In cooperation with figure-of-merits the Rietveld analysis can appraise both angular and intensity data of powder diffraction. In this work, X-ray diffraction pattern of Bi4(SiO4)3 was redetermined with intensity figu...In cooperation with figure-of-merits the Rietveld analysis can appraise both angular and intensity data of powder diffraction. In this work, X-ray diffraction pattern of Bi4(SiO4)3 was redetermined with intensity figure-of-merits, which qualify agreement between observed and calculated relative intensities. F30 is 158.90 (0.0059, 32), intensity figure of merit Rint is 8.7, I20(17), 8.0. The values of figure-of-merits show that the data of JCPDS cards are distorted. Both the experimental and calculated peak positions and heights are listed in detail.展开更多
A new method for pattern identification and simulation of X-ray powder diffraction data is described, which can give definite phase composition of the unknown rapidly and correctly. The method is implemented in Micros...A new method for pattern identification and simulation of X-ray powder diffraction data is described, which can give definite phase composition of the unknown rapidly and correctly. The method is implemented in Microsoft Fortran 77 for the IBM PC/XT/AT personal computer or their compatibles.展开更多
In the Bi-Sr-Ca-Cu-O superconductor system, two superconducting phases (85K and 105K) were found by Maeda et al. By substituting Pb, enhanced superconducting properties and structure stabilization in these compounds h...In the Bi-Sr-Ca-Cu-O superconductor system, two superconducting phases (85K and 105K) were found by Maeda et al. By substituting Pb, enhanced superconducting properties and structure stabilization in these compounds have been reported. Recently, the展开更多
文摘In cooperation with figure-of-merits the Rietveld analysis can appraise both angular and intensity data of powder diffraction. In this work, X-ray diffraction pattern of Bi4(SiO4)3 was redetermined with intensity figure-of-merits, which qualify agreement between observed and calculated relative intensities. F30 is 158.90 (0.0059, 32), intensity figure of merit Rint is 8.7, I20(17), 8.0. The values of figure-of-merits show that the data of JCPDS cards are distorted. Both the experimental and calculated peak positions and heights are listed in detail.
文摘A new method for pattern identification and simulation of X-ray powder diffraction data is described, which can give definite phase composition of the unknown rapidly and correctly. The method is implemented in Microsoft Fortran 77 for the IBM PC/XT/AT personal computer or their compatibles.
文摘In the Bi-Sr-Ca-Cu-O superconductor system, two superconducting phases (85K and 105K) were found by Maeda et al. By substituting Pb, enhanced superconducting properties and structure stabilization in these compounds have been reported. Recently, the
