综述了基于原子力显微镜的红外光谱(Atomic force microscopy-based infrared spectroscopy,AFM-IR)的特点,测量和检测原理及其技术优势。AFM-IR是能在纳米尺度对不同材料进行表征的新兴技术,该技术可以以远低于常规光学衍射极限的分辨...综述了基于原子力显微镜的红外光谱(Atomic force microscopy-based infrared spectroscopy,AFM-IR)的特点,测量和检测原理及其技术优势。AFM-IR是能在纳米尺度对不同材料进行表征的新兴技术,该技术可以以远低于常规光学衍射极限的分辨率检测材料的化学成分,同时提供不同组分的分布图谱。AFM-IR的原理是利用原子力显微镜(AFM)悬臂梁的振动检测样本因吸收红外辐射脉冲产生的热膨胀,因此AFM-IR在继承了AFM的纳米级分辨率的基础上结合了红外光谱的化学分析能力,克服了二者原有的缺点并实现了优势互补。这项新技术在过去十多年备受关注并获得了长足的发展,因其操作简便、系统稳定、样品制备要求相对较低,以及与红外光谱直接相关而无需数学建模或额外数据后续处理,已被广泛用于材料科学、生命科学等诸多领域。展开更多
We report a novel and easily accessible method to chemically reduce graphene fluoride （GF） sheets with nanoscopic precision using high electrostatic fields generated between an atomic force microscope （AFM） tip an...We report a novel and easily accessible method to chemically reduce graphene fluoride （GF） sheets with nanoscopic precision using high electrostatic fields generated between an atomic force microscope （AFM） tip and the GF substrate. Reduction of fluorine by the electric field produces graphene nanoribbons （GNR） with a width of 105-1,800 nm with sheet resistivity drastically decreased from 〉1 TΩ.sq.^-1 （GF） down to 46 kΩ.sq.^-1 （GNR）. Fluorine reduction also changes the topography, friction, and work function of the GF. Kelvin probe force microscopy measurements indicate that the work function of GF is 180-280 meV greater than that of graphene. The reduction process was optimized by varying the AFM probe velocity between 1.2 μm.s^-1 and 12 μm.s^-1 and the bias voltage applied to the sample between -8 and -12 V. The electrostatic field required to remove fluorine from carbon is -1.6 V.nm-1. Reduction of the fluorine may be due to the softening of the C-F bond in this intense field or to the accumulation and hydrolysis of adventitious water into a meniscus.展开更多
文摘综述了基于原子力显微镜的红外光谱(Atomic force microscopy-based infrared spectroscopy,AFM-IR)的特点,测量和检测原理及其技术优势。AFM-IR是能在纳米尺度对不同材料进行表征的新兴技术,该技术可以以远低于常规光学衍射极限的分辨率检测材料的化学成分,同时提供不同组分的分布图谱。AFM-IR的原理是利用原子力显微镜(AFM)悬臂梁的振动检测样本因吸收红外辐射脉冲产生的热膨胀,因此AFM-IR在继承了AFM的纳米级分辨率的基础上结合了红外光谱的化学分析能力,克服了二者原有的缺点并实现了优势互补。这项新技术在过去十多年备受关注并获得了长足的发展,因其操作简便、系统稳定、样品制备要求相对较低,以及与红外光谱直接相关而无需数学建模或额外数据后续处理,已被广泛用于材料科学、生命科学等诸多领域。
文摘We report a novel and easily accessible method to chemically reduce graphene fluoride （GF） sheets with nanoscopic precision using high electrostatic fields generated between an atomic force microscope （AFM） tip and the GF substrate. Reduction of fluorine by the electric field produces graphene nanoribbons （GNR） with a width of 105-1,800 nm with sheet resistivity drastically decreased from 〉1 TΩ.sq.^-1 （GF） down to 46 kΩ.sq.^-1 （GNR）. Fluorine reduction also changes the topography, friction, and work function of the GF. Kelvin probe force microscopy measurements indicate that the work function of GF is 180-280 meV greater than that of graphene. The reduction process was optimized by varying the AFM probe velocity between 1.2 μm.s^-1 and 12 μm.s^-1 and the bias voltage applied to the sample between -8 and -12 V. The electrostatic field required to remove fluorine from carbon is -1.6 V.nm-1. Reduction of the fluorine may be due to the softening of the C-F bond in this intense field or to the accumulation and hydrolysis of adventitious water into a meniscus.
