This paper presents an automated POCOFAN-POFRAME algorithm thatpartitions large combinational digital VLSI circuits for pseudo exhaustive testing. In thispaper, a simulation framework and partitioning technique are pr...This paper presents an automated POCOFAN-POFRAME algorithm thatpartitions large combinational digital VLSI circuits for pseudo exhaustive testing. In thispaper, a simulation framework and partitioning technique are presented to guide VLSIcircuits to work under with fewer test vectors in order to reduce testing time and todevelop VLSI circuit designs. This framework utilizes two methods of partitioningPrimary Output Cone Fanout Partitioning (POCOFAN) and POFRAME partitioning todetermine number of test vectors in the circuit. The key role of partitioning is to identifyreconvergent fanout branch pairs and the optimal value of primary input node N andfanout F partitioning using I-PIFAN algorithm. The number of reconvergent fanout andits locations are critical for testing of VLSI circuits and design for testability. Hence, theirselection is crucial in order to optimize system performance and reliability. In the presentwork, the design constraints of the partitioned circuit considered for optimizationincludes critical path delay and test time. POCOFAN-POFRAME algorithm uses theparameters with optimal values of circuits maximum primary input cone size (N) andminimum fan-out value (F) to determine the number of test vectors, number of partitionsand its locations. The ISCAS’85 benchmark circuits have been successfully partitioned,the test results of C499 shows 45% reduction in the test vectors and the experimentalresults are compared with other partitioning methods, our algorithm makes fewer testvectors.展开更多
An error tolerant hardware efficient verylarge scale integration （VLSI） architecture for bitparallel systolic multiplication over dual base, which canbe pipelined, is presented. Since this architecture has thefeatur...An error tolerant hardware efficient verylarge scale integration （VLSI） architecture for bitparallel systolic multiplication over dual base, which canbe pipelined, is presented. Since this architecture has thefeatures of regularity, modularity and unidirectionaldata flow, this structure is well suited to VLSIimplementations. The length of the largest delay pathand area of this architecture are less compared to the bitparallel systolic multiplication architectures reportedearlier. The architecture is implemented using Austria Micro System＇s 0.35 μm CMOS （complementary metaloxide semiconductor） technology. This architecture canalso operate over both the dual-base and polynomialbase.展开更多
Circular self test path (CSTP) is an attractive technique for testing digital integrated circuits(IC) in the nanometer era, because it can easily provide at-speed test with small test data volume and short test applic...Circular self test path (CSTP) is an attractive technique for testing digital integrated circuits(IC) in the nanometer era, because it can easily provide at-speed test with small test data volume and short test application time. However, CSTP cannot reliably attain high fault coverage because of difficulty of testing random-pattern-resistant faults. This paper presents a deterministic CSTP (DCSTP) structure that consists of a DCSTP chain and jumping logic, to attain high fault coverage with low area overhead. Experimental re- sults on ISCAS’89 benchmarks show that 100% fault coverage can be obtained with low area overhead and CPU time, especially for large circuits.展开更多
文摘This paper presents an automated POCOFAN-POFRAME algorithm thatpartitions large combinational digital VLSI circuits for pseudo exhaustive testing. In thispaper, a simulation framework and partitioning technique are presented to guide VLSIcircuits to work under with fewer test vectors in order to reduce testing time and todevelop VLSI circuit designs. This framework utilizes two methods of partitioningPrimary Output Cone Fanout Partitioning (POCOFAN) and POFRAME partitioning todetermine number of test vectors in the circuit. The key role of partitioning is to identifyreconvergent fanout branch pairs and the optimal value of primary input node N andfanout F partitioning using I-PIFAN algorithm. The number of reconvergent fanout andits locations are critical for testing of VLSI circuits and design for testability. Hence, theirselection is crucial in order to optimize system performance and reliability. In the presentwork, the design constraints of the partitioned circuit considered for optimizationincludes critical path delay and test time. POCOFAN-POFRAME algorithm uses theparameters with optimal values of circuits maximum primary input cone size (N) andminimum fan-out value (F) to determine the number of test vectors, number of partitionsand its locations. The ISCAS’85 benchmark circuits have been successfully partitioned,the test results of C499 shows 45% reduction in the test vectors and the experimentalresults are compared with other partitioning methods, our algorithm makes fewer testvectors.
文摘An error tolerant hardware efficient verylarge scale integration （VLSI） architecture for bitparallel systolic multiplication over dual base, which canbe pipelined, is presented. Since this architecture has thefeatures of regularity, modularity and unidirectionaldata flow, this structure is well suited to VLSIimplementations. The length of the largest delay pathand area of this architecture are less compared to the bitparallel systolic multiplication architectures reportedearlier. The architecture is implemented using Austria Micro System＇s 0.35 μm CMOS （complementary metaloxide semiconductor） technology. This architecture canalso operate over both the dual-base and polynomialbase.
基金the National Natural Science Foundation of China (Nos. 60633060 and 60576031)the National Basic Research and Development (973) Program of China (No. 2005CB321604)
文摘Circular self test path (CSTP) is an attractive technique for testing digital integrated circuits(IC) in the nanometer era, because it can easily provide at-speed test with small test data volume and short test application time. However, CSTP cannot reliably attain high fault coverage because of difficulty of testing random-pattern-resistant faults. This paper presents a deterministic CSTP (DCSTP) structure that consists of a DCSTP chain and jumping logic, to attain high fault coverage with low area overhead. Experimental re- sults on ISCAS’89 benchmarks show that 100% fault coverage can be obtained with low area overhead and CPU time, especially for large circuits.
