Aberration-corrected annular dark-field scanning transmission electron microscopy(ADF-STEM)is a powerful tool for structural and chemical analysis of materials.Conventional analyses of ADF-STEM images rely on human la...Aberration-corrected annular dark-field scanning transmission electron microscopy(ADF-STEM)is a powerful tool for structural and chemical analysis of materials.Conventional analyses of ADF-STEM images rely on human labeling,making them labor-intensive and prone to subjective error.Here,we introduce a deep-learning-based workflow combining a pix2pix network for image denoising and either a mathematical algorithm local intensity threshold segmentation(LITS)or another deep learning network UNet for chemical identification.After denoising,the processed images exhibit a five-fold improvement in signal-to-noise ratio and a 20%increase in accuracy of atomic localization.Then,we take atomic-resolution images of Y–Ce dual-atom catalysts(DACs)and Fe-doped ReSe_(2) nanosheets as examples to validate the performance.Pix2pix is applied to identify atomic sites in Y–Ce DACs with a location recall of 0.88 and a location precision of 0.99.LITS is used to further differentiate Y and Ce sites by the intensity of atomic sites.Furthermore,pix2pix and UNet workflow with better automaticity is applied to identification of Fe-doped ReSe_(2) nanosheets.Three types of atomic sites(Re,the substitution of Fe for Re,and the adatom of Fe on Re)are distinguished with the identification recall of more than 0.90 and the precision of higher than 0.93.These results suggest that this strategy facilitates high-quality and automated chemical identification of atomic-resolution images.展开更多
One of the major innovations awaiting in electron microscopy is full three-dimensional imaging at atomic resolution.Despite the success of aberration correction to deep sub-angstrom lateral resolution,spatial resoluti...One of the major innovations awaiting in electron microscopy is full three-dimensional imaging at atomic resolution.Despite the success of aberration correction to deep sub-angstrom lateral resolution,spatial resolution in depth is still far from atomic resolution.In scanning transmission electron microscopy(STEM),this poor depth resolution is due to the limitation of the illumination angle.To overcome this physical limitation,it is essential to implement a next-generation aberration corrector in STEM that can significantly improve the depth resolution.This review discusses the capability of depth sectioning for three-dimensional imaging combined with large-angle illumination STEM.Furthermore,the statistical analysis approach remarkably improves the depth resolution,making it possible to achieve three-dimensional atomic resolution imaging at oxide surfaces.We will also discuss the future prospects of three-dimensional imaging at atomic resolution by STEM depth sectioning.展开更多
We present a homebuilt scanning tunneling microscope(STM)which employs an inner-wall polished sapphire guiding tube as a rail for the scanner to form a short tip-sample mechanical loop.The scanner is mounted on a squa...We present a homebuilt scanning tunneling microscope(STM)which employs an inner-wall polished sapphire guiding tube as a rail for the scanner to form a short tip-sample mechanical loop.The scanner is mounted on a square rod which is housed in the guiding tube and held by a spring strip.The stiff sapphire guiding tube allows the STM body to be made in a simple,compact and rigid form.Also the material of sapphire improves the thermal stability of the STM for its good thermal conductivity.To demonstrate the performance of the STM,high quality atomic-resolution STM images of high oriented pyrolytic graphite were given.展开更多
The principle of scanning probe microscopes (SPM) was lust described by J. A. O’Keefe in the 1960s. In 1982, the scanning tunnelling microscope (STM), the first supreme example of SPM family, was developed; for which...The principle of scanning probe microscopes (SPM) was lust described by J. A. O’Keefe in the 1960s. In 1982, the scanning tunnelling microscope (STM), the first supreme example of SPM family, was developed; for which Binnig and Rohrer received the 1986 Nobel Prize in Physics. Shortly after that, in 1986 Binnig together with Quate and Gerber introduced the first atomic force microscope (AFM). Unlike the STM, the AFM展开更多
Determination and conceptualization of atomic structures of metallic glasses or amorphous alloys remain a grand challenge.Structural models proposed for bulk metallic glasses are still controversial owing to experimen...Determination and conceptualization of atomic structures of metallic glasses or amorphous alloys remain a grand challenge.Structural models proposed for bulk metallic glasses are still controversial owing to experimental difficulties in directly imaging the atom positions in three-dimensional structures.With the advanced atomic-resolution imaging,here we directly observed the atomic arrangements in atomically thin metallic glassy membranes obtained by vapor deposition.The atomic packing in the amorphous membrane is shown to have a fractal characteristic,with the fractal dimension depending on the atomic density.Locally,the atomic configuration for the metallic glass membrane is composed of many types of polygons with the bonding angles concentrated on 45°-55°.The fractal atomic structure is consistent with the analysis by the percolation theory,and may account for the enhanced relaxation dynamics and the easiness of glass transition as reported for the thin metallic glassy films or glassy surface.展开更多
基金supported by the National Key Research and Development Program of China(2022YFA1505700)National Natural Science Foundation of China(22475214 and 22205232)+2 种基金Talent Plan of Shanghai Branch,Chinese Academy of Sciences(CASSHB-QNPD-2023-020)Natural Science Foundation of Fujian Province(2023J06044)the Self-deployment Project Research Program of Haixi Institutes,Chinese Academy of Sciences(CXZX-2022-JQ06 and CXZX-2022-GH03)。
文摘Aberration-corrected annular dark-field scanning transmission electron microscopy(ADF-STEM)is a powerful tool for structural and chemical analysis of materials.Conventional analyses of ADF-STEM images rely on human labeling,making them labor-intensive and prone to subjective error.Here,we introduce a deep-learning-based workflow combining a pix2pix network for image denoising and either a mathematical algorithm local intensity threshold segmentation(LITS)or another deep learning network UNet for chemical identification.After denoising,the processed images exhibit a five-fold improvement in signal-to-noise ratio and a 20%increase in accuracy of atomic localization.Then,we take atomic-resolution images of Y–Ce dual-atom catalysts(DACs)and Fe-doped ReSe_(2) nanosheets as examples to validate the performance.Pix2pix is applied to identify atomic sites in Y–Ce DACs with a location recall of 0.88 and a location precision of 0.99.LITS is used to further differentiate Y and Ce sites by the intensity of atomic sites.Furthermore,pix2pix and UNet workflow with better automaticity is applied to identification of Fe-doped ReSe_(2) nanosheets.Three types of atomic sites(Re,the substitution of Fe for Re,and the adatom of Fe on Re)are distinguished with the identification recall of more than 0.90 and the precision of higher than 0.93.These results suggest that this strategy facilitates high-quality and automated chemical identification of atomic-resolution images.
