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Quasi-two-dimensional threshold voltage model for junctionless cylindrical surrounding gate metal-oxide-semiconductor field-effect transistor with dual-material gate 被引量:3
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作者 李聪 庄奕琪 +1 位作者 张丽 靳刚 《Chinese Physics B》 SCIE EI CAS CSCD 2014年第1期494-499,共6页
Based on the quasi-two-dimensional (2D) solution of Poisson's equation in two continuous channel regions, an an- alytical threshold voltage model for short-channel junctionless dual-material cylindrical surrounding... Based on the quasi-two-dimensional (2D) solution of Poisson's equation in two continuous channel regions, an an- alytical threshold voltage model for short-channel junctionless dual-material cylindrical surrounding-gate (JLDMCSG) metal-oxide-semiconductor field-effect transistor (MOSFET) is developed. Using the derived model, channel potential dis- tribu6o~, h~riz~atal electrical ~eld distributign, a~d threshold v~ltage roll-off of ~LDMCSG MOSFET are in,instigated. Compared with junctionless single-material CSG (JLSGCSG) MOSFET~ JLDMCSG MOSFET can effectively suppress short-channel effects and simultaneously improve carrier transport efficiency. It is also revealed that threshold voltage roll- off of JLDMCSG can be significantly reduced by adopting both a small oxide thickness and a small silicon channel radius. The model is verified by comparing its calculated results with that obtained from three-dimensional (3D) numerical device simulator ISE. 展开更多
关键词 junctionless device surrounding-gate MOSFET dual-material gate analytical model
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A two-dimensional analytical subthreshold behavior model for junctionless dual-material cylindrical surrounding-gate MOSFETs 被引量:1
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作者 李聪 庄奕琪 +1 位作者 张丽 靳刚 《Chinese Physics B》 SCIE EI CAS CSCD 2014年第3期619-624,共6页
A two-dimensional analytical subthreshold behavior model for junctionless dual-material cylindrical surrounding- gate (JLDMCSG) metal-oxide-semiconductor field-effect transistors (MOSFETs) is proposed. It is deriv... A two-dimensional analytical subthreshold behavior model for junctionless dual-material cylindrical surrounding- gate (JLDMCSG) metal-oxide-semiconductor field-effect transistors (MOSFETs) is proposed. It is derived by solving the two-dimensional Poisson's equation in two continuous cylindrical regions with any simplifying assumption. Using this analytical model, the subthreshold characteristics of JLDMCSG MOSFETs are investigated in terms of channel electro- static potential, horizontal electric field, and subthreshold current. Compared to junctionless single-material cylindrical surrounding-gate MOSFETs, JLDMCSG MOSFETs can effectively suppress short-channel effects and simultaneously im- prove carrier transport efficiency. It is found that the subthreshold current of JLDMCSG MOSFETs can be significantly reduced by adopting both a thin oxide and thin silicon channel. The accuracy of the analytical model is verified by its good agreement with the three-dimensional numerical simulator ISE TCAD. 展开更多
关键词 surrounding-gate MOSFET dual-material gate junctionless transistor analytical model
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A novel dual-material probe for in situ measurement of particle charge densities in gas-solid fluidized beds 被引量:3
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作者 Chuan He Xiaotao T.Bi John R.Grace 《Particuology》 SCIE EI CAS CSCD 2015年第4期20-31,共12页
Particle charge density is vitally important for monitoring electrostatic charges and understanding particle charging behavior in fluidized beds. In this paper, a dual-material probe was tested in a gas-solid fluidize... Particle charge density is vitally important for monitoring electrostatic charges and understanding particle charging behavior in fluidized beds. In this paper, a dual-material probe was tested in a gas-solid fluidized bed for measuring the charge density of fluidized particles. The experiments were conducted in a two-dimensional fluidized bed with both single bubble injection and freely bubbling, at various particle charge densities and superficial gas velocities. Uniformly sized glass beads were used to eliminate complicating factors at this early stage of probe development. Peak currents, extracted from dynamic signals, were decoupled to determine charge densities of bed particles, which were found to be qualitatively and quantitatively consistent with charge densities directly measured by Faraday cup from the freely bubbling fluidized bed. The current signals were also decoupled to estimate bubble rise velocities, which were found to be in reasonable agreement with those obtained directly by analyzing video images. 展开更多
关键词 ELECTROSTATICS Particle charge density dual-material collision probe Signal decoupling Fluidized bed Bubble rise velocity
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Two-dimensional threshold voltage analytical model of DMG strained-silicon-on-insulator MOSFETs
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作者 李劲 刘红侠 +2 位作者 李斌 曹磊 袁博 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2010年第8期78-83,共6页
For the first time,a simple and accurate two-dimensional analytical model for the surface potential variation along the channel in fully depleted dual-material gate strained-Si-on-insulator(DMG SSOI) MOSFETs is deve... For the first time,a simple and accurate two-dimensional analytical model for the surface potential variation along the channel in fully depleted dual-material gate strained-Si-on-insulator(DMG SSOI) MOSFETs is developed.We investigate the improved short channel effect(SCE),hot carrier effect(HCE),drain-induced barrier-lowering(DIBL) and carrier transport efficiency for the novel structure MOSFET.The analytical model takes into account the effects of different metal gate lengths,work functions,the drain bias and Ge mole fraction in the relaxed SiGe buffer.The surface potential in the channel region exhibits a step potential,which can suppress SCE,HCE and DIBL.Also,strained-Si and SOI structure can improve the carrier transport efficiency,with strained-Si being particularly effective.Further, the threshold voltage model correctly predicts a"rollup"in threshold voltage with decreasing channel length ratios or Ge mole fraction in the relaxed SiGe buffer.The validity of the two-dimensional analytical model is verified using numerical simulations. 展开更多
关键词 SOI MOSFETs STRAINED-SI dual-material gate short channel effect hot carrier effect the drain-induced barrier-lowering two-dimensional model
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Two-dimensional subthreshold current model for dualmaterial gate SOI nMOSFETs with single halo
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作者 Suzhen LUAN Hongxia LIU +1 位作者 Renxu JIA Jin WANG 《Frontiers of Electrical and Electronic Engineering in China》 CSCD 2009年第1期98-103,共6页
A two-dimensional(2D)model for the subthreshold current in the dual-material gate(DMG)siliconon-insulator(SOI)MOSFET with a single halo is presented.The model considers single halo doping in the channel near the sourc... A two-dimensional(2D)model for the subthreshold current in the dual-material gate(DMG)siliconon-insulator(SOI)MOSFET with a single halo is presented.The model considers single halo doping in the channel near the source and a dual-material gate to derive the channel potential using the explicit solution of the 2D Poisson’s equation.Together with the conventional driftdiffusion theory,this results in the development of a subthreshold current model for the novel structure.Model verification is carried out using the 2D device simulator ISE.Excellent agreement is obtained between the calculations and the simulated results of the model. 展开更多
关键词 dual-material gate(DMG) silicon-on-insulator(SOI) electron mobility
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