β-ray-induced X-ray spectroscopy(BIXS)is a promising technique for tritium analysis that offers several unique advantages,including substantial detection depth,nondestructive testing capabilities,and ease of operatio...β-ray-induced X-ray spectroscopy(BIXS)is a promising technique for tritium analysis that offers several unique advantages,including substantial detection depth,nondestructive testing capabilities,and ease of operation.For thin solid tritium-containing samples with substrates,the currently used BIXS analysis method can measure the tritium depth profile and content when the sample thickness is known.In this study,a backpropagation(BP)neural network algorithm was used to predict the tritium content and thickness of a thin solid tritium-containing sample with substrates and a uniformly distributed tritium profile.A semi-analytical method was used to generate datasets for training and testing the BP neural network.A dataset ofβ-decay X-ray spectra from 420 tritium-containing zirconium models with different known thicknesses and tritium-tozirconium ratios was used as the input data.The corresponding zirconium thicknesses and tritium-to-zirconium ratios served as the output for training and testing the BP neural network.The mean relative errors(MREs)of the zirconium thickness in the training and test datasets were 0.56%and 0.42%,respectively,whereas the MREs of the tritium-to-zirconium ratio were 0.59%and 0.38%,respectively.Furthermore,the trained BP neural network demonstrates excellent predictive capability across various levels of statistical uncertainty.For the experimentalβ-decay X-ray spectra of two tritium-containing samples,the predicted zirconium thicknesses and tritium-to-zirconium ratios showed good agreement with the results obtained through the elastic backscattering spectrometry(EBS).展开更多
-The reclamation rate formula for concentrating tritium by the addition of 'regular and quantitative aqueous sample' is advanced.Effects of different adding modes on reclamation rate and the reclamation rate r...-The reclamation rate formula for concentrating tritium by the addition of 'regular and quantitative aqueous sample' is advanced.Effects of different adding modes on reclamation rate and the reclamation rate reappearance are studied; and the analytic program of tritium in seawater is also proposed. By using Fe-Ni electrodes and the electrolysis temperature of 2± 0. 5℃, β value reaches 20. Reclamation rates reach 83% and 76% when 250 cm3 and 500 cm3 seawater is concentrated to 8 cm3.The relatively appropriate toluene/Trition ratio for counting aqueous sample under the normal temperature is proposed.The computer program of different addition electrolytic concentrations for measuring tritium is coded, and the tritium data base is established.展开更多
In order to study how to reliably perform quantitative tritium and helium analyses in thin film samples using enhanced proton backscattering （EPBS）, several EPBS spectra for some samples consisting of non-RBS light ...In order to study how to reliably perform quantitative tritium and helium analyses in thin film samples using enhanced proton backscattering （EPBS）, several EPBS spectra for some samples consisting of non-RBS light elements （i.e., T, 4He, 12C, 16O, natsi）, medium and heavy elements have been measured and analyzed using analytical SIMNRA and Monte Carlo-based CORTEO codes. The non-RBS cross sections needed in the CORTEO code are taken from the ENDF/B-Ⅶ database and the calculations of SigmaCalc code and are incorporated into the CORTEO code. All non-RBS cross section data over the entire proton incident energy-scattering angle plane are obtained by interpolation. It is quantitatively observed that in EPBS analysis the multiple and plural scattering effects have little impact on the energy spectra for light elements and the RBS cross sections of light elements can be used in the SIMNRA code for dual scattering calculations. It is also observed that the results given by the CORTEO code are higher than the results of the SIMNRA code in the low energy part of EPBS spectra, and are in better agreement with the experimental data. Tritium and helium analyses in thin film samples using EPBS can be performed reliably when the multiple and plural scattering contributions are completely accounted.展开更多
基金supported by the National Natural Science Foundation of China(No.12175158)the Institute of Nuclear Physics and Chemistry,China Academy of Engineering Physics(No.HG2022022)。
文摘β-ray-induced X-ray spectroscopy(BIXS)is a promising technique for tritium analysis that offers several unique advantages,including substantial detection depth,nondestructive testing capabilities,and ease of operation.For thin solid tritium-containing samples with substrates,the currently used BIXS analysis method can measure the tritium depth profile and content when the sample thickness is known.In this study,a backpropagation(BP)neural network algorithm was used to predict the tritium content and thickness of a thin solid tritium-containing sample with substrates and a uniformly distributed tritium profile.A semi-analytical method was used to generate datasets for training and testing the BP neural network.A dataset ofβ-decay X-ray spectra from 420 tritium-containing zirconium models with different known thicknesses and tritium-tozirconium ratios was used as the input data.The corresponding zirconium thicknesses and tritium-to-zirconium ratios served as the output for training and testing the BP neural network.The mean relative errors(MREs)of the zirconium thickness in the training and test datasets were 0.56%and 0.42%,respectively,whereas the MREs of the tritium-to-zirconium ratio were 0.59%and 0.38%,respectively.Furthermore,the trained BP neural network demonstrates excellent predictive capability across various levels of statistical uncertainty.For the experimentalβ-decay X-ray spectra of two tritium-containing samples,the predicted zirconium thicknesses and tritium-to-zirconium ratios showed good agreement with the results obtained through the elastic backscattering spectrometry(EBS).
文摘-The reclamation rate formula for concentrating tritium by the addition of 'regular and quantitative aqueous sample' is advanced.Effects of different adding modes on reclamation rate and the reclamation rate reappearance are studied; and the analytic program of tritium in seawater is also proposed. By using Fe-Ni electrodes and the electrolysis temperature of 2± 0. 5℃, β value reaches 20. Reclamation rates reach 83% and 76% when 250 cm3 and 500 cm3 seawater is concentrated to 8 cm3.The relatively appropriate toluene/Trition ratio for counting aqueous sample under the normal temperature is proposed.The computer program of different addition electrolytic concentrations for measuring tritium is coded, and the tritium data base is established.
基金Supported by Chinese National Fusion Project for ITER(2009GB106004)National Natural Science Foundation of China(11175123)China Academy of Engineering Physics
文摘In order to study how to reliably perform quantitative tritium and helium analyses in thin film samples using enhanced proton backscattering （EPBS）, several EPBS spectra for some samples consisting of non-RBS light elements （i.e., T, 4He, 12C, 16O, natsi）, medium and heavy elements have been measured and analyzed using analytical SIMNRA and Monte Carlo-based CORTEO codes. The non-RBS cross sections needed in the CORTEO code are taken from the ENDF/B-Ⅶ database and the calculations of SigmaCalc code and are incorporated into the CORTEO code. All non-RBS cross section data over the entire proton incident energy-scattering angle plane are obtained by interpolation. It is quantitatively observed that in EPBS analysis the multiple and plural scattering effects have little impact on the energy spectra for light elements and the RBS cross sections of light elements can be used in the SIMNRA code for dual scattering calculations. It is also observed that the results given by the CORTEO code are higher than the results of the SIMNRA code in the low energy part of EPBS spectra, and are in better agreement with the experimental data. Tritium and helium analyses in thin film samples using EPBS can be performed reliably when the multiple and plural scattering contributions are completely accounted.
