A correlation-based digital background calibration algorithm for pipelined Analog-to- Digital Converters (ADCs) is presented in this paper. The merit of the calibration algorithm is that the main errors information, w...A correlation-based digital background calibration algorithm for pipelined Analog-to- Digital Converters (ADCs) is presented in this paper. The merit of the calibration algorithm is that the main errors information, which include the capacitor mismatches and residue amplifier distortion, are extracted integrally. A modified 1st pipelined stage is adopted to solve the signal overflow caused by the Pseudo-random Noise (PN) sequences. Behavioral simulation results verify the effectiveness of the algorithm. It improves the Signal-to-Noise-plus-Distortion Ratio (SNDR) and Spurious-Free-Dynamic-Range (SFDR) of the pipelined ADC from 41.8 dB to 78.3 dB and 55.6 dB to 98.6 dB, respectively, which is comparable to the prior arts.展开更多
An error correction technique to achieve a 14-bit successive approximation register analog-to-digital converter(SAR ADC) is proposed. A tunable split capacitor is designed to eliminate the mismatches caused by parasit...An error correction technique to achieve a 14-bit successive approximation register analog-to-digital converter(SAR ADC) is proposed. A tunable split capacitor is designed to eliminate the mismatches caused by parasitic capacitors. The linearity error of capacitor array caused by process mismatch is calibrated by a novel calibration capacitor array that can improve the sampling rate. The dual-comparator topology ensures both the speed and precision of the ADC. The simulation results show that the SAR ADC after calibration achieves 83.07 dB SNDR and 13.5 bit ENOB at 500 kilosamples/s.展开更多
A 14-bit successive approximation analog-to-digital converter (SAR ADC) with capacitive calibration has been designed based on the SMIC. 18 μm CMOS process. The overall architecture is in fully differential form to e...A 14-bit successive approximation analog-to-digital converter (SAR ADC) with capacitive calibration has been designed based on the SMIC. 18 μm CMOS process. The overall architecture is in fully differential form to eliminate the effect caused by common mode noise. Meanwhile, the digital-to-analog converter (DAC) is a two-stage structure, which can greatly reduce the area of the capacitor array compared with the traditional DAC structure. The capacitance calibration module is mainly divided into the mismatch voltage acquisition phase and the calibration code backfill phase, which effectively reduces the impact of the DAC mismatch on the accuracy of the SAR ADC. The design of this paper is based on cadence platform simulation verification, simulation results show that when the sampling rate is 1 MS/s, the power supply voltage is 5 V and the reference voltage is 4.096 V, the effective number of bits (ENOB) of the ADC is 13.49 bit, and the signal-to-noise ratio (SNR) is 83.3 dB.展开更多
Switched-capacitor converters can deliver better performance,power density,and switch utilization compared to inductor-based power converters,but they suffer from current spikes during switching due to capacitor charg...Switched-capacitor converters can deliver better performance,power density,and switch utilization compared to inductor-based power converters,but they suffer from current spikes during switching due to capacitor charge redistribution.This can be solved by methods such as split-phase control,which was developed to address charge redistribution in Dickson SC converters by controlling the charging and discharging of the circuit‟s flying capacitors,such that the equivalent branch voltages line up when the circuit switches states.However,split-phase control is most effective at compensating for charge redistribution when all the circuit‟s flying capacitors are matched in capacitance value.Differences between the capacitance values of the circuit flying capacitors may result in split-phase control not being able to fully compensate for charge redistribution,due to the different charge/discharge rates of the flying capacitors.The work presented in this paper provides an in-depth analysis of the sensitivity of the split-phase Dickson converter to mismatches in flying capacitor values,as well as discussions regarding the design considerations and prototype test results of a split-phase Dickson converter for high-current loads.展开更多
