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Formation of a 40 A DC Current Arc During the Opening of Silver Contacts 被引量:1
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作者 M'hammed ABBAOUI André LEFORT +3 位作者 Erwann CARVOU Damien SALLAIS James Brian Alexander MITCHELL Noureddine BEN JEMAA 《Plasma Science and Technology》 SCIE EI CAS CSCD 2014年第5期471-478,共8页
The erosion of silver contacts due to break arcs with length proportional to time and of variable duration has been measured by weighing the contacts following 5000 openings at a constant current equal to 40 A.The exp... The erosion of silver contacts due to break arcs with length proportional to time and of variable duration has been measured by weighing the contacts following 5000 openings at a constant current equal to 40 A.The experimental results show that,for arc durations shorter than 60 μs,the transfer of metal from the anode to the cathode occurs,but after passing this stage,when the two electrodes are separated by greater distances,each will display erosion.This is the result of the diffusion of material outside the space between the two electrodes.In order to interpret these results,we have applied a classical model of the physical phenomena occurring at the root of the arc.Analysis of the experimental results shows that for an arc duration of less than15 μs,no distinct cathode root is seen to exist,but beyond this,several spots appear gradually on the cathode for arc duration up to 50 μs,after which they merge into a single spot.The comparison between experiment results and theoretical interpretation is reasonable up to 60 μs. 展开更多
关键词 arc root cathode spot anode spot EROSION contacts current density
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On the reverse leakage current of Schottky contacts on free-standing GaN at high reverse biases 被引量:1
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作者 Yong Lei Jing Su +2 位作者 Hong-Yan Wu Cui-Hong Yang Wei-Feng Rao 《Chinese Physics B》 SCIE EI CAS CSCD 2017年第2期403-405,共3页
In this work, a dislocation-related tunneling leakage current model is developed to explain the temperature-dependent reverse current–voltage(I–V –T) characteristics of a Schottky barrier diode fabricated on free... In this work, a dislocation-related tunneling leakage current model is developed to explain the temperature-dependent reverse current–voltage(I–V –T) characteristics of a Schottky barrier diode fabricated on free-standing GaN substrate for reverse-bias voltages up to-150 V. The model suggests that the reverse leakage current is dominated by the direct tunneling of electrons from Schottky contact metal into a continuum of states associated with conductive dislocations in GaN epilayer.A reverse leakage current ideality factor, which originates from the scattering effect at metal/GaN interface, is introduced into the model. Good agreement between the experimental data and the simulated I–V curves is obtained. 展开更多
关键词 homoepitaxial GaN Schottky contact leakage current tunneling dislocations ideality factor
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Distinction between critical current effects and intrinsic anomalies in the point-contact Andreev reflection spectra of unconventional superconductors 被引量:1
