Structured illumination microscopy(SIM)is one of the most widely applied wide field super resolution imaging techniques with high temporal resolution and low phototoxicity.The spatial resolution of SIM is typically li...Structured illumination microscopy(SIM)is one of the most widely applied wide field super resolution imaging techniques with high temporal resolution and low phototoxicity.The spatial resolution of SIM is typically limited to two times of the diffraction limit and the depth of field is small.In this work,we propose and experimentally demonstrate a low cost,easy to implement,novel technique called speckle structured illumination endoscopy(SSIE)to enhance the resolution of a wide field endoscope with large depth of field.Here,speckle patterns are used to excite objects on the sample which is then followed by a blind-SIM algorithm for super resolution image reconstruction.Our approach is insensitive to the 3D morphology of the specimen,or the deformation of illuminations used.It greatly simplifies the experimental setup as there are no calibration protocols and no stringent control of illumination patterns nor focusing optics.We demonstrate that the SSIE can enhance the resolution 2–4.5 times that of a standard white light endoscopic(WLE)system.The SSIE presents a unique route to super resolution in endoscopic imaging at wide field of view and depth of field,which might be beneficial to the practice of clinical endoscopy.展开更多
In superconducting circuit,microwave resonators and capacitors are crucial components,and their quality has a strong impact on circuit performance.Here we develop a novel wet etching process to define these two compon...In superconducting circuit,microwave resonators and capacitors are crucial components,and their quality has a strong impact on circuit performance.Here we develop a novel wet etching process to define these two components using common photoresist developer as etchant.This method reduces subsequent steps and can be completed immediately after development.By measuring the internal quality factor of resonators,we show that it is possible to achieve similar or better performance when compared with samples made by standard etching processes.This easy-to-implement method may boost the yield hence providing an alternative fabrication process for microwave resonators and capacitors.展开更多
基金partially supported by the Gordon and Betty Moore Foundation Grant No.5722
文摘Structured illumination microscopy(SIM)is one of the most widely applied wide field super resolution imaging techniques with high temporal resolution and low phototoxicity.The spatial resolution of SIM is typically limited to two times of the diffraction limit and the depth of field is small.In this work,we propose and experimentally demonstrate a low cost,easy to implement,novel technique called speckle structured illumination endoscopy(SSIE)to enhance the resolution of a wide field endoscope with large depth of field.Here,speckle patterns are used to excite objects on the sample which is then followed by a blind-SIM algorithm for super resolution image reconstruction.Our approach is insensitive to the 3D morphology of the specimen,or the deformation of illuminations used.It greatly simplifies the experimental setup as there are no calibration protocols and no stringent control of illumination patterns nor focusing optics.We demonstrate that the SSIE can enhance the resolution 2–4.5 times that of a standard white light endoscopic(WLE)system.The SSIE presents a unique route to super resolution in endoscopic imaging at wide field of view and depth of field,which might be beneficial to the practice of clinical endoscopy.
基金Project supported by the National Key R&D Program of China(Grant No.2016YFA0301802)the National Natural Science Foundation of China(Grant Nos.61521001 and 11890704)the Key R&D Program of Guangdong Province,China(Grant No.2018B030326001).
文摘In superconducting circuit,microwave resonators and capacitors are crucial components,and their quality has a strong impact on circuit performance.Here we develop a novel wet etching process to define these two components using common photoresist developer as etchant.This method reduces subsequent steps and can be completed immediately after development.By measuring the internal quality factor of resonators,we show that it is possible to achieve similar or better performance when compared with samples made by standard etching processes.This easy-to-implement method may boost the yield hence providing an alternative fabrication process for microwave resonators and capacitors.