A 10-bit ratio-independent switch-capacitor（SC） cyclic analog-to-digital converter（ADC） with offset cancelingforaCMOSimagesensorispresented.TheproposedADCcompletesanN-bitconversionin1.5N clock cycles with one oper...A 10-bit ratio-independent switch-capacitor（SC） cyclic analog-to-digital converter（ADC） with offset cancelingforaCMOSimagesensorispresented.TheproposedADCcompletesanN-bitconversionin1.5N clock cycles with one operational amplifier. Combining ratio-independent and polarity swapping techniques, the conversioncharacteristicoftheproposedcyclicADCisinherentlyinsensitivebothtocapacitorratioandtoamplifieroffset voltage. Therefore, the circuit can be realized in a small die area and it is suitable to serve as the column-parallel ADC in CMOS image sensors. A prototype ADC is fabricated in 0.18- m one-poly four-metal CMOS technology.The measured results indicate that the ADC has a signal-to-noise and distortion ratio（SNDR） of 53.6 dB and a DNL of C0：12/0：14 LSB at a conversion rate of 600 kS/s. The standard deviation of the offset variation of the ADC is reduced from 2.5 LSB to 0.5 LSB. Its power dissipation is 250 W with a 1.8 V supply, and its area is0.030.8 mm2.展开更多
This paper describes a fast digital calibration scheme for pipelined analog-to-digital converters（ADCs）. The proposed method corrects the nonlinearity caused by finite opamp gain and capacitor mismatch in multiplyin...This paper describes a fast digital calibration scheme for pipelined analog-to-digital converters（ADCs）. The proposed method corrects the nonlinearity caused by finite opamp gain and capacitor mismatch in multiplying digital-to-analog converters（MDACs）.The considered calibration technique takes the advantages of both foreground and background calibration schemes.In this combination calibration algorithm,a novel parallel background calibration with signal-shifted correlation is proposed,and its calibration cycle is very short.The details of this technique are described in the example of a 14-bit 100 Msample/s pipelined ADC.The high convergence speed of this background calibration is achieved by three means.First,a modified 1.5-bit stage is proposed in order to allow the injection of a large pseudo-random dithering without missing code.Second,before correlating the signal,it is shifted according to the input signal so that the correlation error converges quickly.Finally,the front pipeline stages are calibrated simultaneously rather than stage by stage to reduce the calibration tracking constants.Simulation results confirm that the combination calibration has a fast startup process and a short background calibration cycle of 2×2^（21） conversions.展开更多
This paper presents a two-mode digital calibration technique for pipelined analog-to-digital converters （ADC）.The proposed calibration eliminates the errors of residual difference voltage induced by capacitor mismat...This paper presents a two-mode digital calibration technique for pipelined analog-to-digital converters （ADC）.The proposed calibration eliminates the errors of residual difference voltage induced by capacitor mismatch of pseudorandom（PN） sequence injection capacitors at the ADC initialization,while applies digital background calibration to continuously compensate the interstage gain errors in ADC normal operation.The presented technique not only reduces the complexity of analog circuit by eliminating the implementation of PN sequence with accurate amplitude in analog domain,but also improves the performance of digital background calibration by minimizing the sensitivity of calibration accuracy to sub-ADC errors.The use of opamps with low DC gains in normal operation makes the proposed design more compatible with future nanometer CMOS technology.The prototype of a 12-bit 40-MS/s pipelined ADC with the two-mode digital calibration is implemented in 0.18-μm CMOS process.Adopting a simple telescopic opamp with a DC gain of 58-dB in the first stage,the measured SFDR and SNDR within the first Nyquist zone reach 80-dB and 66-dB,respectively.With the calibration,the maximum integral nonlinearity （INL） of the ADC reduces from 4.75-LSB to 0.65-LSB,while the ADC core consumes 82-mW at 3.3-V power supply.展开更多
