This paper studies the technics of reducing item exposure by utilizing automatic item generation methods. Known test item calibration method uses item parameter estimation with the statistical data, collected during e...This paper studies the technics of reducing item exposure by utilizing automatic item generation methods. Known test item calibration method uses item parameter estimation with the statistical data, collected during examinees prior testing. Disadvantage of the mentioned item calibration method is the item exposure; when test items become familiar to the examinees. To reduce the item exposure, automatic item generation method is used, where item models are being constructed based on already calibrated test items without losing already estimated item parameters. A technic of item model extraction method from the already calibrated and therefore exposed test items described, which can be used by the test item development specialists to integrate automatic item generation principles with the existing testing applications.展开更多
文摘This paper studies the technics of reducing item exposure by utilizing automatic item generation methods. Known test item calibration method uses item parameter estimation with the statistical data, collected during examinees prior testing. Disadvantage of the mentioned item calibration method is the item exposure; when test items become familiar to the examinees. To reduce the item exposure, automatic item generation method is used, where item models are being constructed based on already calibrated test items without losing already estimated item parameters. A technic of item model extraction method from the already calibrated and therefore exposed test items described, which can be used by the test item development specialists to integrate automatic item generation principles with the existing testing applications.
