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Simple phase extraction in x-ray differential phase contrast imaging
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作者 刘鑫 郭金川 +2 位作者 雷耀虎 李冀 牛憨笨 《Chinese Physics B》 SCIE EI CAS CSCD 2016年第2期563-567,共5页
A fast and simple method to extract phase-contrast images from interferograms is proposed, and its effectiveness is demonstrated through simulation and experiment. For x-ray differential phase contrast imaging, a stro... A fast and simple method to extract phase-contrast images from interferograms is proposed, and its effectiveness is demonstrated through simulation and experiment. For x-ray differential phase contrast imaging, a strong attenuation signal acts as an overwhelming background intensity that obscures the weak phase signal so that no obvious phase-gradient information is detectable in the raw image. By subtracting one interferogram from another, chosen at particular intervals,the phase signal can be isolated and magnified. 展开更多
关键词 x-ray imaging x-ray interferometry Talbot and self-imaging effects phase contrast imaging
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Phase imaging of irradiated foils at the OMEGA EP facility using phase-stepping X-ray Talbot–Lau deflectometry 被引量:1
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作者 G.Pérez-Callejo V.Bouffetier +10 位作者 L.Ceurvorst T.Goudal S.R.Klein D.Svyatskiy M.Holec P.Perez-Martin K.Falk A.Casner T.E.Weber G.Kagan M.P.Valdivia 《High Power Laser Science and Engineering》 SCIE EI CAS CSCD 2023年第4期45-54,共10页
Diagnosing the evolution of laser-generated high energy density(HED)systems is fundamental to develop a correct understanding of the behavior of matter under extreme conditions.Talbot–Lau interferometry constitutes a... Diagnosing the evolution of laser-generated high energy density(HED)systems is fundamental to develop a correct understanding of the behavior of matter under extreme conditions.Talbot–Lau interferometry constitutes a promising tool,since it permits simultaneous single-shot X-ray radiography and phase-contrast imaging of dense plasmas.We present the results of an experiment at OMEGA EP that aims to probe the ablation front of a laser-irradiated foil using a Talbot–Lau X-ray interferometer.A polystyrene(CH)foil was irradiated by a laser of 133 J,1 ns and probed with 8 keV laser-produced backlighter radiation from Cu foils driven by a short-pulse laser(153 J,11 ps).The ablation front interferograms were processed in combination with a set of reference images obtained ex situ using phase-stepping.We managed to obtain attenuation and phase-shift images of a laser-irradiated foil for electron densities above 1022 cm−3.These results showcase the capabilities of Talbot–Lau X-ray diagnostic methods to diagnose HED laser-generated plasmas through high-resolution imaging. 展开更多
关键词 DEFLECTOMETRY OMEGA EP phase-contrast imaging Talbot-Lau x-ray interferometry
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Ion Beam Figuring System for Synchrotron X-Ray Mirrors Achieving Sub-0.2-µrad and Sub-0.5-nm Root Mean Square 被引量:2
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作者 Tianyi Wang Lei Huang +4 位作者 Yi Zhu Stefano Giorgio Philip Boccabella Nathalie Bouet Mourad Idir 《Nanomanufacturing and Metrology》 EI 2023年第3期1-11,共11页
Optics with high-precision height and slope are increasingly desired in numerous industrial fields.For instance,Kirkpatrick-Baez(KB)mirrors play an important role in synchrotron X-ray applications.A KB system is compo... Optics with high-precision height and slope are increasingly desired in numerous industrial fields.For instance,Kirkpatrick-Baez(KB)mirrors play an important role in synchrotron X-ray applications.A KB system is composed of two aspherical,grazing-incidence mirrors used to focus an X-ray beam.The fabrication of KB mirrors is challenging due to the aspherical departure of the mirror surfaces from base geometries and the high-quality requirements for slope and height residuals.In this paper,we present the process of manufacturing an elliptical cylinder KB mirror using our in-house-developed ion beam figuring(IBF)and metrology technologies.First,the key aspects of figuring and finishing processes with IBF are illustrated in detail.The effect of positioning error on the convergence of the residual slope error is highlighted and compensated.Finally,inspection and cross-validation using different metrology instruments are performed and used as the final validation of the mirror.Results confirm that relative to the requested off-axis ellipse,the mirror has achieved 0.15-μrad root mean square(RMS)and 0.36-nm RMS residual slope and height errors,respectively,while maintaining the initial 0.3-nm RMS microroughness. 展开更多
关键词 Ion beam figuring Kirkpatrick-Baez Synchrotron x-ray mirrors Stitching interferometry Optical fabrication Optical metrology
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