, prevention strategies for MEs need to be improved and tailored to the special neonatal population and the NICU environment and, at the same time, every effort will have to be made to support their clinical application.展开更多
In scaled CMOS processes, the single-event effects generate missing output pulses in Delay-Locked Loop (DLL). Due to its effective sequence detection of the missing pulses in the proposed Error Correction Circuit (ECC...In scaled CMOS processes, the single-event effects generate missing output pulses in Delay-Locked Loop (DLL). Due to its effective sequence detection of the missing pulses in the proposed Error Correction Circuit (ECC) and its portability to be applied to any DLL type, the ECC mitigates the impact of single-event effects and completes its operation with less design complexity without any concern about losing the information. The ECC has been implemented in 180 nm CMOS process and measured the accuracy of mitigation on simulations at LETs up to 100 MeV-cm<sup>2</sup>/mg. The robustness and portability of the mitigation technique are validated through the results obtained by implementing proposed ECC in XilinxArtix 7 FPGA.展开更多
目的介绍根本原因分析法(Root Cause Analysis,RCA)在医院质控管理中的应用,探讨住院患者给药错误的最根本原因及防范措施,保障患者用药安全。方法针对1例住院患者甲氨蝶呤给药错误事件,应用RCA手法进行回顾性分析。结果通过一系列的分...目的介绍根本原因分析法(Root Cause Analysis,RCA)在医院质控管理中的应用,探讨住院患者给药错误的最根本原因及防范措施,保障患者用药安全。方法针对1例住院患者甲氨蝶呤给药错误事件,应用RCA手法进行回顾性分析。结果通过一系列的分析找出差错原因并确定了根本原因,制定了与此事件相应的整改措施,对整改效果进行追踪和确认,完善了相关制度,优化了系统,实现了医疗质量的持续改进。结论运用RCA手法处理多流程环节差错较为科学,找出根因并加以整改,有助于提高医院用药质量,降低医疗风险,值得在临床工作中推广。展开更多
To explore the method of identifying nursing-related patient safety events, types, contributing factors and evaluate consequences of these events in hospitals of China, incident report program was established and impl...To explore the method of identifying nursing-related patient safety events, types, contributing factors and evaluate consequences of these events in hospitals of China, incident report program was established and implemented in 15 patient units in two teaching hospitals of China to get the relevant information. Among 2935 hospitalized patients, 141 nursing-related patient safety events were reported by nurses. Theses events were categorized into 15 types. Various factors contributed to the events and the consequence varied from no harm to patient death. Most of the events were pre- ventable. It is concluded that incident reporting can provide more information about patient safety, and establishment of a program of voluntary incident reporting in hospitals of China is not only urgent but also feasible.展开更多
We predict proton single event effect(SEE)error rates for the VATA160 ASIC chip on the Dark Matter Particle Explorer(DAMPE) to evaluate its radiation tolerance.Lacking proton test facilities,we built a Monte Carlo sim...We predict proton single event effect(SEE)error rates for the VATA160 ASIC chip on the Dark Matter Particle Explorer(DAMPE) to evaluate its radiation tolerance.Lacking proton test facilities,we built a Monte Carlo simulation tool named PRESTAGE to calculate the proton SEE cross-sections.PRESTAGE is based on the particle transport toolkit Geant4.It adopts a location-dependent strategy to derive the SEE sensitivity of the device from heavy-ion test data,which have been measured at the HI-13 tandem accelerator of the China Institute of Atomic Energy and the heavy-ion research facility in Lanzhou.The AP-8,SOLPRO,and August 1972 worst-case models are used to predict the average and peak proton fluxes on the DAMPE orbit.Calculation results show that the averaged proton SEE error rate for the VATA160 chip is approximately 2.17×10^(-5)/device/day.Worst-case error rates for the Van Allen belts and solar energetic particle events are 1-3 orders of magnitude higher than the averaged error rate.展开更多
针对基于数据分发服务的分散式组网导航系统(decentralized networked navigation system based on DDS,DDS-DNNS)单定位节点状态估计问题,考虑节点能量约束及传感器增益退化,以Bayes理论为基础,设计了具有随机事件触发机制(stochastic ...针对基于数据分发服务的分散式组网导航系统(decentralized networked navigation system based on DDS,DDS-DNNS)单定位节点状态估计问题,考虑节点能量约束及传感器增益退化,以Bayes理论为基础,设计了具有随机事件触发机制(stochastic event-triggered,SET)的DDS-DNNS最小均方误差状态估计器。其中,SET机制通过比较是否传输测量值对应的后验估计的差异来决定测量值的重要程度。以此为基础,选取Wasserstein距离作为度量来表示后验估计的差异,并利用Wasserstein距离的性质及Bayes定理证明了后验估计是Gaussian的,从而得到了估计器的类Kalman滤波递推形式以及SET机制的显式表达式。证明了估计器的预测误差协方差有界,且上界和下界均收敛,同时,证明了平均信息传输率有界并推导得到了上界和下界的表达式。利用算例仿真演示了如何通过平均信息传输率的上界和下界确定调整矩阵,模拟了SET机制中一阶矩信息和二阶矩信息对SET机制的影响,同时采用比较实验验证了估计器的有效性。展开更多
