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Identification of Defect Origin and White-Light Emission Tuning of Chalcogenide Quantum Dots Through Pressure Engineering 被引量:1
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作者 Pengfei Lv Zhiwei Ma +2 位作者 Jiajia Ning Guanjun Xiao Bo Zou 《CCS Chemistry》 2025年第1期160-169,共10页
Chalcogenide quantum dots(QDs)are established as promising materials for white-light-emitting applications because of their wide surface defect emission.However,the limited understanding of the origin of defect emissi... Chalcogenide quantum dots(QDs)are established as promising materials for white-light-emitting applications because of their wide surface defect emission.However,the limited understanding of the origin of defect emission poses challenges in attaining efficient white-light emission.Herein,we sought to introduce high pressure to strengthen the interaction between different types of ligands and QDs,as well as enable in situ observation of surface trap passivation that contributes to emission control.Under pressure,both defect emission and band-edge emission in the CdS QDs could be selectively enhanced by more than an order of magnitude through treatment with X-type and Z-type ligands,respectively.Our findings identified that surface hole traps predominantly contributed to defect emission,whereas nonradiative recombination was primarily associated with surface electron traps.Our goal was to service ambient science through high-pressure research.Thus,based on this proposed mechanism,an energy-saving“neutral”white light with a human-eyefriendly color rendering index of 86 was achieved by tuning the defect emission through further elimination of surface Cd sites.This study endowed high pressure as an efficient tool to elucidate the defect origin of chalcogenide QDs under ambient conditions,paving the way for precise control over white-light emission through materials design application in solid-state lighting. 展开更多
关键词 high pressure CdS ligand passivation defect emission white light
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Photoluminescence characteristics of ZnTe bulk crystal and ZnTe epilayer grown on GaAs substrate by MOVPE
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作者 吕海燕 牟奇 +5 位作者 张磊 吕元杰 冀子武 冯志红 徐现刚 郭其新 《Chinese Physics B》 SCIE EI CAS CSCD 2015年第12期346-351,共6页
Excitation power and temperature-dependent photoluminescence(PL) spectra of the ZnTe epilayer grown on(100)Ga As substrate and ZnTe bulk crystal are investigated. The measurement results show that both the structu... Excitation power and temperature-dependent photoluminescence(PL) spectra of the ZnTe epilayer grown on(100)Ga As substrate and ZnTe bulk crystal are investigated. The measurement results show that both the structures are of good structural quality due to their sharp bound excitonic emissions and absence of the deep level structural defect-related emissions. Furthermore, in contrast to the ZnTe bulk crystal, although excitonic emissions for the ZnTe epilayer are somewhat weak, perhaps due to As atoms diffusing from the Ga As substrate into the ZnTe epilayer and/or because of the strain-induced degradation of the crystalline quality of the ZnTe epilayer, neither the donor–acceptor pair(DAP) nor conduction band-acceptor(e–A) emissions are observed in the ZnTe epilayer. This indicates that by further optimizing the growth process it is possible to obtain a high-crystalline quality ZnTe heteroepitaxial layer that is comparable to the ZnTe bulk crystal. 展开更多
关键词 PHOTOLUMINESCENCE ZnTe bulk crystal ZnTe epilayer defect or impurity-related emissions
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