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作者 Ge He Zhong-Xu Wei +12 位作者 Jérémy Brisbois Yan-Li Jia Yu-Long Huang Hua-Xue Zhou Shun-Li Ni Alejandro V Silhanek Lei Shan Bei-Yi Zhu Jie Yuan Xiao-Li Dong Fang Zhou Zhong-Xian Zhao Kui Jin 《Chinese Physics B》 SCIE EI CAS CSCD 2018年第4期451-459,共9页
In this work,we discuss the origin of several anomalies present in the point-contact Andreev reflection spectra of(Li1-xFex)OHFeSe,LiTi2O4,and La2-xCexCuO4.While these features are similar to those stemming from int... In this work,we discuss the origin of several anomalies present in the point-contact Andreev reflection spectra of(Li1-xFex)OHFeSe,LiTi2O4,and La2-xCexCuO4.While these features are similar to those stemming from intrinsic superconducting properties,such as Andreev reflection,electron-boson coupling,multigap superconductivity,d-wave and p-wave pairing symmetry,they cannot be accounted for by the modified Blonder–Tinkham–Klapwijk(BTK) model,but require to consider critical current effects arising from the junction geometry.Our results point to the importance of tracking the evolution of the dips and peaks in the differential conductance as a function of the bias voltage,in order to correctly deduce the properties of the superconducting state. 展开更多
关键词 critical current effect point-contact Andreev reflection unconventional superconductor
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Research on Non-Contact Weak Current Detection Technology
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作者 Bo Chen Sai Wu +4 位作者 Rui Wang Changlei Liu Jindong Lu Kui Deng Liang Ge 《Journal of Electromagnetic Analysis and Applications》 2018年第4期67-75,共9页
With the continuous development of industrial technology, the weak current plays an increasingly important role in all fields of life. In order to facilitate the user to carry, the study of contactless weak current me... With the continuous development of industrial technology, the weak current plays an increasingly important role in all fields of life. In order to facilitate the user to carry, the study of contactless weak current measurement technology is also emerging. This article’s design idea is based on two-dimensional reluctance sensor device built non-contact weak current detection system. The system uses the reluctance sensor HMC1002 to collect the current signal and the temperature sensor DS18B20 to compensate the temperature. The signals collected by the reluctance sensor and the temperature sensor are extremely weak. After being amplified by the amplifying circuit, the signal is conducive to subsequent detection and processing. Filter circuit can filter out interference signals to achieve the goal of improving accuracy. After the corresponding algorithm of the microcontroller will convert the signal voltage, easy to read and store, thus designing a non-contact current measurement capable of detecting weak currents and achieving higher accuracy. 展开更多
关键词 WEAK current Reluctance SENSOR NON-contact TEMPERATURE Compensate
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低空穴衬底电流的新型体硅横向绝缘栅双极晶体管
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作者 段宝兴 李玉滢 +2 位作者 唐春萍 任宇壕 杨银堂 《物理学报》 北大核心 2026年第5期331-339,共9页
