Au/MgO/ZnO/MgO/Au structures have been designed and constructed in this study. Under a bias voltage, a carrier avalanche multiplication will occur via an impact ionization process in the MgO layer. The generated holes...Au/MgO/ZnO/MgO/Au structures have been designed and constructed in this study. Under a bias voltage, a carrier avalanche multiplication will occur via an impact ionization process in the MgO layer. The generated holes will be drifted into the ZnO layer, and recombine radiatively with the electrons in the ZnO layer. Thus obvious emissions at around 387 nm coming from the near-band-edge emission of ZnO will be observed. The reported results demonstrate the ultraviolet （UV） emission realized via a carrier multiplication process, and so may provide an alternative route to efficient UV emissions by bypassing the challenging p-type doping issue of ZnO.展开更多
In this paper, we propose an analytical avalanche multiplication model for the next generation of SiGe silicon- on-insulator （SOI） heterojunction bipolar transistors （HBTs） and consider their vertical and lateral ...In this paper, we propose an analytical avalanche multiplication model for the next generation of SiGe silicon- on-insulator （SOI） heterojunction bipolar transistors （HBTs） and consider their vertical and lateral impact ionizations for the first time. Supported by experimental data, the analytical model predicts that the avalanche multiplication governed by impact ionization shows kinks and the impact ionization effect is small compared with that of the bulk HBT, resulting in a larger base-collector breakdown voltage. The model presented in the paper is significant and has useful applications in the design and simulation of the next generation of SiCe SOI BiCMOS technology.展开更多
It is well known that -nitride semiconductors can generate the magnitude of MV/cm polarization electric field which is comparable with their ionization electric fields. To take full advantage of the polarization elect...It is well known that -nitride semiconductors can generate the magnitude of MV/cm polarization electric field which is comparable with their ionization electric fields. To take full advantage of the polarization electric field, we design an N-face AlGaN solar-blind avalanche photodiode (APD) with an Al<sub>0.45</sub>Ga<sub>0.55</sub>N/Al<sub>0.3</sub>Ga<sub>0.7</sub>N heterostructure as separate absorption and multiplication (SAM) regions. The simulation results show that the N-face APDs are more beneficial to improving the avalanche gain and reducing the avalanche breakdown voltage compared with the Ga-face APDs due to the effect of the polarization electric field. Furthermore, the Al<sub>0.45</sub>Ga<sub>0.55</sub>N/Al<sub>0.3</sub>Ga<sub>0.7</sub>N heterostructure SAM regions used in APDs instead of homogeneous Al<sub>0.45</sub>Ga<sub>0.55</sub>N SAM structure can increase significantly avalanche gain because of the increased hole ionization coefficient by using the relatively low Al-content AlGaN in the multiplication region. Meanwhile, a quarter-wave AlGaN/AlN distributed Bragg reflector structure at the bottom of the device is designed to remain a solar-blind characteristic of the heterostructure SAM-APDs.展开更多
A Ga_(2)O_(3)/diamond separate absorption and multiplication avalanche photodiode(SAM-APD)with mesa structure has been proposed and simulated.The simulation is based on an optimized Ga_(2)O_(3)/diamond heterostructure...A Ga_(2)O_(3)/diamond separate absorption and multiplication avalanche photodiode(SAM-APD)with mesa structure has been proposed and simulated.The simulation is based on an optimized Ga_(2)O_(3)/diamond heterostructure TCAD physical model,which is revised by repeated comparison with the experimental data from the literature.Since both Ga_(2)O_(3)and diamond are ultra-wide bandgap semiconductor materials,the Ga_(2)O_(3)/diamond SAM-APD shows good solar-blind detection ability,and the corresponding cutoff wavelength is about 263 nm.The doping distribution and the electric field distribution of the SAM-APD are discussed,and the simulation results show that the gain of the designed device can reach 5×10^(4)and the peak responsivity can reach a value as high as 78 A/W.展开更多
基金the National Basic Research Program of China(Grant No.2011CB302005)the National Natural Science Foundation of China(Grant Nos.11074248,11104265,11134009,and 61177040)the Science and Technology Developing Project of Jilin Province,China(Grant No.20111801)
文摘Au/MgO/ZnO/MgO/Au structures have been designed and constructed in this study. Under a bias voltage, a carrier avalanche multiplication will occur via an impact ionization process in the MgO layer. The generated holes will be drifted into the ZnO layer, and recombine radiatively with the electrons in the ZnO layer. Thus obvious emissions at around 387 nm coming from the near-band-edge emission of ZnO will be observed. The reported results demonstrate the ultraviolet （UV） emission realized via a carrier multiplication process, and so may provide an alternative route to efficient UV emissions by bypassing the challenging p-type doping issue of ZnO.
