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A PROGRAM FOR QUANTITATIVE PIXE ANALYSIS OF THICK SAMPLE
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作者 戴中宁 任炽刚 刘年庆 《Nuclear Science and Techniques》 SCIE CAS CSCD 1993年第4期209-212,共4页
A program for quantitative PIXE analysis of thick sample (TSPIXE) without reference material has been developed at Fudan University. Our program can be applied to the energy range of 10 keV to 10 MeV and is suitable f... A program for quantitative PIXE analysis of thick sample (TSPIXE) without reference material has been developed at Fudan University. Our program can be applied to the energy range of 10 keV to 10 MeV and is suitable for the analysis of all elements with 11 【 Z 【 92. NBS reference materials were analyzed to provide the experimental test of TSPIXE program. 展开更多
关键词 THICK SAMPLE PIXE ANALYSIS tspixe
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