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NEW DARK CURRENT SUPPRESSION CMOS READOUT CIRCUIT WITH NOVEL CDS STRUCTURE FOR LARGE FORMAT QWIP FPA
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作者 ZhangZhi YuanXianghui +1 位作者 HuangYoushu LuGuolin 《Journal of Electronics(China)》 2004年第5期384-391,共8页
A new Dark Current Suppression (DCS) CMOS readout circuits for large format Quantum-Well-Infrared Photo-detector (QWIP) Focal-Plane-Array (FPA) with novel Correlated-Double-Sampling (CDS) structure based on dynamic so... A new Dark Current Suppression (DCS) CMOS readout circuits for large format Quantum-Well-Infrared Photo-detector (QWIP) Focal-Plane-Array (FPA) with novel Correlated-Double-Sampling (CDS) structure based on dynamic source-follower are proposed, which can overcome the drawbacks of the present techniques, such as sensitive to the non-uniformity of the QWIP materials, poor readout noise features, low frame frequency, limited injection efficiency and dynamic range, etc. The dummy is adopted to realize dark current suppression, while the cascode current mirror (with current ratio of 1:10) can increase charge sensitivity and reduce integration time. Through the novel CDS structure, the output waveform is boxcar, and the frame frequency is increased. Simulation results demonstrate that, in high background sense, the proposed DCS circuit can suppress the dark current, achieve good readout performance, such as low power consumption, high charge sensitivity, high resolution, large dynamic range, and insensitive to the non-uniformity of the QWIP materials. 展开更多
关键词 dark current suppression (DCS) Correlated-Double-Sampling (CDS) Quantum-Well-Infrared-Photo-detector(QWIP) Focal-Plane-Array (FPA) Dynamic source-follower Cas-code current mirror Fixed-pattern-noise
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Double-ended passivator enables dark-current-suppressed colloidal quantum dot photodiodes for CMOS-integrated infrared imagers 被引量:2
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作者 Peilin Liu Shuaicheng Lu +13 位作者 Jing Liu Bing Xia Gaoyuan Yang Mo Ke Xuezhi Zhao Junrui Yang Yuxuan Liu Ciyu Ge Guijie Liang Wei Chen Xinzheng Lan Jianbing Zhang Liang Gao Jiang Tang 《InfoMat》 SCIE CSCD 2024年第1期108-122,共15页
Lead sulfide(PbS)colloidal quantum dot(CQD)photodiodes integrated with silicon-based readout integrated circuits(ROICs)offer a promising solution for the next-generation short-wave infrared(SWIR)imaging technology.Des... Lead sulfide(PbS)colloidal quantum dot(CQD)photodiodes integrated with silicon-based readout integrated circuits(ROICs)offer a promising solution for the next-generation short-wave infrared(SWIR)imaging technology.Despite their potential,large-size CQD photodiodes pose a challenge due to high dark currents resulting from surface states on nonpassivated(100)facets and trap states generated by CQD fusion.In this work,we present a novel approach to address this issue by introducing double-ended ligands that supplementally passivate(100)facets of halidecapped large-size CQDs,leading to suppressed bandtail states and reduced defect concentration.Our results demonstrate that the dark current density is highly suppressed by about an order of magnitude to 9.6 nA cm^(2) at -10 mV,which is among the lowest reported for PbS CQD photodiodes.Furthermore,the performance of the photodiodes is exemplary,yielding an external quantum efficiency of 50.8%(which corresponds to a responsivity of 0.532 A W^(-1))and a specific detectivity of 2.5×10^(12) Jones at 1300 nm.By integrating CQD photodiodes with CMOS ROICs,the CQD imager provides high-resolution(640×512)SWIR imaging for infrared penetration and material discrimination. 展开更多
关键词 CMOS integration colloidal quantum dots dark current suppression double-ended passivation infrared imager
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