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A study of radiation effects of 9 and 12 MeV protons on Chinese CMOS image sensor degradation
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作者 孟祥提 黄强 +3 位作者 马艳秀 郑永男 范平 朱升云 《Chinese Physics C》 SCIE CAS CSCD 北大核心 2008年第6期442-445,共4页
The 9 and 12 MeV proton irradiations of the Chinese CMOS Image Sensor in the fluence range from 1× 10^9 to 4×10^10 cm^-2 and 1 × 10^9 to 2×10^12 cm^-2 have been carried out respectively. The color ... The 9 and 12 MeV proton irradiations of the Chinese CMOS Image Sensor in the fluence range from 1× 10^9 to 4×10^10 cm^-2 and 1 × 10^9 to 2×10^12 cm^-2 have been carried out respectively. The color pictures and dark output images are captured, and the average brightness of dark output images is calculated. The anti-irradiation fluence thresholds for 9 and 12 MeV protons are about 4×10^l0 and 2×10^12 cm^-2, respectively. These can be explained by the change of the concentrations of irradiation-induced electron-hole pairs and vacancies in the various layers of CMOS image sensor calculated by the TRIM simulation program. 展开更多
关键词 semiconductor technology CMOS image sensor proton irradiation average brightness TRIM simulation
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