In many machine learning applications,data are not free,and there is a test cost for each data item. For the economical reason,some existing works try to minimize the test cost and at the same time,preserve a particul...In many machine learning applications,data are not free,and there is a test cost for each data item. For the economical reason,some existing works try to minimize the test cost and at the same time,preserve a particular property of a given decision system. In this paper,we point out that the test cost one can afford is limited in some applications. Hence,one has to sacrifice respective properties to keep the test cost under a budget. To formalize this issue,we define the test cost constraint attribute reduction problem,where the optimization objective is to minimize the conditional information entropy. This problem is an essential generalization of both the test-cost-sensitive attribute reduction problem and the 0-1 knapsack problem,therefore it is more challenging. We propose a heuristic algorithm based on the information gain and test costs to deal with the new problem. The algorithm is tested on four UCI（University of California-Irvine） datasets with various test cost settings. Experimental results indicate the appropriate setting of the only user-specified parameter λ.展开更多
A novel test access mechanism （TAM） architecture with multi test-channel （TC） based on IEEE Standard 1500 is proposed instead of the traditional sub-TAM structure. The cost model of an area-time associated test an...A novel test access mechanism （TAM） architecture with multi test-channel （TC） based on IEEE Standard 1500 is proposed instead of the traditional sub-TAM structure. The cost model of an area-time associated test and the corresponding lower bound of system-on-chip （SoC） test time are established based on this TAM architecture. The model provides a more reliable method to control the SoC scheduling and reduces the complexity in related algorithm research. The result based on the area time associated test cost model has been validated using the ITC02 test benchmark.展开更多
In order to deliver a complete reliable software product, testing is performed. As testing phase carries on, cost of testing process increases and it directly affects the overall project cost. Many a times it happens ...In order to deliver a complete reliable software product, testing is performed. As testing phase carries on, cost of testing process increases and it directly affects the overall project cost. Many a times it happens that the actual cost becomes more than the estimated cost. Cost is considered as the most important parameter with respect to software testing, in software industry. In recent year’s researchers have done a variety of work in the area of Cost optimization by using various concepts like Genetic Algorithm, simulated annealing and Automation in generation of test data etc. This paper proposes an efficient cost effective approach for optimizing the cost of testing using Tabu Search (TS), which will provide maximum code coverage along with the concepts of Dijkstra’s Algorithm which will be implemented in Aspiration criteria of Tabu Search in order to optimize the cost and generate a minimum cost path with maximum coverage.展开更多
In order to solve the problem that the testing cost of the three-dimensional integrated circuit(3D IC)is too high,an optimal stacking order scheme is proposed to reduce the mid-bond test cost.A new testing model is bu...In order to solve the problem that the testing cost of the three-dimensional integrated circuit(3D IC)is too high,an optimal stacking order scheme is proposed to reduce the mid-bond test cost.A new testing model is built with the general consideration of both the test time for automatic test equipment(ATE)and manufacturing failure factors.An algorithm for testing cost and testing order optimization is proposed,and the minimum testing cost and optimized stacking order can be carried out by taking testing bandwidth and testing power as constraints.To prove the influence of the optimal stacking order on testing costs,two baselines stacked in sequential either in pyramid type or in inverted pyramid type are compared.Based on the benchmarks from ITC 02,experimental results show that for a 5-layer 3D IC,under different constraints,the optimal stacking order can reduce the test costs on average by 13%and 62%,respectively,compared to the pyramid type and inverted pyramid type.Furthermore,with the increase of the stack size,the test costs of the optimized stack order can be decreased.展开更多
