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Dark conductivity and photoconductivity of amorphous Hg_(0.78)Cd_(0.22)Te thin films 被引量:1
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作者 邱锋 项金钟 +7 位作者 孔金丞 余连杰 孔令德 王光华 李雄军 杨丽丽 李悰 姬荣斌 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2011年第3期26-30,共5页
This paper reports the dark conductivity and photoconductivity of amorphous HgCdTe thin films deposited on an AlOsubstrate by RF magnetron sputtering.It is determined that dark conduction activation energy is 0.417 eV... This paper reports the dark conductivity and photoconductivity of amorphous HgCdTe thin films deposited on an AlOsubstrate by RF magnetron sputtering.It is determined that dark conduction activation energy is 0.417 eV for the as-grown sample.Thermal quenching is absent for the as-grown sample during the testing temperature zone,but the reverse is true for the polycrystalline sample.Photosensitivity shows the maximum at 240 K for amorphous thin films,while it is higher for the as-grown sample than for polycrystalline thin films in the range from 170 to 300 K.The recombination mechanism is the monomolecular recombination process at room temperature,which is different from the low temperature range.Theμτ-product is low in the range of 10-10cm~2/V,which indicates that some defect states exist in the amorphous thin films. 展开更多
关键词 amorphous MCT dark conductivity PHOTOconductivity
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Effects of deposition pressure and plasma power on the growth and properties of boron-doped microcrystalline silicon films
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作者 陈永生 杨仕娥 +5 位作者 汪建华 卢景霄 郜小勇 谷景华 郑文 赵尚丽 《Chinese Physics B》 SCIE EI CAS CSCD 2008年第4期1394-1399,共6页
Using diborane as doping gas, p-doped μc-Si:H layers are deposited by using the plasma enhanced chemical vapour deposition (PECVD) technology. The effects of deposition pressure and plasma power on the growth and ... Using diborane as doping gas, p-doped μc-Si:H layers are deposited by using the plasma enhanced chemical vapour deposition (PECVD) technology. The effects of deposition pressure and plasma power on the growth and the properties of μc-Si:H layers are investigated. The results show that the deposition rate, the electrical and the structural properties are all strongly dependent on deposition pressure and plasma power. Boron-doped μc-Si:H films with a dark conductivity as high as 1.42 Ω^-1·cm^-1 and a crystallinity of above 50% are obtained. With this p-layer, μc-Si:H solar cells are fabricated. In addition, the mechanism for the effects of deposition pressure and plasma power on the growth and the properties of boron-doped μc-Si:H layers is discussed. 展开更多
关键词 boron-doped μc-Si:H films thin film solar cells Raman crystallinity dark conductivity
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Deposition of p-Type Microcrystalline Silicon Film and Its Application in Microcrystalline Silicon Solar Cells 被引量:1
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作者 陈永生 杨仕娥 +5 位作者 汪建华 卢景霄 郜小勇 谷锦华 郑文 赵尚丽 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2008年第11期2130-2135,共6页
Highly conductive boron-doped hydrogenated microcrystalline silicon (μc-Si: H) films and solar cells are pre- pared by plasma enhanced chemical vapour deposition (PECVD). The effects of diborane concentration, t... Highly conductive boron-doped hydrogenated microcrystalline silicon (μc-Si: H) films and solar cells are pre- pared by plasma enhanced chemical vapour deposition (PECVD). The effects of diborane concentration, thickness and substrate temperature on the growth and properties of B-doped layers and the performance of solar cells with high deposited rate i-layers are investigated. With the optimum p-layer deposition parameters, a higher efficiency of 5.5% is obtained with 0.78nm/s deposited i-layers. In addition, the carriers transport mechanism of p-type μc-Si: H films is discussed. 展开更多
关键词 boron-doped μc-Si..H films Raman crystallinity dark conductivity solar cells
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Annealing effect on optical and electronic properties of silicon rich amorphous silicon-carbide films 被引量:1
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作者 Shuxin LI Yunjun RUI +2 位作者 Yunqing CAO Jun XU Kunji CHEN 《Frontiers of Optoelectronics》 2012年第1期107-111,共5页
A series of Si-rich amorphous silicon carbide (a-SiC:H) thin films were deposited in conventional plasma enhanced chemical vapor deposition system with various gas ratio R = [CH4]/[SiH4]. The microstructural, optic... A series of Si-rich amorphous silicon carbide (a-SiC:H) thin films were deposited in conventional plasma enhanced chemical vapor deposition system with various gas ratio R = [CH4]/[SiH4]. The microstructural, optical and electronic properties of as-deposited films were investigated in this study. It was found that optical band gap was linearly proportional to carbon content in the films and it could be controlled in a range of 1.8-2.4 eV by changing the gas ratio, R. Both dark and photo conductivities in room temperature were decreased with the increasing of carbon content in the films, and the photosensitivity reached as high as 104 for the film with the optical band gap of 1.96 eV. The as-deposited samples were subsequently annealed at the temperatures of 900℃ and 1000℃. The formation of nanocrystalline silicon (nc- Si) dots in amorphous silicon carbide (a-SiC) host matrix was shown. The dark conductivity was enhanced by five orders of magnitude after annealing compared with that of as-deposited films. The result of temperature-dependent conductivity suggested that the property of carrier transport was dominated by conduction process between the extended states. Furthermore, room temperature electroluminescence (EL) was achieved from nc-Si/SiC system and the possible mechanism of radiative recombination mechanism was discussed. 展开更多
关键词 amorphous silicon carbide (a-SiC) opticalband gap photo-conductivity dark conductivity electro-luminescence (EL)
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