This paper presents a 12-bit 100 MS/s CMOS pipelined analog-to-digital converter （ADC） with digital background calibration. A large magnitude calibration signal is injected into the multiplying digital-to-analog con...This paper presents a 12-bit 100 MS/s CMOS pipelined analog-to-digital converter （ADC） with digital background calibration. A large magnitude calibration signal is injected into the multiplying digital-to-analog converter （MDAC） while the architecture of the MDAC remains unchanged. When sampled at 100 MS/s, it takes only 2.8 s to calibrate the 12-bit prototype ADC and achieves a peak spurious-free dynamic range of 85 dB and a peak signal-to-noise plus distortion ratio of 66 dB with 2 MHz input. Integral nonlinearity is improved from 1.9 to 0.6 least significant bits after calibration. The chip is fabricated in a 0.18μm CMOS process, occupies an active area of 2.3 × 1.6 mm^2, and consumes 205 mW at 1.8 V.展开更多
基金Supported by the Doctoral Program Foundation of Institutions of Higher Education of China (No.20120111120008)State Key Lab of ASIC & System(Fudan University) (No. 11KF001)Special Fund for Doctoral Program (Hefei University of Technology) (No.2011HGBZ0953)
文摘A correlation-based digital background calibration algorithm for pipelined Analog-to- Digital Converters (ADCs) is presented in this paper. The merit of the calibration algorithm is that the main errors information, which include the capacitor mismatches and residue amplifier distortion, are extracted integrally. A modified 1st pipelined stage is adopted to solve the signal overflow caused by the Pseudo-random Noise (PN) sequences. Behavioral simulation results verify the effectiveness of the algorithm. It improves the Signal-to-Noise-plus-Distortion Ratio (SNDR) and Spurious-Free-Dynamic-Range (SFDR) of the pipelined ADC from 41.8 dB to 78.3 dB and 55.6 dB to 98.6 dB, respectively, which is comparable to the prior arts.
基金Supported by National Science and Technology Major Project of China(No.2012ZX03004008)
文摘An error correction technique to achieve a 14-bit successive approximation register analog-to-digital converter(SAR ADC) is proposed. A tunable split capacitor is designed to eliminate the mismatches caused by parasitic capacitors. The linearity error of capacitor array caused by process mismatch is calibrated by a novel calibration capacitor array that can improve the sampling rate. The dual-comparator topology ensures both the speed and precision of the ADC. The simulation results show that the SAR ADC after calibration achieves 83.07 dB SNDR and 13.5 bit ENOB at 500 kilosamples/s.
文摘A 14-bit successive approximation analog-to-digital converter (SAR ADC) with capacitive calibration has been designed based on the SMIC. 18 μm CMOS process. The overall architecture is in fully differential form to eliminate the effect caused by common mode noise. Meanwhile, the digital-to-analog converter (DAC) is a two-stage structure, which can greatly reduce the area of the capacitor array compared with the traditional DAC structure. The capacitance calibration module is mainly divided into the mismatch voltage acquisition phase and the calibration code backfill phase, which effectively reduces the impact of the DAC mismatch on the accuracy of the SAR ADC. The design of this paper is based on cadence platform simulation verification, simulation results show that when the sampling rate is 1 MS/s, the power supply voltage is 5 V and the reference voltage is 4.096 V, the effective number of bits (ENOB) of the ADC is 13.49 bit, and the signal-to-noise ratio (SNR) is 83.3 dB.
文摘Switched-capacitor converters can deliver better performance,power density,and switch utilization compared to inductor-based power converters,but they suffer from current spikes during switching due to capacitor charge redistribution.This can be solved by methods such as split-phase control,which was developed to address charge redistribution in Dickson SC converters by controlling the charging and discharging of the circuit‟s flying capacitors,such that the equivalent branch voltages line up when the circuit switches states.However,split-phase control is most effective at compensating for charge redistribution when all the circuit‟s flying capacitors are matched in capacitance value.Differences between the capacitance values of the circuit flying capacitors may result in split-phase control not being able to fully compensate for charge redistribution,due to the different charge/discharge rates of the flying capacitors.The work presented in this paper provides an in-depth analysis of the sensitivity of the split-phase Dickson converter to mismatches in flying capacitor values,as well as discussions regarding the design considerations and prototype test results of a split-phase Dickson converter for high-current loads.