本文提出一种新型延伸多晶硅栅体硅型横向绝缘栅双极晶体管(extended polysilicon gate bulk silicon LIGBT,EGBS-LIGBT),该器件结构为P型衬底上依次外延N型、P型硅作为N漂移区和P漂移区,相当于将常规SOI(silicon-on-insulator)-LIGBT... 本文提出一种新型延伸多晶硅栅体硅型横向绝缘栅双极晶体管(extended polysilicon gate bulk silicon LIGBT,EGBS-LIGBT),该器件结构为P型衬底上依次外延N型、P型硅作为N漂移区和P漂移区,相当于将常规SOI(silicon-on-insulator)-LIGBT的埋氧层替换成N型硅,其优势在于极大降低成本且能降低空穴衬底电流.在阳极正偏时,P漂移区上方的肖特基型延伸多晶硅栅(Schottky-extended polysilicon gate,S-EG)在P漂移区的内侧表面形成电子反型层,以获得低的正向导通压降(V_(on)).此外,阳极采用肖特基接触降低空穴注入效率,而P漂移区快速的动态电场调制能力还可迅速提取存储在漂移区中的过剩载流子,且其多子为空穴还能促进关断时过剩电子的快速复合,关断能量损耗(E_(off))得以降低.仿真结果表明:EGBS-LIGBT在显著降低空穴衬底电流的同时,改善了E_(off)与V_(on)间的折中关系.该器件的V_(on)为1.59 V、空穴衬底电流为1.9 mA/cm^(2)、E_(off)为0.51 mJ/cm^(2)、击穿电压(BV)达701 V.相较常规LIGBT,该结构在保持V_(on)基本不变的前提下,将空穴衬底电流降至1/105,E_(off)降低69.8%,BV提升19.6%. 展开更多
关键词 横向绝缘栅双极晶体管 空穴衬底电流 关断损耗 肖特基接触
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基于分合闸线圈电流和触头行程融合的断路器异常辨识方法研究
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作者 严子成 张昆 +6 位作者 刘举 毛雕 孙家涵 袁欢 杨爱军 王小华 荣命哲 《全球能源互联网》 北大核心 2026年第1期112-122,共11页
针对断路器机械特性异常诊断中的多源信号采集与分析问题,设计出一套分合闸线圈电流和触头行程信号的采集系统,并提出了相应的异常模拟方案。通过引入分段滤波和循环差分判别进行特征提取,机器学习算法采用CatBoost模型进行单源信号的... 针对断路器机械特性异常诊断中的多源信号采集与分析问题,设计出一套分合闸线圈电流和触头行程信号的采集系统,并提出了相应的异常模拟方案。通过引入分段滤波和循环差分判别进行特征提取,机器学习算法采用CatBoost模型进行单源信号的异常诊断,结合遗传算法(genetic algorithm,GA)进行参数优化,实现了基于线圈电流和触头行程的高准确率诊断。同时,利用线性判别分析(linear discriminant analysis,LDA)方法进行特征融合,提升了异常诊断效果。此外,对多种融合方法的诊断结果进行对比分析。结果表明,LDA-GA-CatBoost的特征级融合方法与基于改进的D-S证据理论(dempster-shafer theory of evidence,DST)的决策级融合方法的异常诊断率最高,均为95.82%,但LDA-GA-CatBoost的模型训练时间仅为改进的D-S证据理论的一半,更具有应用优势。 展开更多
关键词 断路器 异常诊断 线圈电流 触头行程 机器学习 特征级融合
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选择发射极对TOPCon太阳电池性能的影响研究
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作者 章康平 孙亚楠 +3 位作者 李家栋 胥星星 廖东进 黄志平 《太阳能学报》 北大核心 2026年第1期48-54,共7页
重点分析激光功率对发射区掺杂、电池暗饱和电流、接触电阻与电性能的影响。结果表明,当激光功率输出比从73%增至78%时,选择发射区整体掺杂浓度逐渐提高,与轻扩区形成145~150Ω/□方阻差,有效少子寿命、iVoc、接触电阻率等随整体杂质浓... 重点分析激光功率对发射区掺杂、电池暗饱和电流、接触电阻与电性能的影响。结果表明,当激光功率输出比从73%增至78%时,选择发射区整体掺杂浓度逐渐提高,与轻扩区形成145~150Ω/□方阻差,有效少子寿命、iVoc、接触电阻率等随整体杂质浓度的提高明显下降,而暗饱和电流的大小则受表面杂质浓度的影响更大。因而选择发射极的使用,可通过提高光吸收区的方块电阻来降低整体掺杂浓度,从而提高少子寿命和高开路电压。当激光功率输出比为75%时,暗饱和电流密度为17.68 fA/cm^(2),接触电阻率为1.34Ωcm^(2),获得最佳电池性能开路电压为723.79 mV、填充因子为84.58%、转换效率为25.51%。 展开更多
关键词 太阳电池 选择发射极 掺杂浓度 方块电阻 暗饱和电流密度 接触电阻率 电池性能
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电磁冲击对GCr15轴承钢残余奥氏体演变及滚动接触疲劳性能的影响
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作者 李添奇 郭帅 +2 位作者 张剑 王丰 钱东升 《轴承》 北大核心 2026年第1期30-36,共7页
研究了电磁冲击对GCr15轴承钢残余奥氏体演变和滚动接触疲劳性能的影响,结果表明:电磁冲击作用下残余奥氏体的体积分数由13.23%降低至8.3%,残余奥氏体碳的质量分数由0.85%升高至0.91%,残余奥氏体的热激活能由115 kJ/mol提高至127 kJ/mol... 研究了电磁冲击对GCr15轴承钢残余奥氏体演变和滚动接触疲劳性能的影响,结果表明:电磁冲击作用下残余奥氏体的体积分数由13.23%降低至8.3%,残余奥氏体碳的质量分数由0.85%升高至0.91%,残余奥氏体的热激活能由115 kJ/mol提高至127 kJ/mol,表明残余奥氏体热稳定性提升,残余奥氏体转变衰减指数k由2.51降低至2.17,机械稳定性有所提升;电磁冲击使滚动接触疲劳额定寿命L_(10)从0.81×10^(7)次提高至1.72×10^(7)次,这主要是由于电磁冲击使试样表面保留了稳定性更好、韧性更高的残余奥氏体,其会阻碍轴承钢亚表面疲劳裂纹扩展,更难产生表面剥落坑。 展开更多
关键词 滚动轴承 轴承钢 脉冲电流 残余奥氏体 热稳定性 接触疲劳
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城市轨道交通车载靴轨在线检测技术应用研究
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作者 刘洋 焦峰 +3 位作者 刘帆 祁海涛 董滨 白晓宇 《现代城市轨道交通》 2026年第2期88-94,共7页