Background and Objective: HIV, hepatitis B virus (HBV) and hepatitis C virus (HCV) are very widespread in the world, however, less than 20% of the people affected are diagnosed and treated. This study aimed to determi...Background and Objective: HIV, hepatitis B virus (HBV) and hepatitis C virus (HCV) are very widespread in the world, however, less than 20% of the people affected are diagnosed and treated. This study aimed to determine the prevalence of HIV, HCV and HBV co-infections in pregnant women at Bangui Community University Hospital and the cost of screening. Methods: A cross-sectional study involving consenting pregnant women who came for antenatal care was performed. HIV, HCV antibodies and HBV antigens were detected using Exacto Triplex<sup>?</sup> HIV/HCV/HBsAg rapid test, cross-validated by ELISA tests. Sociodemographic and professional data, the modes of transmission and prevention of HIV and both hepatitis viruses were collected in a standard sheet and analyzed using the Epi-Info software version 7. Results: Pregnant women aged 15 to 24 were the most affected (45.3%);high school girls (46.0%), and pregnant women living in cohabitation (65.3%) were the most represented. Twenty-five (16.7%) worked in the formal sector, 12.7% were unemployed housewives and the remainder in the informal sector. The prevalence of HIV, HBV, and HCV viruses was 11.8%, 21.9% and 22.2%, respectively. The prevalence of co-infections was 8.6% for HIV-HBV, 10.2% for HIV-HCV, 14.7% for HBV-HCV and 6.5% for HIV-HBV-HCV. All positive results and 10% of negative results by the rapid test were confirmed by ELISA tests. The serology of the three viruses costs 39,000 FCFA (60 Euros) by ELISA compared to 10,000 FCFA (15.00 Euros) with Exacto Triplex<sup>?</sup> HIV/HCV/AgHBs (BioSynex, Strasbourg, France). Conclusion: The low level of education and awareness of hepatitis are barriers to development and indicate the importance of improving the literacy rate of women in the Central African Republic (CAR). Likewise, the high prevalence of the three viruses shows the need for the urgent establishment of a national program to combat viral hepatitis in the CAR.展开更多
Previous test sequencing algorithms only consider the execution cost of a test at the application stage. Due to the fact that the placement cost of some tests at the design stage is considerably high compared with the...Previous test sequencing algorithms only consider the execution cost of a test at the application stage. Due to the fact that the placement cost of some tests at the design stage is considerably high compared with the execution cost, the sequential diagnosis strategy obtained by previous methods is actually not optimal from the view of life cycle. In this paper, the test sequencing problem based on life cycle cost is presented. It is formulated as an optimization problem, which is non-deterministic polynomial-time hard （NP-hard）. An algorithm and a strategy to improve its computational efficiency are proposed. The formulation and algorithms are tested on various simulated systems and comparisons are made with the extant test sequencing methods. Application on a pump rotational speed control （PRSC） system of a spacecraft is studied in detail. Both the simulation results and the real-world case application results suggest that the solution proposed in this paper can significantly reduce the life cycle cost of a sequential fault diagnosis strategy.展开更多
基金supported by the National Natural Science Foundation of China under Grant No. 60873077/F020107
文摘In many machine learning applications,data are not free,and there is a test cost for each data item. For the economical reason,some existing works try to minimize the test cost and at the same time,preserve a particular property of a given decision system. In this paper,we point out that the test cost one can afford is limited in some applications. Hence,one has to sacrifice respective properties to keep the test cost under a budget. To formalize this issue,we define the test cost constraint attribute reduction problem,where the optimization objective is to minimize the conditional information entropy. This problem is an essential generalization of both the test-cost-sensitive attribute reduction problem and the 0-1 knapsack problem,therefore it is more challenging. We propose a heuristic algorithm based on the information gain and test costs to deal with the new problem. The algorithm is tested on four UCI（University of California-Irvine） datasets with various test cost settings. Experimental results indicate the appropriate setting of the only user-specified parameter λ.
基金Project supported by the SDC Project of Science and Technology Commission of Shanghai Municipality (Grant No.08706201000)the AM Foundation Project of Science and Technology Commission of Shanghai Municipality (Grant No.08700741000)+1 种基金the Leading Academic Discipline Project of Shanghai Education Commission (Grant No.J50104)the Innovation Foundation Project of Shanghai University
文摘A novel test access mechanism （TAM） architecture with multi test-channel （TC） based on IEEE Standard 1500 is proposed instead of the traditional sub-TAM structure. The cost model of an area-time associated test and the corresponding lower bound of system-on-chip （SoC） test time are established based on this TAM architecture. The model provides a more reliable method to control the SoC scheduling and reduces the complexity in related algorithm research. The result based on the area time associated test cost model has been validated using the ITC02 test benchmark.