Medical errors are reported with increased frequency both in Europe and in the United States of America and measures are put in place to deal with the problem. In Greece, more and more patients think that it is likely...Medical errors are reported with increased frequency both in Europe and in the United States of America and measures are put in place to deal with the problem. In Greece, more and more patients think that it is likely to experience a medical error during health care delivery and the organizations they can turn to if this happens are hardly enough and with meagre response. The consequences of medical errors are multiple and complex with significant financial implications. Nowadays there is an urgent need to resolve problems that refer to cost containment in the Greek Health System. Some research findings from the review of 128 compensations awarded by civil courts for the years 2000 to 2009 for medical errors in Greece are quite interesting. The mean compensation amounted to €292,613 representing 35.41% of claimed compensation. Only a small proportion of medical errors gain publicity as the majority of claims get settled out of court, covered by the insurance policy or the hospitals. The burden of the obvious and hidden cost affects not only the patient, his family and the hospital but also the whole of the society. This comes from our estimation that the level of compensation awarded by the civil courts for medical errors is remarkable high. Unfortunately only some estimates of the cost are possible due to the lack of statistical data. The creation of an independent oversight body for the review of medical errors and complaints nationwide as well as the modernization of the hospitals’ monitoring systems is necessary in order to handle the medical error phenomenon. Above all, cooperation and trust between patients, health care professionals, hospital managers, medical boards and the government are essential to get to the root of the problem.展开更多
Single event effects of 1-T structure programmable read-only memory(PROM) devices fabricated with a 130-nm complementary metal oxide semiconductorbased thin/thick gate oxide anti-fuse process were investigated using h...Single event effects of 1-T structure programmable read-only memory(PROM) devices fabricated with a 130-nm complementary metal oxide semiconductorbased thin/thick gate oxide anti-fuse process were investigated using heavy ions and a picosecond pulsed laser. The cross sections of a single event upset(SEU) for radiationhardened PROMs were measured using a linear energy transfer(LET) ranging from 9.2 to 95.6 MeV cm^2mg^(-1).The result indicated that the LET threshold for a dynamic bit upset was ～ 9 MeV cm^2mg^(-1), which was lower than the threshold of ～ 20 MeV cm^2mg^(-1) for an address counter upset owing to the additional triple modular redundancy structure present in the latch. In addition, a slight hard error was observed in the anti-fuse structure when employing209 Bi ions with extremely high LET values(～ 91.6 MeV cm^2mg^(-1)) and large ion fluence(～ 1×10~8 ions cm^(-2)). To identify the detailed sensitive position of a SEU in PROMs, a pulsed laser with a 5-μm beam spot was used to scan the entire surface of the device.This revealed that the upset occurred in the peripheral circuits of the internal power source and I/O pairs rather than in the internal latches and buffers. This was subsequently confirmed by a ^(181)Ta experiment. Based on the experimental data and a rectangular parallelepiped model of the sensitive volume, the space error rates for the used PROMs were calculated using the CRèME-96 prediction tool. The results showed that this type of PROM was suitable for specific space applications, even in the geosynchronous orbit.展开更多
Single event effects(SEEs) induced by radiations become a significant challenge to the reliability for modern electronic systems. To evaluate SEEs susceptibility for microelectronic devices and integrated circuits(ICs...Single event effects(SEEs) induced by radiations become a significant challenge to the reliability for modern electronic systems. To evaluate SEEs susceptibility for microelectronic devices and integrated circuits(ICs), an SEE testing system with flexibility and robustness was developed at Heavy Ion Research Facility in Lanzhou(HIRFL). The system is compatible with various types of microelectronic devices and ICs, and supports plenty of complex and high-speed test schemes and plans for the irradiated devices under test(DUTs). Thanks to the combination of meticulous circuit design and the hardened logic design, the system has additional performances to avoid an overheated situation and irradiations by stray radiations. The system has been tested and verified by experiments for irradiating devices at HIRFL.展开更多
