In this paper, an ultra-compact single negative（SNG） electric waveguided metamaterial（WG-MTM） is first investigated and used to reduce the mutual coupling in E ＆ H planes of a dual-band microstrip antenna array. ...In this paper, an ultra-compact single negative（SNG） electric waveguided metamaterial（WG-MTM） is first investigated and used to reduce the mutual coupling in E ＆ H planes of a dual-band microstrip antenna array. The proposed SNG electric WG-MTM unit cell is designed by etching two different symmetrical spiral lines on the ground, and has two stopbands operating at 1.86 GHz and 2.40 GHz. The circuit size is very compact, which is only λ_0/33.6 ×λ_0/15.1（where λ_0 is the wavelength at 1.86 GHz in free space）. Taking advantage of the dual-stopband property of the proposed SNG electric WG-MTM, a dual-band microstrip antenna array operating at 1.86 GHz and 2.40 GHz with very low mutual coupling is designed by embedding a cross shaped array of the proposed SNG electric WG-MTM. The measured and simulated results of the designed dual-band antenna array are in good agreement with each other, indicating that the mutual coupling of the fabricated dual-band antenna array realizes 9.8/11.1 d B reductions in the H plane, 8.5/7.9 d B reductions in the E plane at1.86 GHz and 2.40 GHz, respectively. Besides, the distance of the antenna elements in the array is only 0.35 λ_0（where λ_0 is the wavelength at 1.86 GHz in free space）. The proposed strategy is used for the first time to reduce the mutual coupling in E ＆ H planes of the dual-band microstrip antenna array by using ultra-compact SNG electric WG-MTM.展开更多
Advancements in semiconductor technology are making gate-level test generation more challenging. This is because a large amount of detailed structural information must be processed in the search process of automatic t...Advancements in semiconductor technology are making gate-level test generation more challenging. This is because a large amount of detailed structural information must be processed in the search process of automatic test pattern generation (ATPG). In addition, ATPG needs to deal with new defects caused by process variation when IC is shrinking. To reduce the computation effort of ATPG, test generation could be started earlier at higher abstraction level, which is in line with top-down design methodology that has become more popular nowadays. In this research, we employ Chen’s high-level fault model in the high-level ATPG. Besides shorter ATPG time as shown in many previous works, our study showed that high-level ATPG also contributes to test compaction. This is because most of the high-level faults correlate with the gate-level collapsed faults especially at input/output of the modules in a circuit. The high-level ATPG prototype used in our work is mainly composed by constraint-driven test generation engine and fault simulation engine. Experimental result showed that more reduced/compact test set can be generated from the high-level ATPG.展开更多
基金Project supported by the National Natural Science Foundation of China(Grant No.61372034)
文摘In this paper, an ultra-compact single negative（SNG） electric waveguided metamaterial（WG-MTM） is first investigated and used to reduce the mutual coupling in E ＆ H planes of a dual-band microstrip antenna array. The proposed SNG electric WG-MTM unit cell is designed by etching two different symmetrical spiral lines on the ground, and has two stopbands operating at 1.86 GHz and 2.40 GHz. The circuit size is very compact, which is only λ_0/33.6 ×λ_0/15.1（where λ_0 is the wavelength at 1.86 GHz in free space）. Taking advantage of the dual-stopband property of the proposed SNG electric WG-MTM, a dual-band microstrip antenna array operating at 1.86 GHz and 2.40 GHz with very low mutual coupling is designed by embedding a cross shaped array of the proposed SNG electric WG-MTM. The measured and simulated results of the designed dual-band antenna array are in good agreement with each other, indicating that the mutual coupling of the fabricated dual-band antenna array realizes 9.8/11.1 d B reductions in the H plane, 8.5/7.9 d B reductions in the E plane at1.86 GHz and 2.40 GHz, respectively. Besides, the distance of the antenna elements in the array is only 0.35 λ_0（where λ_0 is the wavelength at 1.86 GHz in free space）. The proposed strategy is used for the first time to reduce the mutual coupling in E ＆ H planes of the dual-band microstrip antenna array by using ultra-compact SNG electric WG-MTM.
文摘Advancements in semiconductor technology are making gate-level test generation more challenging. This is because a large amount of detailed structural information must be processed in the search process of automatic test pattern generation (ATPG). In addition, ATPG needs to deal with new defects caused by process variation when IC is shrinking. To reduce the computation effort of ATPG, test generation could be started earlier at higher abstraction level, which is in line with top-down design methodology that has become more popular nowadays. In this research, we employ Chen’s high-level fault model in the high-level ATPG. Besides shorter ATPG time as shown in many previous works, our study showed that high-level ATPG also contributes to test compaction. This is because most of the high-level faults correlate with the gate-level collapsed faults especially at input/output of the modules in a circuit. The high-level ATPG prototype used in our work is mainly composed by constraint-driven test generation engine and fault simulation engine. Experimental result showed that more reduced/compact test set can be generated from the high-level ATPG.
