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Diagnostic of capacitively coupled radio frequency plasma from electrical discharge characteristics:comparison with optical emission spectroscopy and fluid model simulation 被引量:3
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作者 何湘 刘冲 +6 位作者 张亚春 陈建平 陈玉东 曾小军 陈秉岩 庞佳鑫 王一兵 《Plasma Science and Technology》 SCIE EI CAS CSCD 2018年第2期26-33,共8页
The capacitively coupled radio frequency(CCRF)plasma has been widely used in various fields.In some cases,it requires us to estimate the range of key plasma parameters simpler and quicker in order to understand the ... The capacitively coupled radio frequency(CCRF)plasma has been widely used in various fields.In some cases,it requires us to estimate the range of key plasma parameters simpler and quicker in order to understand the behavior in plasma.In this paper,a glass vacuum chamber and a pair of plate electrodes were designed and fabricated,using 13.56 MHz radio frequency(RF)discharge technology to ionize the working gas of Ar.This discharge was mathematically described with equivalent circuit model.The discharge voltage and current of the plasma were measured atdifferent pressures and different powers.Based on the capacitively coupled homogeneous discharge model,the equivalent circuit and the analytical formula were established.The plasma density and temperature were calculated by using the equivalent impedance principle and energy balance equation.The experimental results show that when RF discharge power is 50–300 W and pressure is 25–250 Pa,the average electron temperature is about 1.7–2.1 e V and the average electron density is about 0.5?×10^17–3.6?×10^17m^-3.Agreement was found when the results were compared to those given by optical emission spectroscopy and COMSOL simulation. 展开更多
关键词 plasma diagnostic equivalent circuit model optical emission spectrometry COMSOL simulation
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SPICE model of trench-gate MOSFET device
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作者 刘超 张春伟 +1 位作者 刘斯扬 孙伟锋 《Journal of Southeast University(English Edition)》 EI CAS 2016年第4期408-414,共7页
A novel simulation program with an integrated circuit emphasis(SPICE) model developed for trench-gate metal-oxide-semiconductor field-effect transistor(M OSFET)devices is proposed. The drift region resistance was ... A novel simulation program with an integrated circuit emphasis(SPICE) model developed for trench-gate metal-oxide-semiconductor field-effect transistor(M OSFET)devices is proposed. The drift region resistance was modeled according to the physical characteristics and the specific structure of the trench-gate MOSFET device. For the accurate simulation of dynamic characteristics, three important capacitances, gate-to-drain capacitance Cgd, gate-to-source capacitance Cgsand drain-to-source capacitance Cds, were modeled, respectively, in the proposed model. Furthermore,the self-heating effect, temperature effect and breakdown characteristic were taken into account; the self-heating model and breakdown model were built in the proposed model; and the temperature parameters of the model were revised. The proposed model is verified by experimental results, and the errors between measured data and simulation results of the novel model are less than 5%. Therefore, the model can give an accurate description for both the static and dynamic characteristics of the trench-gate MOSFET device. 展开更多
关键词 trench-gate metal-oxide-semiconductor field-effect transistor(MOSFET) simulation program with integrated circuit emphasis(SPICE) model drift region resistance model dynamic model
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