In this paper, a simulation tool named the neutron-induced single event effect predictive platform（NSEEP^2） is proposed to reveal the mechanism of atmospheric neutron-induced single event effect（SEE） in an electro...In this paper, a simulation tool named the neutron-induced single event effect predictive platform（NSEEP^2） is proposed to reveal the mechanism of atmospheric neutron-induced single event effect（SEE） in an electronic device, based on heavy-ion data and Monte-Carlo neutron transport simulation. The detailed metallization architecture and sensitive volume topology of a nanometric static random access memory（SRAM） device can be considered to calculate the real-time soft error rate（RTSER） in the applied environment accurately. The validity of this tool is verified by real-time experimental results. In addition, based on the NSEEP^2, RTSERs of 90 nm–32 nm silicon on insulator（SOI） and bulk SRAM device under various ambient conditions are predicted and analyzed to evaluate the neutron SEE sensitivity and reveal the underlying mechanism. It is found that as the feature size shrinks, the change trends of neutron SEE sensitivity of bulk and SOI technologies are opposite, which can be attributed to the different MBU performances. The RTSER of bulk technology is always 2.8–64 times higher than that of SOI technology, depending on the technology node, solar activity, and flight height.展开更多
Single event upsets(SEUs) induced by heavy ions were observed in 65 nm SRAMs to quantitatively evaluate the applicability and effectiveness of single-bit error correcting code(ECC) utilizing Hamming Code.The results s...Single event upsets(SEUs) induced by heavy ions were observed in 65 nm SRAMs to quantitatively evaluate the applicability and effectiveness of single-bit error correcting code(ECC) utilizing Hamming Code.The results show that the ECC did improve the performance dramatically,with the SEU cross sections of SRAMs with ECC being at the order of 10^(-11) cm^2/bit,two orders of magnitude higher than that without ECC(at the order of 10^(-9) cm^2/bit).Also,ineffectiveness of ECC module,including 1-,2- and 3-bits errors in single word(not Multiple Bit Upsets),was detected.The ECC modules in SRAMs utilizing(12,8) Hamming code would lose work when 2-bits upset accumulates in one codeword.Finally,the probabilities of failure modes involving 1-,2- and 3-bits errors,were calcaulated at 39.39%,37.88%and 22.73%,respectively,which agree well with the experimental results.展开更多
The Artificial Neural Network (ANN) approach has been successfully used in many hydrological studies especially the rainfall-runoff modeling using continuous data. The present study examines its applicability to model...The Artificial Neural Network (ANN) approach has been successfully used in many hydrological studies especially the rainfall-runoff modeling using continuous data. The present study examines its applicability to model the event-based rainfall-runoff process. A case study has been done for Ajay river basin to develop event-based rainfall-runoff model for the basin to simulate the hourly runoff at Sarath gauging site. The results demonstrate that ANN models are able to provide a good representation of an event-based rainfall-runoff process. The two important parameters, when predicting a flood hydrograph, are the magnitude of the peak discharge and the time to peak discharge. The developed ANN models have been able to predict this information with great accuracy. This shows that ANNs can be very efficient in modeling an event-based rainfall-runoff process for determining the peak discharge and time to the peak discharge very accurately. This is important in water resources design and management applications, where peak discharge and time to peak discharge are important input展开更多
基金supported by the National Natural Science Foundation of China (No. 71271206)
文摘In order to effectively decrease the safety accidents caused by coal miners’human errors,this paper probes into the causality between human errors and life events,coping,psychological stress,psychological function,physiological function based on life events’vital influence on human errors,establishing causation mechanism model of coal miners’human errors in the perspective of life events by the researching method of structural equation.The research findings show that life events have significantly positive influence on human errors,with a influential effect value of 0.7945 and a influential effect path of‘‘life events—psychological stress—psychological function—physiological function—human errors’’and‘‘life events—psychological stress—physiological function—human errors’’.