靴轨受流系统作为城市轨道交通列车获取电力的重要装备,其稳定性和可靠性对于保障列车安全、高效运行至关重要,实时掌控靴轨受流性能与安全状态,可保障列车运营安全。车载靴轨在线检测技术作为评估和维护靴轨受流系统服役状态的重要手段... 靴轨受流系统作为城市轨道交通列车获取电力的重要装备,其稳定性和可靠性对于保障列车安全、高效运行至关重要,实时掌控靴轨受流性能与安全状态,可保障列车运营安全。车载靴轨在线检测技术作为评估和维护靴轨受流系统服役状态的重要手段,近年来得到广泛关注和研究。文章在综述国内外研究现状基础上,总结多种车载靴轨在线检测技术,包括接触轨动态几何参数非接触式高精度检测技术、高速动态工况下靴轨动态受流关键技术、接触轨及附属设施高清成像与智能识别技术、受电电流检测技术、多技术手段融合综合定位技术、靴轨受流质量综合评估技术等。通过对上述关键技术的研究分析,掌握列车在高速、复杂环境下,正线运营过程中的靴轨关系,并进行智能化实时检测,综合诊断靴轨运行状态,为城市轨道交通靴轨系统检修与运维提供决策支撑。 展开更多
关键词 城市轨道交通 靴轨受流系统 非接触式检测 智能识别
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一种非接触式变频电机高频轴电流抑制方法
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作者 段宇 张浩隆 李豪 《电力电子技术》 2026年第3期175-181,共7页
变频电机产生的轴电流易引起轴承电蚀失效,现有抑制方法存在高频抑制效果差、成本高或引发转矩波动等缺陷。本文提出了一种非接触式磁耦合谐振轴电流抑制方法,通过反谐振匹配电路定向衰减轴电流主导模态。该方法基于轴电流与共模电流的... 变频电机产生的轴电流易引起轴承电蚀失效,现有抑制方法存在高频抑制效果差、成本高或引发转矩波动等缺陷。本文提出了一种非接触式磁耦合谐振轴电流抑制方法,通过反谐振匹配电路定向衰减轴电流主导模态。该方法基于轴电流与共模电流的模态相似性,重构系统阻抗特性,无需直接接触电机轴承即可实现抑制。3 kW变频电机实验平台实验结果表明,该方法能有效降低轴电流幅值和放电次数,有效缓解轴承电蚀风险,且不影响电机基本运行特性。 展开更多
关键词 变频电机 轴电流抑制 非接触式
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一起500 kV联络变阻抗保护误动作原因分析及处理
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作者 丁礼芳 朱琳 +3 位作者 丁姣 何开正 何昂 施永辉 《云南水力发电》 2026年第2期97-99,102,共4页
在电力系统中,阻抗保护误动可能引发变压器非计划停运,严重威胁电网运行安全。针对某500 kV变电站倒闸操作期间,因220 kV母线电压切换装置故障导致联络变阻抗保护误动事件,通过录波数据分析及现场试验,分析了故障原因和临时处置措施。... 在电力系统中,阻抗保护误动可能引发变压器非计划停运,严重威胁电网运行安全。针对某500 kV变电站倒闸操作期间,因220 kV母线电压切换装置故障导致联络变阻抗保护误动事件,通过录波数据分析及现场试验,分析了故障原因和临时处置措施。结合理论分析与实际案例,提出了应急处置方案及防范措施,为防范类似保护误动事故提供保障。 展开更多
关键词 阻抗保护 负序电流 电压切换 辅助触点 双位置继电器
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Magnetic vortex gyration mediated by point-contact position 被引量:1
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作者 Hua-Nan Li Zi-Wei Fan +2 位作者 Jia-Xin Li Yue Hu Hui-Lian Liu 《Chinese Physics B》 SCIE EI CAS CSCD 2019年第10期531-534,共4页
Micromagnetic simulation is employed to study the gyration motion of magnetic vortices in distinct permalloy nanodisks driven by a spin-polarized current. The critical current density for magnetic vortex gyration, eig... Micromagnetic simulation is employed to study the gyration motion of magnetic vortices in distinct permalloy nanodisks driven by a spin-polarized current. The critical current density for magnetic vortex gyration, eigenfrequency, trajectory, velocity and the time for a magnetic vortex to obtain the steady gyration are analyzed. Simulation results reveal that the magnetic vortices in larger and thinner nanodisks can achieve a lower-frequency gyration at a lower current density in a shorter time. However, the magnetic vortices in thicker nanodisks need a higher current density and longer time to attain steady gyration but with a higher eigenfrequency. We also find that the point-contact position exerts different influences on these parameters in different nanodisks, which contributes to the control of the magnetic vortex gyration. The conclusions of this paper can serve as a theoretical basis for designing nano-oscillators and microwave frequency modulators. 展开更多
关键词 magnetic VORTEX SPIN-POLARIZED current POINT-contact MICROMAGNETIC simulation
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Direct Current Circuit Breaker in EAST
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作者 宋执权 傅鹏 《Plasma Science and Technology》 SCIE EI CAS CSCD 2006年第4期481-484,共4页