基金Project supported by JST-PRESTO (Grant No.JPMJPR1871)JST-FOREST (Grant No.JPMJFR2033)+2 种基金JST-ERATO (Grant No.JPMJER2202)KAKENHI JSPS (Grant Nos.JP19H05788,JP21H01614,and JP24H00373)“Next Generation Electron Microscopy”social cooperation program at the University of Tokyo。
文摘One of the major innovations awaiting in electron microscopy is full three-dimensional imaging at atomic resolution.Despite the success of aberration correction to deep sub-angstrom lateral resolution,spatial resolution in depth is still far from atomic resolution.In scanning transmission electron microscopy(STEM),this poor depth resolution is due to the limitation of the illumination angle.To overcome this physical limitation,it is essential to implement a next-generation aberration corrector in STEM that can significantly improve the depth resolution.This review discusses the capability of depth sectioning for three-dimensional imaging combined with large-angle illumination STEM.Furthermore,the statistical analysis approach remarkably improves the depth resolution,making it possible to achieve three-dimensional atomic resolution imaging at oxide surfaces.We will also discuss the future prospects of three-dimensional imaging at atomic resolution by STEM depth sectioning.
基金supported by the National Key RD Program of China (No.2017YFA0402903 and No.2016YFA0401003)National Natural Science Foundation of China (No.21505139, No.51627901,and No.11374278)+1 种基金Chinese Academy of Sciences Scientific Research Equipment (No.YZ201628)National Science Foundation for Young Scientists of China (No.11504339)
文摘We present a homebuilt scanning tunneling microscope(STM)which employs an inner-wall polished sapphire guiding tube as a rail for the scanner to form a short tip-sample mechanical loop.The scanner is mounted on a square rod which is housed in the guiding tube and held by a spring strip.The stiff sapphire guiding tube allows the STM body to be made in a simple,compact and rigid form.Also the material of sapphire improves the thermal stability of the STM for its good thermal conductivity.To demonstrate the performance of the STM,high quality atomic-resolution STM images of high oriented pyrolytic graphite were given.
文摘The principle of scanning probe microscopes (SPM) was lust described by J. A. O’Keefe in the 1960s. In 1982, the scanning tunnelling microscope (STM), the first supreme example of SPM family, was developed; for which Binnig and Rohrer received the 1986 Nobel Prize in Physics. Shortly after that, in 1986 Binnig together with Quate and Gerber introduced the first atomic force microscope (AFM). Unlike the STM, the AFM
基金This work was supported by the National Natural Science Foundation of China(51672307,51801230,51822107,and 51671121)the National Key Research and Development Program of China(2018YFA0703603)+2 种基金the National Natural Science Foundation of Guangdong Province(2019B030302010)the Strategic Priority Research Program of the Chinese Academy of Sciences(XDB30000000)Beijing Natural Science Foundation(Z190010).
文摘Determination and conceptualization of atomic structures of metallic glasses or amorphous alloys remain a grand challenge.Structural models proposed for bulk metallic glasses are still controversial owing to experimental difficulties in directly imaging the atom positions in three-dimensional structures.With the advanced atomic-resolution imaging,here we directly observed the atomic arrangements in atomically thin metallic glassy membranes obtained by vapor deposition.The atomic packing in the amorphous membrane is shown to have a fractal characteristic,with the fractal dimension depending on the atomic density.Locally,the atomic configuration for the metallic glass membrane is composed of many types of polygons with the bonding angles concentrated on 45°-55°.The fractal atomic structure is consistent with the analysis by the percolation theory,and may account for the enhanced relaxation dynamics and the easiness of glass transition as reported for the thin metallic glassy films or glassy surface.