文摘Since 1999, the problem of patient safety has drawn particular attention, becoming a priority in health care. A "medication error"(ME) is any preventable event occurring at any phase of the pharmacotherapy process(ordering, transcribing, dispensing, administering, and monitoring) that leads to, or can lead to, harm to the patient. Hence, MEs can involve every professional of the clinical team. MEs range from those with severe consequences to those with little or no impact on the patient. Although a high ME rate has been found in neonatal wards, newborn safety issues have not been adequately studied until now. Healthcare professionals working in neonatal wards are particularly susceptible to committing MEs due to the peculiarities of newborn patients and of the neonatal intensive care unit(NICU) environment. Current neonatal prevention strategies for MEs have been borrowed from adult wards, but many factors such as high costs and organizational barriers have hindered their diffusion. In general, two types of strategies have been proposed: the first strategy consists of identifying human factors that result in errors and redesigning the work in the NICU in order to minimize them; the second one suggests to design and implement effective systems for preventing errors or intercepting them before reaching the patient. In the future, prevention strategies for MEs need to be improved and tailored to the special neonatal population and the NICU environment and, at the same time, every effort will have to be made to support their clinical application.
文摘In scaled CMOS processes, the single-event effects generate missing output pulses in Delay-Locked Loop (DLL). Due to its effective sequence detection of the missing pulses in the proposed Error Correction Circuit (ECC) and its portability to be applied to any DLL type, the ECC mitigates the impact of single-event effects and completes its operation with less design complexity without any concern about losing the information. The ECC has been implemented in 180 nm CMOS process and measured the accuracy of mitigation on simulations at LETs up to 100 MeV-cm<sup>2</sup>/mg. The robustness and portability of the mitigation technique are validated through the results obtained by implementing proposed ECC in XilinxArtix 7 FPGA.
文摘目的介绍根本原因分析法(Root Cause Analysis,RCA)在医院质控管理中的应用,探讨住院患者给药错误的最根本原因及防范措施,保障患者用药安全。方法针对1例住院患者甲氨蝶呤给药错误事件,应用RCA手法进行回顾性分析。结果通过一系列的分析找出差错原因并确定了根本原因,制定了与此事件相应的整改措施,对整改效果进行追踪和确认,完善了相关制度,优化了系统,实现了医疗质量的持续改进。结论运用RCA手法处理多流程环节差错较为科学,找出根因并加以整改,有助于提高医院用药质量,降低医疗风险,值得在临床工作中推广。
基金supported by a grant from the Bureau of Science and Technology of Hubei Province of China (No.2007AA301B27-7)
文摘To explore the method of identifying nursing-related patient safety events, types, contributing factors and evaluate consequences of these events in hospitals of China, incident report program was established and implemented in 15 patient units in two teaching hospitals of China to get the relevant information. Among 2935 hospitalized patients, 141 nursing-related patient safety events were reported by nurses. Theses events were categorized into 15 types. Various factors contributed to the events and the consequence varied from no harm to patient death. Most of the events were pre- ventable. It is concluded that incident reporting can provide more information about patient safety, and establishment of a program of voluntary incident reporting in hospitals of China is not only urgent but also feasible.
基金supported by the National Natural Science Foundation of China(Nos.11179003,10975164,10805062,and 11005134)
文摘We predict proton single event effect(SEE)error rates for the VATA160 ASIC chip on the Dark Matter Particle Explorer(DAMPE) to evaluate its radiation tolerance.Lacking proton test facilities,we built a Monte Carlo simulation tool named PRESTAGE to calculate the proton SEE cross-sections.PRESTAGE is based on the particle transport toolkit Geant4.It adopts a location-dependent strategy to derive the SEE sensitivity of the device from heavy-ion test data,which have been measured at the HI-13 tandem accelerator of the China Institute of Atomic Energy and the heavy-ion research facility in Lanzhou.The AP-8,SOLPRO,and August 1972 worst-case models are used to predict the average and peak proton fluxes on the DAMPE orbit.Calculation results show that the averaged proton SEE error rate for the VATA160 chip is approximately 2.17×10^(-5)/device/day.Worst-case error rates for the Van Allen belts and solar energetic particle events are 1-3 orders of magnitude higher than the averaged error rate.