This paper introduces the configuration and the operation principles of a high power direct current circuit breaker (DCCB). The commutating current principle of the breaker is described in details with its theory an... This paper introduces the configuration and the operation principles of a high power direct current circuit breaker (DCCB). The commutating current principle of the breaker is described in details with its theory and simulation analysis. The test results presented show that the DCCB meets the requirements for quenching protection. It will be used as the main breaker for quench protection in EAST. 展开更多
关键词 direct current circuit breaker insulator recovery time commutating current contact
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Electronic properties of the SnSe–metal contacts:First-principles study
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作者 戴宪起 王小龙 +1 位作者 李伟 王天兴 《Chinese Physics B》 SCIE EI CAS CSCD 2015年第11期473-477,共5页
The geometries and electronic properties of SnSe/metal contact have been investigated using first-principles calcula- tion. It is found that the geometries of monolayer SnSe were affected slightly when SnSe adsorbs on... The geometries and electronic properties of SnSe/metal contact have been investigated using first-principles calcula- tion. It is found that the geometries of monolayer SnSe were affected slightly when SnSe adsorbs on M (M = Ag,Au,Ta) substrate. Compared with the corresponding free-standing monolayer SnSe, the adsorbed SnSe undergoes a semiconductor- to-metal transition. The potential difference AV indicates that SnSefra contact is the best candidate for the Schottky contact of the three SnSe/M contacts. Two types of current-in-plane (CIP) structure, where a freestanding monolayer SnSe is con- nected to SnSe/M, are identified as the n-type CIP structure in SnSe/Ag contact and p-type CIP structure in SnSe/Au and SnSe/Ta contact. The results can stimulate further investigation for the multifunctional SnSe/metal contact. 展开更多
关键词 FIRST-PRINCIPLES monolayer SnSe metal-semiconductor contact current-in-plane structure
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Schottky forward current transport mechanisms in AlGaN/GaN HEMTs over a wide temperature range
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作者 武玫 郑大勇 +5 位作者 王媛 陈伟伟 张凯 马晓华 张进成 郝跃 《Chinese Physics B》 SCIE EI CAS CSCD 2014年第9期409-413,共5页
The behavior of Schottky contacts in AlGaN/GaN high electron mobility transistors (HEMTs) is investigated by temperature-dependent current-voltage (T-I-V) measurements from 300 K to 473 K. The ideality factor and ... The behavior of Schottky contacts in AlGaN/GaN high electron mobility transistors (HEMTs) is investigated by temperature-dependent current-voltage (T-I-V) measurements from 300 K to 473 K. The ideality factor and barrier height determined based on the thermionic emission (TE) theory are found to be strong functions of temperature, while present a great deviation from the theoretical value, which can be expounded by the barrier height inhomogeneities. In order to determine the forward current transport mechanisms, the experimental data are analyzed using numerical fitting method, considering the temperature-dependent series resistance. It is observed that the current flow at room temperature can be attributed to the tunneling mechanism, while thermionic emission current gains a growing proportion with an increase in temperature. Finally, the effective barrier height is derived based on the extracted thermionic emission component, and an evaluation of the density of dislocations is made from the I-V characteristics, giving a value of 1.49 × 10^7 cm^-2. 展开更多