基金supported by the Science Foundation of National Ministries and Commissions (Grant Nos. 51308040203 and 6139801)the Fundamental Research Funds for the Central Universities of China (Grant Nos. 72105499 and 72104089)the Natural Science Basic Research Program in Shaanxi Province of China (Grant No. 2010JQ8008)
文摘In this paper, we propose an analytical avalanche multiplication model for the next generation of SiGe silicon- on-insulator （SOI） heterojunction bipolar transistors （HBTs） and consider their vertical and lateral impact ionizations for the first time. Supported by experimental data, the analytical model predicts that the avalanche multiplication governed by impact ionization shows kinks and the impact ionization effect is small compared with that of the bulk HBT, resulting in a larger base-collector breakdown voltage. The model presented in the paper is significant and has useful applications in the design and simulation of the next generation of SiCe SOI BiCMOS technology.
基金Supported by the State Key Project of Research and Development Plan of China under Grant No 2016YFB0400903the National Natural Science Foundation of China under Grant Nos 61634002,61274075 and 61474060+2 种基金the Key Project of Jiangsu Province under Grant No BE2016174the Anhui University Natural Science Research Project under Grant No KJ2015A153the Open Fund of State KeyLab of Optical Technologies on Nano-fabrication and Micro-engineering
文摘It is well known that -nitride semiconductors can generate the magnitude of MV/cm polarization electric field which is comparable with their ionization electric fields. To take full advantage of the polarization electric field, we design an N-face AlGaN solar-blind avalanche photodiode (APD) with an Al<sub>0.45</sub>Ga<sub>0.55</sub>N/Al<sub>0.3</sub>Ga<sub>0.7</sub>N heterostructure as separate absorption and multiplication (SAM) regions. The simulation results show that the N-face APDs are more beneficial to improving the avalanche gain and reducing the avalanche breakdown voltage compared with the Ga-face APDs due to the effect of the polarization electric field. Furthermore, the Al<sub>0.45</sub>Ga<sub>0.55</sub>N/Al<sub>0.3</sub>Ga<sub>0.7</sub>N heterostructure SAM regions used in APDs instead of homogeneous Al<sub>0.45</sub>Ga<sub>0.55</sub>N SAM structure can increase significantly avalanche gain because of the increased hole ionization coefficient by using the relatively low Al-content AlGaN in the multiplication region. Meanwhile, a quarter-wave AlGaN/AlN distributed Bragg reflector structure at the bottom of the device is designed to remain a solar-blind characteristic of the heterostructure SAM-APDs.
基金Project supported by the National Key Research and Development Program of China(Grant No.2022YFB3608602)the Beijing Municipal Science and Technology Commission(Grant No.Z181100004418009)the National Natural Science Foundation of China(Grant No.61927806)。
文摘A Ga_(2)O_(3)/diamond separate absorption and multiplication avalanche photodiode(SAM-APD)with mesa structure has been proposed and simulated.The simulation is based on an optimized Ga_(2)O_(3)/diamond heterostructure TCAD physical model,which is revised by repeated comparison with the experimental data from the literature.Since both Ga_(2)O_(3)and diamond are ultra-wide bandgap semiconductor materials,the Ga_(2)O_(3)/diamond SAM-APD shows good solar-blind detection ability,and the corresponding cutoff wavelength is about 263 nm.The doping distribution and the electric field distribution of the SAM-APD are discussed,and the simulation results show that the gain of the designed device can reach 5×10^(4)and the peak responsivity can reach a value as high as 78 A/W.