文摘针对基于数据分发服务的分散式组网导航系统(decentralized networked navigation system based on DDS,DDS-DNNS)单定位节点状态估计问题,考虑节点能量约束及传感器增益退化,以Bayes理论为基础,设计了具有随机事件触发机制(stochastic event-triggered,SET)的DDS-DNNS最小均方误差状态估计器。其中,SET机制通过比较是否传输测量值对应的后验估计的差异来决定测量值的重要程度。以此为基础,选取Wasserstein距离作为度量来表示后验估计的差异,并利用Wasserstein距离的性质及Bayes定理证明了后验估计是Gaussian的,从而得到了估计器的类Kalman滤波递推形式以及SET机制的显式表达式。证明了估计器的预测误差协方差有界,且上界和下界均收敛,同时,证明了平均信息传输率有界并推导得到了上界和下界的表达式。利用算例仿真演示了如何通过平均信息传输率的上界和下界确定调整矩阵,模拟了SET机制中一阶矩信息和二阶矩信息对SET机制的影响,同时采用比较实验验证了估计器的有效性。
文摘Medical errors are reported with increased frequency both in Europe and in the United States of America and measures are put in place to deal with the problem. In Greece, more and more patients think that it is likely to experience a medical error during health care delivery and the organizations they can turn to if this happens are hardly enough and with meagre response. The consequences of medical errors are multiple and complex with significant financial implications. Nowadays there is an urgent need to resolve problems that refer to cost containment in the Greek Health System. Some research findings from the review of 128 compensations awarded by civil courts for the years 2000 to 2009 for medical errors in Greece are quite interesting. The mean compensation amounted to €292,613 representing 35.41% of claimed compensation. Only a small proportion of medical errors gain publicity as the majority of claims get settled out of court, covered by the insurance policy or the hospitals. The burden of the obvious and hidden cost affects not only the patient, his family and the hospital but also the whole of the society. This comes from our estimation that the level of compensation awarded by the civil courts for medical errors is remarkable high. Unfortunately only some estimates of the cost are possible due to the lack of statistical data. The creation of an independent oversight body for the review of medical errors and complaints nationwide as well as the modernization of the hospitals’ monitoring systems is necessary in order to handle the medical error phenomenon. Above all, cooperation and trust between patients, health care professionals, hospital managers, medical boards and the government are essential to get to the root of the problem.
基金supported by the National Natural Science Foundation of China(Nos.11690041,11805244,and 11675233)the Opening Project of Science and Technology on Reliability Physics and Application Technology of the Electronic Component Laboratory(No.ZHD 201604)
文摘Single event effects of 1-T structure programmable read-only memory(PROM) devices fabricated with a 130-nm complementary metal oxide semiconductorbased thin/thick gate oxide anti-fuse process were investigated using heavy ions and a picosecond pulsed laser. The cross sections of a single event upset(SEU) for radiationhardened PROMs were measured using a linear energy transfer(LET) ranging from 9.2 to 95.6 MeV cm^2mg^(-1).The result indicated that the LET threshold for a dynamic bit upset was ～ 9 MeV cm^2mg^(-1), which was lower than the threshold of ～ 20 MeV cm^2mg^(-1) for an address counter upset owing to the additional triple modular redundancy structure present in the latch. In addition, a slight hard error was observed in the anti-fuse structure when employing209 Bi ions with extremely high LET values(～ 91.6 MeV cm^2mg^(-1)) and large ion fluence(～ 1×10~8 ions cm^(-2)). To identify the detailed sensitive position of a SEU in PROMs, a pulsed laser with a 5-μm beam spot was used to scan the entire surface of the device.This revealed that the upset occurred in the peripheral circuits of the internal power source and I/O pairs rather than in the internal latches and buffers. This was subsequently confirmed by a ^(181)Ta experiment. Based on the experimental data and a rectangular parallelepiped model of the sensitive volume, the space error rates for the used PROMs were calculated using the CRèME-96 prediction tool. The results showed that this type of PROM was suitable for specific space applications, even in the geosynchronous orbit.