关键词 AlGaN/GaN HEMTs Schottky contacts forward current transport mechanism temperature dependence
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Mechanism of Ti/Al/Ni/Au ohmic contacts to AlGaN/GaN heterostructures via laser annealing
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作者 Mingchen Hou Gang Xie Kuang Sheng 《Chinese Physics B》 SCIE EI CAS CSCD 2019年第3期342-346,共5页
The physical mechanisms of Ti/Al/Ni/Au ohmic contacts to AlGaN/GaN heterostructures by laser annealing and rapid thermal annealing are systematically investigated. The microstructures indicate that a better surface mo... The physical mechanisms of Ti/Al/Ni/Au ohmic contacts to AlGaN/GaN heterostructures by laser annealing and rapid thermal annealing are systematically investigated. The microstructures indicate that a better surface morphology and an intact contact interface are formed after laser annealing. None of the TiN alloy spikes are formed at the interface of the laser annealing sample. The experimental results show that the current transport mechanism through the ohmic contact after laser annealing is different from the conventional spike mechanism, and it is dominated by thermionic field emission. 展开更多
关键词 GALLIUM NITRIDE ohmic contactS laser ANNEALING current transport MECHANISM
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Research on the electrical characteristics of an organic thin-film field-effect transistor based on alternating-current resistance
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作者 陈跃宁 徐征 +4 位作者 赵谡玲 尹飞飞 张成文 焦碧媛 董宇航 《Chinese Physics B》 SCIE EI CAS CSCD 2011年第12期385-388,共4页
In this article, an organic thin-film field-effect transistor (OTFFET) with top-gate and bottom-contact geometry based on pentacene as the active layer is fabricated. The experimental data of the I-V are obtained fr... In this article, an organic thin-film field-effect transistor (OTFFET) with top-gate and bottom-contact geometry based on pentacene as the active layer is fabricated. The experimental data of the I-V are obtained from the OTFFET device. The alternating-current (AC) resistance value of the OTFFET device is calculated using the derivation method from the experimental data, and the AC resistance trend curves of the OTFFET device are obtained with the region fitting method. We analyse the characteristics of the OTFFET device with an AC resistance trend curve. To discover whether it has a high resistance, it is proposed to judge the region of the source/drain voltage (VDs) less than the transition voltage, thereby determining whether the contact between the metal electrode and the organic semiconductor layer of the OTFFET device is Ohmic or non-Ohmic. The theoretical analysis shows that the field-effect mobility and the AC resistance are in reverse proportion. Therefore, we point out that reducing AC resistance is necessary if field-effect mobility is to be improved. 展开更多