基金Project supported by the National Natural Science Foundation of China(Nos.61234003,61274021)
文摘A 10-bit ratio-independent switch-capacitor（SC） cyclic analog-to-digital converter（ADC） with offset cancelingforaCMOSimagesensorispresented.TheproposedADCcompletesanN-bitconversionin1.5N clock cycles with one operational amplifier. Combining ratio-independent and polarity swapping techniques, the conversioncharacteristicoftheproposedcyclicADCisinherentlyinsensitivebothtocapacitorratioandtoamplifieroffset voltage. Therefore, the circuit can be realized in a small die area and it is suitable to serve as the column-parallel ADC in CMOS image sensors. A prototype ADC is fabricated in 0.18- m one-poly four-metal CMOS technology.The measured results indicate that the ADC has a signal-to-noise and distortion ratio（SNDR） of 53.6 dB and a DNL of C0：12/0：14 LSB at a conversion rate of 600 kS/s. The standard deviation of the offset variation of the ADC is reduced from 2.5 LSB to 0.5 LSB. Its power dissipation is 250 W with a 1.8 V supply, and its area is0.030.8 mm2.
基金supported by the National Key Project,China(No.2008zx010200001)
文摘This paper describes a fast digital calibration scheme for pipelined analog-to-digital converters（ADCs）. The proposed method corrects the nonlinearity caused by finite opamp gain and capacitor mismatch in multiplying digital-to-analog converters（MDACs）.The considered calibration technique takes the advantages of both foreground and background calibration schemes.In this combination calibration algorithm,a novel parallel background calibration with signal-shifted correlation is proposed,and its calibration cycle is very short.The details of this technique are described in the example of a 14-bit 100 Msample/s pipelined ADC.The high convergence speed of this background calibration is achieved by three means.First,a modified 1.5-bit stage is proposed in order to allow the injection of a large pseudo-random dithering without missing code.Second,before correlating the signal,it is shifted according to the input signal so that the correlation error converges quickly.Finally,the front pipeline stages are calibrated simultaneously rather than stage by stage to reduce the calibration tracking constants.Simulation results confirm that the combination calibration has a fast startup process and a short background calibration cycle of 2×2^（21） conversions.
基金Project supported by the National Natural Science Foundation of China(No.90307016)the National Science and Technology Major Project of China(No.2010ZX03006-003 -01)
文摘This paper presents a two-mode digital calibration technique for pipelined analog-to-digital converters （ADC）.The proposed calibration eliminates the errors of residual difference voltage induced by capacitor mismatch of pseudorandom（PN） sequence injection capacitors at the ADC initialization,while applies digital background calibration to continuously compensate the interstage gain errors in ADC normal operation.The presented technique not only reduces the complexity of analog circuit by eliminating the implementation of PN sequence with accurate amplitude in analog domain,but also improves the performance of digital background calibration by minimizing the sensitivity of calibration accuracy to sub-ADC errors.The use of opamps with low DC gains in normal operation makes the proposed design more compatible with future nanometer CMOS technology.The prototype of a 12-bit 40-MS/s pipelined ADC with the two-mode digital calibration is implemented in 0.18-μm CMOS process.Adopting a simple telescopic opamp with a DC gain of 58-dB in the first stage,the measured SFDR and SNDR within the first Nyquist zone reach 80-dB and 66-dB,respectively.With the calibration,the maximum integral nonlinearity （INL） of the ADC reduces from 4.75-LSB to 0.65-LSB,while the ADC core consumes 82-mW at 3.3-V power supply.
文摘This paper presents a 12-bit 100 MS/s CMOS pipelined analog-to-digital converter （ADC） with digital background calibration. A large magnitude calibration signal is injected into the multiplying digital-to-analog converter （MDAC） while the architecture of the MDAC remains unchanged. When sampled at 100 MS/s, it takes only 2.8 s to calibrate the 12-bit prototype ADC and achieves a peak spurious-free dynamic range of 85 dB and a peak signal-to-noise plus distortion ratio of 66 dB with 2 MHz input. Integral nonlinearity is improved from 1.9 to 0.6 least significant bits after calibration. The chip is fabricated in a 0.18μm CMOS process, occupies an active area of 2.3 × 1.6 mm^2, and consumes 205 mW at 1.8 V.