基金Supported by the National Natural Science Foundation of China(No.11079045,11179003 and 11305233)the Important Direction Project of the CAS Knowledge Innovation Program(No.KJCX2-YWN27)
文摘Single event effects(SEEs) induced by radiations become a significant challenge to the reliability for modern electronic systems. To evaluate SEEs susceptibility for microelectronic devices and integrated circuits(ICs), an SEE testing system with flexibility and robustness was developed at Heavy Ion Research Facility in Lanzhou(HIRFL). The system is compatible with various types of microelectronic devices and ICs, and supports plenty of complex and high-speed test schemes and plans for the irradiated devices under test(DUTs). Thanks to the combination of meticulous circuit design and the hardened logic design, the system has additional performances to avoid an overheated situation and irradiations by stray radiations. The system has been tested and verified by experiments for irradiating devices at HIRFL.
基金supported by the National Natural Science Foundation of China(Grant No.11505033)the Science and Technology Research Project of Guangdong Province,China(Grant Nos.2015B090901048 and 2017B090901068)the Science and Technology Plan Project of Guangzhou,China(Grant No.201707010186)
文摘In this paper, a simulation tool named the neutron-induced single event effect predictive platform（NSEEP^2） is proposed to reveal the mechanism of atmospheric neutron-induced single event effect（SEE） in an electronic device, based on heavy-ion data and Monte-Carlo neutron transport simulation. The detailed metallization architecture and sensitive volume topology of a nanometric static random access memory（SRAM） device can be considered to calculate the real-time soft error rate（RTSER） in the applied environment accurately. The validity of this tool is verified by real-time experimental results. In addition, based on the NSEEP^2, RTSERs of 90 nm–32 nm silicon on insulator（SOI） and bulk SRAM device under various ambient conditions are predicted and analyzed to evaluate the neutron SEE sensitivity and reveal the underlying mechanism. It is found that as the feature size shrinks, the change trends of neutron SEE sensitivity of bulk and SOI technologies are opposite, which can be attributed to the different MBU performances. The RTSER of bulk technology is always 2.8–64 times higher than that of SOI technology, depending on the technology node, solar activity, and flight height.
基金Supported by the National Natural Science Foundation of China(Nos.11079045 and 11179003)the Important Direction Project of the CAS Knowledge Innovation Program(No.KJCX2-YW-N27)
文摘Single event upsets(SEUs) induced by heavy ions were observed in 65 nm SRAMs to quantitatively evaluate the applicability and effectiveness of single-bit error correcting code(ECC) utilizing Hamming Code.The results show that the ECC did improve the performance dramatically,with the SEU cross sections of SRAMs with ECC being at the order of 10^(-11) cm^2/bit,two orders of magnitude higher than that without ECC(at the order of 10^(-9) cm^2/bit).Also,ineffectiveness of ECC module,including 1-,2- and 3-bits errors in single word(not Multiple Bit Upsets),was detected.The ECC modules in SRAMs utilizing(12,8) Hamming code would lose work when 2-bits upset accumulates in one codeword.Finally,the probabilities of failure modes involving 1-,2- and 3-bits errors,were calcaulated at 39.39%,37.88%and 22.73%,respectively,which agree well with the experimental results.
文摘The Artificial Neural Network (ANN) approach has been successfully used in many hydrological studies especially the rainfall-runoff modeling using continuous data. The present study examines its applicability to model the event-based rainfall-runoff process. A case study has been done for Ajay river basin to develop event-based rainfall-runoff model for the basin to simulate the hourly runoff at Sarath gauging site. The results demonstrate that ANN models are able to provide a good representation of an event-based rainfall-runoff process. The two important parameters, when predicting a flood hydrograph, are the magnitude of the peak discharge and the time to peak discharge. The developed ANN models have been able to predict this information with great accuracy. This shows that ANNs can be very efficient in modeling an event-based rainfall-runoff process for determining the peak discharge and time to the peak discharge very accurately. This is important in water resources design and management applications, where peak discharge and time to peak discharge are important input