关键词 organic thin-film field-effect transistor alternating-current resistance Ohmic contact
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Optimization Analysis of Sliding Electrical Contact Interface Based on Electromechanical Coupling
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作者 Pengfei Yue Jiahe Ma +1 位作者 Ronghao Shi Kexing Song 《Journal of Applied Mathematics and Physics》 2024年第11期4030-4041,共12页
This work addresses the critical issue of current density distribution in the sliding electrical contact interface based on electromechanical coupling, which is essential for minimizing damage and enhancing performanc... This work addresses the critical issue of current density distribution in the sliding electrical contact interface based on electromechanical coupling, which is essential for minimizing damage and enhancing performance. Using electromechanical coupling analysis and finite element analysis (FEA), the effects of initial contact pressure, pulse current input, and armature speed on current density are examined. Key findings indicate that optimizing the convex rail and armature structures significantly reduces peak current density, improving uniformity and reducing damage. These optimizations enhance the efficiency, accuracy, and service life of sliding electrical contact interfaces, providing a theoretical foundation for designing more durable and efficient high-current-density applications. 展开更多
关键词 Sliding contact Interface Electromagnetic Propulsion current Density Distribution Finite Element Analysis
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多晶硅/硅界面处理工艺对硅光敏晶体管性能影响的比较研究
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作者 黄绍春 黄烈云 +2 位作者 彭金萍 郭培 向勇军 《半导体光电》 北大核心 2025年第1期70-74,共5页
研究了多晶硅/硅发射极结构光敏晶体管的制备工艺。为分析多晶硅/硅界面质量对芯片性能的影响,通过对比低压化学气相淀积(LPCVD)多晶硅前不同表面预处理方案(RCA清洗和稀释氢氟酸漂洗)以及多晶硅淀积后不同温度退火工艺,系统研究了光敏... 研究了多晶硅/硅发射极结构光敏晶体管的制备工艺。为分析多晶硅/硅界面质量对芯片性能的影响,通过对比低压化学气相淀积(LPCVD)多晶硅前不同表面预处理方案(RCA清洗和稀释氢氟酸漂洗)以及多晶硅淀积后不同温度退火工艺,系统研究了光敏晶体管直流增益(hFE)和发射极接触电阻(re)的变化情况。实验结果表明,采用稀释氢氟酸漂洗工艺可有效降低增益对偏置电压的敏感性;适当提高退火温度(900~1100℃)能够使发射极接触电阻率降低,同时显著改善芯片关键性能参数的一致性,但会导致峰值电流增益降低。该研究为优化光敏晶体管界面工程提供了重要工艺参考。 展开更多
关键词 硅光敏晶体管 多晶硅/硅界面 RCA清洗 电流增益 发射极接触电阻
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高性能非接触式mA级隧穿磁阻电流传感器的设计与实现
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作者 余佶成 周峰 +6 位作者 殷小东 岳长喜 梁思远 张嘉祺 刘佳乐 李磊 胡晓旭 《电力科学与技术学报》 北大核心 2025年第6期213-220,共8页
及时准确地监测泄漏电流,是实现电气设备绝缘监测和故障预警、保障电网安全稳定运行的基础。随着可再生能源和电力电子设备的广泛应用,泄漏电流的测量需在不影响设备正常工作的情况下实现mA级准确测量。隧穿磁阻(tunneling magnetoresis... 及时准确地监测泄漏电流,是实现电气设备绝缘监测和故障预警、保障电网安全稳定运行的基础。随着可再生能源和电力电子设备的广泛应用,泄漏电流的测量需在不影响设备正常工作的情况下实现mA级准确测量。隧穿磁阻(tunneling magnetoresistive,TMR)技术通过量子隧穿效应感应待测电流激发出的磁场,其独特的材料结构赋予其超低功耗和微弱电流检测能力,为该传感器设计提供了核心支撑。先基于TMR工作原理,构建了适用于mA级非接触式测量的电流传感结构。然后,针对TMR传感器在复杂温度环境下的灵敏度温漂问题,创新性地提出一种基于三次样条插值的软件补偿方法,通过对传感器在不同温度下的输出数据进行拟合,获得连续的灵敏度补偿曲线,显著提升传感器的温度稳定性,并优化设计了传感器的聚磁环和信号处理电路。最后,通过研制样机进行实验,证明在±250 mA电流范围下,所设计的高性能非接触式mA级TMR电流传感器能够以0.2%FS精准测量电流,温漂系数低至106.3 ppm/℃,较传统硬件补偿方法(387.9 ppm/℃)降低了约73%,大幅抑制了环境温度影响,且灵敏度为9.994 V/A,满足电网安全运行、绝缘检测等领域的微弱电流测量需求。 展开更多
关键词 非接触式 电流传感器 隧穿磁阻 MA 级电流 聚磁环
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