文摘In order to deliver a complete reliable software product, testing is performed. As testing phase carries on, cost of testing process increases and it directly affects the overall project cost. Many a times it happens that the actual cost becomes more than the estimated cost. Cost is considered as the most important parameter with respect to software testing, in software industry. In recent year’s researchers have done a variety of work in the area of Cost optimization by using various concepts like Genetic Algorithm, simulated annealing and Automation in generation of test data etc. This paper proposes an efficient cost effective approach for optimizing the cost of testing using Tabu Search (TS), which will provide maximum code coverage along with the concepts of Dijkstra’s Algorithm which will be implemented in Aspiration criteria of Tabu Search in order to optimize the cost and generate a minimum cost path with maximum coverage.
基金The National Natural Science Foundation of China(No.61674048,61574052,61474036,61371025)the Project of Anhui Institute of Economics and Management(No.YJKT1417T01)
文摘In order to solve the problem that the testing cost of the three-dimensional integrated circuit(3D IC)is too high,an optimal stacking order scheme is proposed to reduce the mid-bond test cost.A new testing model is built with the general consideration of both the test time for automatic test equipment(ATE)and manufacturing failure factors.An algorithm for testing cost and testing order optimization is proposed,and the minimum testing cost and optimized stacking order can be carried out by taking testing bandwidth and testing power as constraints.To prove the influence of the optimal stacking order on testing costs,two baselines stacked in sequential either in pyramid type or in inverted pyramid type are compared.Based on the benchmarks from ITC 02,experimental results show that for a 5-layer 3D IC,under different constraints,the optimal stacking order can reduce the test costs on average by 13%and 62%,respectively,compared to the pyramid type and inverted pyramid type.Furthermore,with the increase of the stack size,the test costs of the optimized stack order can be decreased.
文摘Background and Objective: HIV, hepatitis B virus (HBV) and hepatitis C virus (HCV) are very widespread in the world, however, less than 20% of the people affected are diagnosed and treated. This study aimed to determine the prevalence of HIV, HCV and HBV co-infections in pregnant women at Bangui Community University Hospital and the cost of screening. Methods: A cross-sectional study involving consenting pregnant women who came for antenatal care was performed. HIV, HCV antibodies and HBV antigens were detected using Exacto Triplex<sup>?</sup> HIV/HCV/HBsAg rapid test, cross-validated by ELISA tests. Sociodemographic and professional data, the modes of transmission and prevention of HIV and both hepatitis viruses were collected in a standard sheet and analyzed using the Epi-Info software version 7. Results: Pregnant women aged 15 to 24 were the most affected (45.3%);high school girls (46.0%), and pregnant women living in cohabitation (65.3%) were the most represented. Twenty-five (16.7%) worked in the formal sector, 12.7% were unemployed housewives and the remainder in the informal sector. The prevalence of HIV, HBV, and HCV viruses was 11.8%, 21.9% and 22.2%, respectively. The prevalence of co-infections was 8.6% for HIV-HBV, 10.2% for HIV-HCV, 14.7% for HBV-HCV and 6.5% for HIV-HBV-HCV. All positive results and 10% of negative results by the rapid test were confirmed by ELISA tests. The serology of the three viruses costs 39,000 FCFA (60 Euros) by ELISA compared to 10,000 FCFA (15.00 Euros) with Exacto Triplex<sup>?</sup> HIV/HCV/AgHBs (BioSynex, Strasbourg, France). Conclusion: The low level of education and awareness of hepatitis are barriers to development and indicate the importance of improving the literacy rate of women in the Central African Republic (CAR). Likewise, the high prevalence of the three viruses shows the need for the urgent establishment of a national program to combat viral hepatitis in the CAR.
基金supported by China Civil Space Foundation(No.C1320063131)
文摘Previous test sequencing algorithms only consider the execution cost of a test at the application stage. Due to the fact that the placement cost of some tests at the design stage is considerably high compared with the execution cost, the sequential diagnosis strategy obtained by previous methods is actually not optimal from the view of life cycle. In this paper, the test sequencing problem based on life cycle cost is presented. It is formulated as an optimization problem, which is non-deterministic polynomial-time hard （NP-hard）. An algorithm and a strategy to improve its computational efficiency are proposed. The formulation and algorithms are tested on various simulated systems and comparisons are made with the extant test sequencing methods. Application on a pump rotational speed control （PRSC） system of a spacecraft is studied in detail. Both the simulation results and the real-world case application results suggest that the solution proposed in this paper can significantly reduce the life cycle cost of a sequential fault diagnosis strategy.
